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Manufacturing Metrology
| Manufacturing Metrology |
| Autore | Fan Kuang-Chao |
| Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
| Descrizione fisica | 1 online resource (414 p.) |
| Soggetto topico |
History of engineering & technology
Technology: general issues |
| Soggetto non controllato |
3D reconstruction
a priori planning absolute angle measurement absolute distance measurement actual laser imaging waveform aeroengine blade angle measurement automated optical inspection blade tip timing blade twist centroid difference chromatic confocal probe circular contour circulating cooling water circumferential Fourier fit CMP compressed sensing confocal sensing confocal sensor coordinate measuring machine cutting edge radius defect detection depth detection diamond roller differential Fabry-Pérot interferometer differential measurement system diffraction grating dispensing robot dual-axis level dynamic measurement dynamic response speed dynamic thermal filtering edge detection elastic recovery end-plate surface distance measurement femtosecond laser film interferometry form measurement form truing GD& generative adversarial network (GAN) geometric analysis geometric deviations high aspect ratios homodyne interferometer identification method in-process in-situ measurements laser autocollimation laser interference laser triangulation displacement sensor (LTDS) length calibration light refraction light transmission linear displacement location system machine tool measurement and evaluation measurement mechanism measurement system analysis measurement uncertainty metrology metrology for machining miniature internal structures mode-locked femtosecond laser modular design Monte Carlo method multi-path laser synthesis technology multi-tasking machine tools n/a nanoindentation system nonlinear optics nonlinearity error off-axis differential method on-site measurement optical angle sensor optical coherence tomography optical frequency comb over-constrained mechanism pad dressing pad lifetime pad uniformity point probing characteristics positional relation precision manufacturing precision measurement precision metrology quality quick response repeatability accuracy reproducibility reversal method roughness roundness measurement scanless 3D imaging second harmonic generation single point diamond tool single-pixel detector spherical diamond wheel spherical scattering electrical field probe squareness of translational axes step gauge stitching linear-scan method surface charge distribution surface form tracing surface positioning surface shape contour surface texture measurement synchronous vibration system error correction T temperature stability thermal management topography measurement tracking local minimum method wafer die white light interference you only look once version 3 (YOLOv3) |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910580211003321 |
Fan Kuang-Chao
|
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| Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Precision Dimensional Measurements / Kuang-Chao Fan, Liang-Chia Chen
| Precision Dimensional Measurements / Kuang-Chao Fan, Liang-Chia Chen |
| Autore | Fan Kuang-Chao |
| Pubbl/distr/stampa | Basel, Switzerland : , : MDPI, , 2019 |
| Descrizione fisica | 1 online resource (1 p.) |
| Soggetto non controllato | Kolsky bar; speckle; in-plane displacement measurement; wavelet transform; dynamic mechanical properties; orthogonally splitting imaging pose sensor; general imaging model; radial basis function interpolation; probe; leaf spring; chemical etching; beryllium bronze; micro fiber sensor; shape reconstruction; soft surgical robot; pneumatic actuator; modeling; through-focus optical microscopy; illumination polarization; target structure; sensitivity; error separation technique; cylindricity; form measurement; in situ measurement; frequency scanning interferometry; adaptive filtering method; mosaic algorithm; null test measurement; stitching interferometry; cylindrical surface; iterative algorithm; chessboard corner; camera calibration; pose estimation; sub-pixel localization; laser diode; interferometer; wavelength corrector; angular error; nanopositioning stage; simultaneous measurement; six degrees-of-freedom errors; rotary axis; error model; interference lithography; two-axis planar scale grating; Lloyd's mirror; surface encoder; metrology; precision measurement; air refractive index; wavelength correction; strained silicon (ε-Si); multiscale; structural property; mechanical property; micro-Raman spectroscopy; cross-section; dislocation; systems design; simulation; form measurements; 3D measurements; capacitive linear displacement sensor; vernier-type absolute structure; differential sensing structure; time-grating; optical interference; phase generated carrier; phase demodulation; water surface acoustic waves; five-axis system; CMM; dimensional measurements; inspection planning; accuracy; optical frequency comb; heterodyne interferometry; center wavelength; IMU; dynamic tracking; limbs' coordination; motor control pattern; motor learning; surface encoder; multi-degree-of-freedom; interferometry; grating; prism; scale grating; Fizeau interferometer; optical encoder; pitch deviation; out-of-flatness; uncertainty; digital image correlation (DIC); edge detection; random speckle images; surface profilometry; automated optical inspection (AOI); data compression; data reduction; free-form surface; point cloud; scanning measurement; redundancy identifying; redundancy eliminating; geometric feature similarity; structural health monitoring; real-time monitoring; tunnel deformation measurement; machine vision; laser beam; wireless; low visibility; ellipsometry; scatterometry; Mueller matrix; diffraction grating; inverse scattering; pitch measurement; on-machine measurement; through-hole depth; image processing; automatic drilling and riveting; large-scale composite board; depth detection; measurement uncertainty; coordinate measuring machines; evaluation and optimization; geometrical product specifications; Photoelectric scanning; angle intersection; dynamic error modeling; large-scale metrology; laser feedback; precision measurement; frequency-shifted; solid-state laser; small hole diameter; depth-to-diameter ratio; spherical scattering electrical-field probing; hole diameter measuring machine; grating interferometer; laser encoder; spatially separated heterodyne interferometry; alignment tolerance; chromatic confocal probe; femtosecond laser; measurement range expansion; side-lobe; linear guideway; geometric errors; pentaprism; machine tool; ellipsometry; volume grating; nanostructure metrology; distributed dielectric constant model; holography; optical measurement; dimensional measurement; aspheric mirror; vertex position; absolute distance measurement; frequency-sweep polarization-modulation ranging; frequency drift; error compensation; optimization; power consumption; machining efficiency; machining cost; semiconductor; surface profilometry; moiré projection; 3-D measurement; automated optical inspection (AOI); Fizeau interferometry; wavelength tuning; separation of interferograms; characterization of a transparent plate; 36-step algorithm; mass; center of gravity; side force; load cell; mechanical structure; modeling; n/a |
| ISBN |
9783039217137
3039217135 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910674016903321 |
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Fan Kuang-Chao
|
||
| Basel, Switzerland : , : MDPI, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||