Dimensions of phonological stress / / Jeffrey Heinz, Rob Goedemans, Harry van der Hulst [[electronic resource]]

• Autore: Heinz Jeffrey <1974->
• Pubblicazione: Cambridge : , : Cambridge University Press, , 2016
• Descrizione fisica: 1 online resource (x, 331 pages) : digital, PDF file(s)
• Disciplina: 414
• Soggetto topico: Emphasis (Linguistics); Phonetics; Language and languages - Phonetics; Intonation (Phonetics); Accents and accentuation
• Persona (resp. second.): GoedemansRob; HulstHarry van der
• Note generali: Title from publisher's bibliographic system (viewed on 28 Nov 2016).
• Nota di bibliografia: Includes bibliographical references at the end of each chapters and index.
• Sommario/riassunto: Stress and accent are central, organizing features of grammar, but their precise nature continues to be a source of mystery and wonder. These issues come to the forefront in acquisition, where the tension between the abstract mental representations and the concrete physical manifestations of stress and accent is deeply reflected. Understanding the nature of the representations of stress and accent patterns, and understanding how stress and accent patterns are learned, informs all aspects of linguistic theory and language acquisition. These two themes - representation and acquisition - form the organizational backbone of this book. Each is addressed along different dimensions of stress and accent, including the position of an accent or stress within various prosodic domains and the acoustic dimensions along which the pronunciation of stress and accent may vary. The research presented in the book is multidisciplinary, encompassing theoretical linguistics, speech science, and computational and experimental research.
• Titolo autorizzato: Dimensions of phonological stress
• ISBN: 1-316-78424-X; 1-316-78616-1; 1-316-78648-X; 1-316-78680-3; 1-316-21274-2; 1-316-78712-5; 1-316-78808-3
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910150171503321
• Lo trovi qui: Univ. Federico II