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X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière
| X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière |
| Pubbl/distr/stampa | Hoboken, N.J., : ISTE/Wiley, 2012 |
| Descrizione fisica | 1 online resource (240 p.) |
| Disciplina | 620.11272 |
| Altri autori (Persone) |
GoudeauPhilippe
GuinebretièreRené |
| Collana | ISTE |
| Soggetto topico |
Materials - Analysis
X-ray microanalysis X-rays - Diffraction X-ray spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-118-56288-7
1-283-94140-6 1-118-56293-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy
1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism 1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements 2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram 3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation 3.5.2. Separation of diffraction components in hybrid nanotubes |
| Record Nr. | UNINA-9910141492503321 |
| Hoboken, N.J., : ISTE/Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière
| X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière |
| Pubbl/distr/stampa | Hoboken, N.J., : ISTE/Wiley, 2012 |
| Descrizione fisica | 1 online resource (240 p.) |
| Disciplina | 620.11272 |
| Altri autori (Persone) |
GoudeauPhilippe
GuinebretièreRené |
| Collana | ISTE |
| Soggetto topico |
Materials - Analysis
X-ray microanalysis X-rays - Diffraction X-ray spectroscopy |
| ISBN |
1-118-56288-7
1-283-94140-6 1-118-56293-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy
1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism 1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements 2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram 3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation 3.5.2. Separation of diffraction components in hybrid nanotubes |
| Record Nr. | UNINA-9910830202703321 |
| Hoboken, N.J., : ISTE/Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-rays and materials / / edited by Philippe Goudeau, Rene Guinebretiere
| X-rays and materials / / edited by Philippe Goudeau, Rene Guinebretiere |
| Pubbl/distr/stampa | Hoboken, N.J., : ISTE/Wiley, 2012 |
| Descrizione fisica | 1 online resource (240 p.) |
| Disciplina | 620.1/1272 |
| Altri autori (Persone) |
GoudeauPhilippe
GuinebretiereRene |
| Collana | ISTE |
| Soggetto topico |
Materials - Analysis
X-ray microanalysis X-rays - Diffraction X-ray spectroscopy |
| ISBN |
1-118-56288-7
1-283-94140-6 1-118-56293-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy
1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism 1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements 2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram 3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation 3.5.2. Separation of diffraction components in hybrid nanotubes |
| Record Nr. | UNINA-9911019362903321 |
| Hoboken, N.J., : ISTE/Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||