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High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
Pubbl/distr/stampa New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988
Descrizione fisica 1 online resource (668 p.)
Disciplina 502/.8/25
Soggetto topico Transmission electron microscopy
Soggetto genere / forma Electronic books.
ISBN 1-280-52324-7
9786610523245
0-19-536465-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX
Record Nr. UNINA-9910458542203321
New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
Pubbl/distr/stampa New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988
Descrizione fisica 1 online resource (668 p.)
Disciplina 502/.8/25
Soggetto topico Transmission electron microscopy
ISBN 1-280-52324-7
9786610523245
0-19-536465-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX
Record Nr. UNINA-9910784513003321
New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
Pubbl/distr/stampa New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988
Descrizione fisica 1 online resource (668 p.)
Disciplina 502/.8/25
Soggetto topico Transmission electron microscopy
ISBN 1-280-52324-7
9786610523245
0-19-536465-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX
Record Nr. UNINA-9910822480903321
New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui