High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
Descrizione fisica | 1 online resource (668 p.) |
Disciplina | 502/.8/25 |
Soggetto topico | Transmission electron microscopy |
Soggetto genere / forma | Electronic books. |
ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
Record Nr. | UNINA-9910458542203321 |
New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
Descrizione fisica | 1 online resource (668 p.) |
Disciplina | 502/.8/25 |
Soggetto topico | Transmission electron microscopy |
ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
Record Nr. | UNINA-9910784513003321 |
New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
Descrizione fisica | 1 online resource (668 p.) |
Disciplina | 502/.8/25 |
Soggetto topico | Transmission electron microscopy |
ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
Record Nr. | UNINA-9910822480903321 |
New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|