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2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors
Plasma radiation
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206559703316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors
Plasma radiation
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872957903321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2001 6th International Symposium on Plasma- and Process-Induced Damage : May 13-15, 2001, Monterey, California, USA
2001 6th International Symposium on Plasma- and Process-Induced Damage : May 13-15, 2001, Monterey, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2001
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors - Defects
Plasma radiation
Semiconductors
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206559403316
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2001
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2001 6th International Symposium on Plasma- and Process-Induced Damage : May 13-15, 2001, Monterey, California, USA
2001 6th International Symposium on Plasma- and Process-Induced Damage : May 13-15, 2001, Monterey, California, USA
Pubbl/distr/stampa [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2001
Disciplina 621.3815/2
Soggetto topico Semiconductor wafers - Effect of radiation on
Semiconductors - Defects
Plasma radiation
Semiconductors
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872958903321
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2001
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui