FDL : proceedings of the 2017 Forum on Specification & Design Languages : Verona, Italy, September 18-20 / / editor, Franco Fummi ; sponsored by Institute of Electrical and Electronics Engineers |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2017 |
Descrizione fisica | 1 online resource (890 pages) |
Disciplina | 004.0151 |
Soggetto topico |
Formal methods (Computer science)
Software engineering |
Soggetto genere / forma | Electronic books. |
ISBN | 1-5386-4733-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996279512103316 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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FDL : proceedings of the 2017 Forum on Specification & Design Languages : Verona, Italy, September 18-20 / / editor, Franco Fummi ; sponsored by Institute of Electrical and Electronics Engineers |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2017 |
Descrizione fisica | 1 online resource (890 pages) |
Disciplina | 004.0151 |
Soggetto topico |
Formal methods (Computer science)
Software engineering |
Soggetto genere / forma | Electronic books. |
ISBN | 1-5386-4733-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910262259503321 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Languages, Design Methods, and Tools for Electronic System Design : Selected Contributions from FDL 2016 / / edited by Franco Fummi, Robert Wille |
Edizione | [1st ed. 2018.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
Descrizione fisica | 1 online resource (VII, 116 p. 61 illus., 48 illus. in color.) |
Disciplina | 004.0151 |
Collana | Lecture Notes in Electrical Engineering |
Soggetto topico |
Electronic circuits
Microprocessors Electronics Microelectronics Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation |
ISBN | 3-319-62920-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Chapter1. Knowing Your AMS System's Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation -- Chapter2. Designing Reliable Cyber-Physical Systems -- Chapter3. On the Application of Formal Fault Localization to Automated RTL-to-TLM Fault Correspondence Analysis for Fast and Accurate VP-based Error Effect Simulation - A Case Study -- Chapter4. Selective Abstraction and Stochastic Methods for Scalable Power Modelling of Heterogeneous Systems -- Chapter5. Feature based State Space Coverage of Analog Circuits -- Chapter6. Error-free Near-threshold Adiabatic CMOS Logic in Presence of Process Variation. |
Record Nr. | UNINA-9910299881003321 |
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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