X-ray scattering from semiconductors [[electronic resource] /] / Paul F. Fewster |
Autore | Fewster Paul F |
Edizione | [2nd ed.] |
Pubbl/distr/stampa | River Edge, NJ, : Imperial College Press, c2003 |
Descrizione fisica | 1 online resource (310 p.) |
Disciplina | 539.7222 |
Soggetto topico |
X-rays - Scattering
Semiconductors |
Soggetto genere / forma | Electronic books. |
ISBN |
1-62870-231-1
1-281-86636-9 9786611866365 1-86094-458-2 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Copyright; Preface; Contents; 1 - An Introduction to Semiconductor Materials; 2 - An Introduction to X-Ray Scattering; 3 - Equipment for Measuring Diffraction Patterns; 4 - A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index |
Record Nr. | UNINA-9910451134603321 |
Fewster Paul F
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||
River Edge, NJ, : Imperial College Press, c2003 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
X-ray scattering from semiconductors [[electronic resource] /] / Paul F. Fewster |
Autore | Fewster Paul F |
Edizione | [2nd ed.] |
Pubbl/distr/stampa | River Edge, NJ, : Imperial College Press, c2003 |
Descrizione fisica | 1 online resource (310 p.) |
Disciplina | 539.7222 |
Soggetto topico |
X-rays - Scattering
Semiconductors |
ISBN |
1-62870-231-1
1-281-86636-9 9786611866365 1-86094-458-2 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Copyright; Preface; Contents; 1 - An Introduction to Semiconductor Materials; 2 - An Introduction to X-Ray Scattering; 3 - Equipment for Measuring Diffraction Patterns; 4 - A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index |
Record Nr. | UNINA-9910784014703321 |
Fewster Paul F
![]() |
||
River Edge, NJ, : Imperial College Press, c2003 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|