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2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
Pubbl/distr/stampa [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006
Soggetto topico Integrated circuits - Design and construction
Integrated circuits - Testing
Nanotechnology - Design
Microelectronics
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
ISBN 1-5090-9548-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996207484803316
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
Pubbl/distr/stampa [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006
Soggetto topico Integrated circuits - Design and construction
Integrated circuits - Testing
Nanotechnology - Design
Microelectronics
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
ISBN 1-5090-9548-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910145647203321
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Machine learning support for fault diagnosis of system-on-chip / / edited by Patrick Girard, Shawn Blanton, and Li-C Wang
Machine learning support for fault diagnosis of system-on-chip / / edited by Patrick Girard, Shawn Blanton, and Li-C Wang
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham, Switzerland : , : Springer, , [2023]
Descrizione fisica 1 online resource (320 pages)
Disciplina 006.31
Soggetto topico Electric fault location
Machine learning
Systems on a chip
ISBN 3-031-19639-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion.
Record Nr. UNINA-9910682590803321
Cham, Switzerland : , : Springer, , [2023]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Proceedings of the 14th French-Speaking Conference on Human-Computer Interaction
Proceedings of the 14th French-Speaking Conference on Human-Computer Interaction
Autore Girard Patrick
Pubbl/distr/stampa [Place of publication not identified], : ACM, 2002
Descrizione fisica 1 online resource (290 pages)
Disciplina 004.019
Collana ACM International Conference Proceeding Series
Soggetto topico Engineering & Applied Sciences
Computer Science
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti IHM '02 : proceedings of the 14th Conference on l'Interaction Homme-Machine
Interaction Homme-Machine 2002
Record Nr. UNINA-9910375829803321
Girard Patrick  
[Place of publication not identified], : ACM, 2002
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2006
Disciplina 621.381
Soggetto topico Integrated circuits - Testing
Integrated circuits - Design and construction
Microelectronics - Design
Microelectronics - Testing
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
ISBN 1-5090-9447-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996218384203316
[Place of publication not identified], : IEEE Computer Society, 2006
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2006
Disciplina 621.381
Soggetto topico Integrated circuits - Testing
Integrated circuits - Design and construction
Microelectronics - Design
Microelectronics - Testing
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
ISBN 1-5090-9447-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910145454703321
[Place of publication not identified], : IEEE Computer Society, 2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui