Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
| 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 |
| Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Nanotechnology - Design Microelectronics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9548-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996207484803316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
| 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 |
| Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Nanotechnology - Design Microelectronics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN |
9781509095483
1509095489 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145647203321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Machine Learning Support for Fault Diagnosis of System-on-Chip / / edited by Patrick Girard, Shawn Blanton, Li-C. Wang
| Machine Learning Support for Fault Diagnosis of System-on-Chip / / edited by Patrick Girard, Shawn Blanton, Li-C. Wang |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023 |
| Descrizione fisica | 1 online resource (320 pages) |
| Disciplina | 006.31 |
| Soggetto topico |
Electronic circuits
Electronic circuit design Microprocessors Computer architecture Electronic Circuits and Systems Electronics Design and Verification Processor Architectures |
| ISBN | 3-031-19639-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion. |
| Record Nr. | UNINA-9910682590803321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the 14th French-Speaking Conference on Human-Computer Interaction
| Proceedings of the 14th French-Speaking Conference on Human-Computer Interaction |
| Autore | Girard Patrick |
| Pubbl/distr/stampa | [Place of publication not identified], : ACM, 2002 |
| Descrizione fisica | 1 online resource (290 pages) |
| Disciplina | 004.019 |
| Collana | ACM International Conference Proceeding Series |
| Soggetto topico |
Engineering & Applied Sciences
Computer Science |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IHM '02 : proceedings of the 14th Conference on l'Interaction Homme-Machine
Interaction Homme-Machine 2002 |
| Record Nr. | UNINA-9910375829803321 |
Girard Patrick
|
||
| [Place of publication not identified], : ACM, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
| Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina | 621.381 |
| Soggetto topico |
Integrated circuits - Testing
Integrated circuits - Design and construction Microelectronics - Design Microelectronics - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9447-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218384203316 |
| [Place of publication not identified], : IEEE Computer Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
| Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina | 621.381 |
| Soggetto topico |
Integrated circuits - Testing
Integrated circuits - Design and construction Microelectronics - Design Microelectronics - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN |
9781509094479
1509094474 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145454703321 |
| [Place of publication not identified], : IEEE Computer Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||