A certification plan for a planar near-field range used for high-performance phased-array testing / / Michael H. Francis; Andrew G. Repjar; Douglas P. Kremer |
Autore | Francis Michael H |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1992 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
FrancisMichael H
KremerDouglas P RepjarAndrew G |
Collana | NISTIR |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710800903321 |
Francis Michael H | ||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1992 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Computation of antenna side-lobe coupling in the near field using approximate far-field data / / Michael H. Francis; Arthur D. Yaghjian |
Autore | Francis Michael H |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1982 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
FrancisMichael H
YaghjianArthur D |
Collana | NBSIR |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710264403321 |
Francis Michael H | ||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1982 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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X-band atmospheric attenuation for an earth terminal measurement system / / Michael H. Francis |
Autore | Francis Michael H |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1989 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | FrancisMichael H |
Collana | NISTIR |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710506803321 |
Francis Michael H | ||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1989 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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