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Amplitude modulation atomic force microscopy / / Ricardo Garcia



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Autore: Garcia Arrojo Ricardo Visualizza persona
Titolo: Amplitude modulation atomic force microscopy / / Ricardo Garcia Visualizza cluster
Pubblicazione: Weinheim, Germany, : Wiley-VCH, 2010
Descrizione fisica: 1 online resource (195 p.)
Disciplina: 502.82
Soggetto topico: Atomic force microscopy
Amplitude modulation
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Amplitude Modulation Atomic Force Microscopy; Contents; Preface; Annotation List; 1 Introduction; 2 Instrumental and Conceptual Aspects; 3 Tip-Surface Interaction Forces; 4 Theory of Amplitude Modulation AFM; 5 Advanced Theory of Amplitude Modulation AFM; 6 Amplitude Modulation AFM in Liquid; 7 Phase Imaging Atomic Force Microscopy; 8 Resolution, Noise, and Sensitivity; 9 Multifrequency Atomic Force Microscopy; 10 Beyond Topographic Imaging; References; Index
Sommario/riassunto: Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.
Titolo autorizzato: Amplitude modulation atomic force microscopy  Visualizza cluster
ISBN: 9786612783906
9783527643943
352764394X
9781282783904
1282783904
9783527632183
3527632182
9783527632190
3527632190
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9911019340003321
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