Method for measuring axis orthogonality in MEMS accelerometers / / Craig D. McGray; Yaqub Afridi; Jon Geist |
Autore | McGray Craig D |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 |
Descrizione fisica | 1 online resource (11 pages) : illustrations (some color) |
Altri autori (Persone) |
AfridiYaqub
GeistJon McGrayCraig D |
Collana | NISTIR |
Soggetto topico |
Accelerometers
Axis orthogonality |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710519203321 |
McGray Craig D
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 | ||
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Lo trovi qui: Univ. Federico II | ||
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Optical radiation measurements : Fundamental principles of absolute radiometry and the philosophy of this NBS program (1968 to 1971) / / Jon Geist |
Autore | Geist Jon |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | GeistJon |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Optical radiation measurements |
Record Nr. | UNINA-9910711390503321 |
Geist Jon
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 | ||
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Lo trovi qui: Univ. Federico II | ||
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Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / / Jon Geist; M. Yaqub Afridi |
Autore | Geist Jon |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015 |
Descrizione fisica | 1 online resource (39 pages) : illustrations (color) |
Altri autori (Persone) |
AfridiM. Yaqub
GeistJon |
Collana | NISTIR |
Soggetto topico |
Data collection systems
Frequencies of oscillating systems |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 |
Record Nr. | UNINA-9910709597103321 |
Geist Jon
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015 | ||
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Lo trovi qui: Univ. Federico II | ||
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Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition / / Janet M. Cassard ... [and others] |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 |
Descrizione fisica | 1 online resource (224 pages) : illustrations (color) |
Altri autori (Persone) |
CassardJanet M
GaitanMichael GeistJon ReadD. T SeilerDavid G VorburgerTheodore V |
Collana | NIST special publication |
Soggetto topico | Physical measurements |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Standard Reference Materials |
Record Nr. | UNINA-9910709585603321 |
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 | ||
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Lo trovi qui: Univ. Federico II | ||
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A water bath blackbody for the 5 to 60 degree] temperature range : performance goal, design concept, and test results / / Jon. Geist |
Autore | Geist Jon |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | GeistJon |
Collana | NBS technical note |
Soggetto topico | Blackbody radiation |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | [Water bath blackbody for the 5 to 60 degree] temperature range |
Record Nr. | UNINA-9910711220303321 |
Geist Jon
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 | ||
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Lo trovi qui: Univ. Federico II | ||
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