Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / / by Badih El-Kareh, Lou N. Hutter |
Autore | El-Kareh Badih |
Edizione | [2nd ed. 2020.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
Descrizione fisica | 1 online resource (XLIX, 648 p. 473 illus., 272 illus. in color.) |
Disciplina | 621.3815 |
Soggetto topico |
Electronic circuits
Optical materials Electronic materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials |
ISBN | 3-030-15085-2 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- Analog/RF CMOS -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability. |
Record Nr. | UNINA-9910366587603321 |
El-Kareh Badih | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / / by Badih El-Kareh, Lou N. Hutter |
Autore | El-Kareh Badih |
Edizione | [1st ed. 2015.] |
Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 |
Descrizione fisica | 1 online resource (634 p.) |
Disciplina |
620
620.11295 620.11297 621.3815 |
Soggetto topico |
Electronic circuits
Optical materials Electronic materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials |
ISBN | 1-4939-2751-5 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability. |
Record Nr. | UNINA-9910299832603321 |
El-Kareh Badih | ||
New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Silicon Components and Processes Self Study : Field-Effect Transistors / / by Badih El-Kareh, Lou N. Hutter |
Autore | El-Kareh Badih |
Edizione | [1st ed. 2025.] |
Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025 |
Descrizione fisica | 1 online resource (520 pages) |
Disciplina | 620.193 |
Altri autori (Persone) | HutterLou N |
Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
ISBN | 3-031-59193-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Intro -- Preface -- Contents -- Appendix A: Abbreviations, Acronyms -- Appendix B: List of Symbols -- Appendix C: Universal Physical Constants -- Appendix D: Properties of Silicon and Germanium -- Appendix E: Properties of SiO2 and Si3N4 (300 K) -- Appendix F: International System of Units, SI -- Appendix G: The Greek Alphabet -- Appendix H:Conversion Factors -- Appendix I: Periodic Table of the Elements -- Answers to Review Questions -- Solution Manual -- Index. |
Record Nr. | UNINA-9910886993003321 |
El-Kareh Badih | ||
Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Silicon Components and Processes Self Study : Unit Processes and Process Integration / / by Badih El-Kareh, Lou N. Hutter |
Autore | El-Kareh Badih |
Edizione | [1st ed. 2024.] |
Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 |
Descrizione fisica | 1 online resource (637 pages) |
Disciplina | 728.370942 |
Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
ISBN | 3-031-59219-0 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Intro -- Preface -- Contents -- Appendix A: Abbreviations, acronyms -- Appendix B: List of Symbols -- Appendix C: Universal Physical Constants -- Appendix D: Properties of Silicon and Germanium -- Appendix E: Properties of SiO2 and Si3N4 (300 K) -- Appendix F: International System of Units, SI -- Appendix G: The Greek Alphabet -- Appendix H:Conversion Factors -- Appendix I: Periodic Table of the Elements -- Answers to Review Questions -- Solution Manual -- Index. |
Record Nr. | UNINA-9910882896303321 |
El-Kareh Badih | ||
Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Silicon Components and Processes Self Study : Rectifying and Ohmic Contacts, Bipolar Junction Transistors / / by Badih El-Kareh, Lou N. Hutter |
Autore | El-Kareh Badih |
Edizione | [1st ed. 2024.] |
Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 |
Descrizione fisica | 1 online resource (563 pages) |
Disciplina | 620.193 |
Altri autori (Persone) | HutterLou N |
Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
ISBN | 3-031-59189-5 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910900174303321 |
El-Kareh Badih | ||
Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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