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Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
| Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
| Autore | Goodhew Peter J. |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
| Descrizione fisica | 1 online resource (262 p.) |
| Disciplina |
502.825
502/.8/25 |
| Soggetto topico | Electron microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
| Record Nr. | UNINA-9910449760303321 |
Goodhew Peter J.
|
||
| Boca Raton, FL : , : CRC Press, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
| Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
| Autore | Goodhew Peter J. |
| Edizione | [3rd edition.] |
| Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
| Descrizione fisica | 1 online resource (262 p.) |
| Disciplina |
502.825
502/.8/25 |
| Soggetto topico | Electron microscopy |
| ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
| Record Nr. | UNINA-9910777360903321 |
|
Goodhew Peter J.
|
||
| Boca Raton, FL : , : CRC Press, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||