Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud
| X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud |
| Edizione | [1st ed. 2009.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009 |
| Descrizione fisica | 1 online resource (XIV, 350 p.) |
| Disciplina | 539.7222 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Solid state physics
Spectroscopy Microscopy Materials—Surfaces Thin films Materials science Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Characterization and Evaluation of Materials |
| ISBN | 3-540-88588-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The Interaction of X-Rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- X-Ray Reflectivity by Rough Multilayers -- Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures. |
| Record Nr. | UNINA-9910143965603321 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud
| X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud |
| Edizione | [1st ed. 2009.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009 |
| Descrizione fisica | 1 online resource (XIV, 350 p.) |
| Disciplina | 539.7222 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Solid state physics
Spectroscopy Microscopy Materials—Surfaces Thin films Materials science Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Characterization and Evaluation of Materials |
| ISBN | 3-540-88588-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The Interaction of X-Rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- X-Ray Reflectivity by Rough Multilayers -- Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures. |
| Record Nr. | UNISA-996466687803316 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||