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Scanning Electron Microscopy and X-Ray Microanalysis [[electronic resource] ] : A Text for Biologists, Materials Scientists, and Geologists / / by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin
| Scanning Electron Microscopy and X-Ray Microanalysis [[electronic resource] ] : A Text for Biologists, Materials Scientists, and Geologists / / by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin |
| Autore | Goldstein Joseph <1939-2015, > |
| Edizione | [2nd ed. 1992.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1992 |
| Descrizione fisica | 1 online resource (840 p.) |
| Disciplina | 550 |
| Soggetto topico |
Earth sciences
Developmental biology Materials science Earth Sciences, general Developmental Biology Characterization and Evaluation of Materials |
| ISBN | 1-4613-0491-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4. Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
| Record Nr. | UNINA-9910478881703321 |
Goldstein Joseph <1939-2015, >
|
||
| New York, NY : , : Springer US : , : Imprint : Springer, , 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / Joseph Goldstein, Dale E. Newbury, Patrick Echlin [et al.]
| Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / Joseph Goldstein, Dale E. Newbury, Patrick Echlin [et al.] |
| Autore | Goldstein Joseph <1939-2015, > |
| Edizione | [Second edition 1992.] |
| Pubbl/distr/stampa | New York : , : Springer US : , : Imprint : Springer, , 1992 |
| Descrizione fisica | 1 online resource (840 pages) |
| Disciplina | 550 |
| Soggetto topico |
Earth sciences
Developmental biology Materials science |
| ISBN | 1-4613-0491-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4. Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
| Record Nr. | UNINA-9910789223103321 |
|
Goldstein Joseph <1939-2015, >
|
||
| New York : , : Springer US : , : Imprint : Springer, , 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / Joseph Goldstein, Dale E. Newbury, Patrick Echlin [et al.]
| Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / Joseph Goldstein, Dale E. Newbury, Patrick Echlin [et al.] |
| Autore | Goldstein Joseph <1939-2015, > |
| Edizione | [Second edition 1992.] |
| Pubbl/distr/stampa | New York : , : Springer US : , : Imprint : Springer, , 1992 |
| Descrizione fisica | 1 online resource (840 pages) |
| Disciplina | 550 |
| Soggetto topico |
Earth sciences
Developmental biology Materials science |
| ISBN | 1-4613-0491-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4. Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
| Record Nr. | UNINA-9910813104403321 |
|
Goldstein Joseph <1939-2015, >
|
||
| New York : , : Springer US : , : Imprint : Springer, , 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||