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The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216505403316 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145668103321 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Dependable Multicore Architectures at Nanoscale / / edited by Marco Ottavi, Dimitris Gizopoulos, Salvatore Pontarelli
| Dependable Multicore Architectures at Nanoscale / / edited by Marco Ottavi, Dimitris Gizopoulos, Salvatore Pontarelli |
| Edizione | [1st ed. 2018.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (XXII, 281 p. 101 illus., 65 illus. in color.) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic circuits
Computer software—Reusability Quality control Reliability Industrial safety Electronics Microelectronics Microprocessors Circuits and Systems Performance and Reliability Quality Control, Reliability, Safety and Risk Electronics and Microelectronics, Instrumentation Processor Architectures |
| ISBN | 3-319-54422-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Part I: Current Challenges -- Manufacturing Challenges -- Dependability Challenges -- An Application Scenario -- Part II: Solutions -- Manufacturability Solutions -- Dependability Solutions -- Application-Specific Solutions -- Part III: Roadmap -- Technological Road Map -- Architectural Roadmap. |
| Record Nr. | UNINA-9910299915903321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
| The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
| Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
| Descrizione fisica | 1 online resource (xxxi, 455 pages) |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
| ISBN | 1-5090-7533-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996203025203316 |
| New York : , : IEEE, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
| The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
| Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
| Descrizione fisica | 1 online resource (xxxi, 455 pages) |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
| ISBN | 1-5090-7533-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910138783103321 |
| New York : , : IEEE, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||