Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
Autore | Lyman Charles E |
Edizione | [1st ed. 1990.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
Descrizione fisica | 1 online resource (XI, 407 p.) |
Disciplina | 571.8 |
Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0635-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
Record Nr. | UNINA-9910480498803321 |
Lyman Charles E
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New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
Autore | Lyman Charles E |
Edizione | [1st ed. 1990.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
Descrizione fisica | 1 online resource (XI, 407 p.) |
Disciplina | 571.8 |
Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0635-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
Record Nr. | UNINA-9910789220703321 |
Lyman Charles E
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New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
Autore | Lyman Charles E |
Edizione | [1st ed. 1990.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
Descrizione fisica | 1 online resource (XI, 407 p.) |
Disciplina | 571.8 |
Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0635-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
Record Nr. | UNINA-9910807830303321 |
Lyman Charles E
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New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
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Lo trovi qui: Univ. Federico II | ||
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Schreibersite growth and its influence on the metallography of coarse-structured iron meteorites [[electronic resource] /] / Roy S. Clarke, Jr. and Joseph I. Goldstein |
Autore | Clarke Roy S |
Pubbl/distr/stampa | Washington : , : Smithsonian Institution Press, , 1978 |
Descrizione fisica | 1 online resource (iii, 80 pages) : illustrations |
Altri autori (Persone) | GoldsteinJoseph <1939-2015.> |
Collana | Smithsonian contributions to the earth sciences |
Soggetto topico |
Schreibersite
Metallography Meteorites, Iron |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Schreibersite growth and its influence on the metallography of coarse structured iron meteorites |
Record Nr. | UNINA-9910699288003321 |
Clarke Roy S
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Washington : , : Smithsonian Institution Press, , 1978 | ||
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Lo trovi qui: Univ. Federico II | ||
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