2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 |
Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Nanotechnology - Design Microelectronics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
ISBN | 1-5090-9548-9 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996207484803316 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 | ||
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Lo trovi qui: Univ. di Salerno | ||
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2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 |
Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Nanotechnology - Design Microelectronics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
ISBN | 1-5090-9548-9 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910145647203321 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 | ||
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Lo trovi qui: Univ. Federico II | ||
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Machine learning support for fault diagnosis of system-on-chip / / edited by Patrick Girard, Shawn Blanton, and Li-C Wang |
Edizione | [1st ed. 2023.] |
Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2023] |
Descrizione fisica | 1 online resource (320 pages) |
Disciplina | 006.31 |
Soggetto topico |
Electric fault location
Machine learning Systems on a chip |
ISBN | 3-031-19639-2 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion. |
Record Nr. | UNINA-9910682590803321 |
Cham, Switzerland : , : Springer, , [2023] | ||
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Lo trovi qui: Univ. Federico II | ||
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Proceedings of the 14th French-Speaking Conference on Human-Computer Interaction |
Autore | Girard Patrick |
Pubbl/distr/stampa | [Place of publication not identified], : ACM, 2002 |
Descrizione fisica | 1 online resource (290 pages) |
Disciplina | 004.019 |
Collana | ACM International Conference Proceeding Series |
Soggetto topico |
Engineering & Applied Sciences
Computer Science |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti |
IHM '02 : proceedings of the 14th Conference on l'Interaction Homme-Machine
Interaction Homme-Machine 2002 |
Record Nr. | UNINA-9910375829803321 |
Girard Patrick
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[Place of publication not identified], : ACM, 2002 | ||
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Lo trovi qui: Univ. Federico II | ||
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Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
Disciplina | 621.381 |
Soggetto topico |
Integrated circuits - Testing
Integrated circuits - Design and construction Microelectronics - Design Microelectronics - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
ISBN | 1-5090-9447-4 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996218384203316 |
[Place of publication not identified], : IEEE Computer Society, 2006 | ||
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Lo trovi qui: Univ. di Salerno | ||
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Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
Disciplina | 621.381 |
Soggetto topico |
Integrated circuits - Testing
Integrated circuits - Design and construction Microelectronics - Design Microelectronics - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
ISBN | 1-5090-9447-4 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910145454703321 |
[Place of publication not identified], : IEEE Computer Society, 2006 | ||
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Lo trovi qui: Univ. Federico II | ||
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