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Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
Autore Goodhew Peter J.
Edizione [3rd ed.]
Pubbl/distr/stampa Boca Raton, FL : , : CRC Press, , 2014
Descrizione fisica 1 online resource (262 p.)
Disciplina 502.825
502/.8/25
Soggetto topico Electron microscopy
Soggetto genere / forma Electronic books.
ISBN 0-429-17625-2
1-4822-8934-2
1-4200-1725-X
1-282-77797-1
9786612777974
0-203-18425-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu
Record Nr. UNINA-9910449760303321
Goodhew Peter J.  
Boca Raton, FL : , : CRC Press, , 2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
Autore Goodhew Peter J.
Edizione [3rd edition.]
Pubbl/distr/stampa Boca Raton, FL : , : CRC Press, , 2014
Descrizione fisica 1 online resource (262 p.)
Disciplina 502.825
502/.8/25
Soggetto topico Electron microscopy
ISBN 0-429-17625-2
1-4822-8934-2
1-4200-1725-X
1-282-77797-1
9786612777974
0-203-18425-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu
Record Nr. UNINA-9910777360903321
Goodhew Peter J.  
Boca Raton, FL : , : CRC Press, , 2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui