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X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud
X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud
Edizione [1st ed. 2009.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009
Descrizione fisica 1 online resource (XIV, 350 p.)
Disciplina 539.7222
Collana Lecture Notes in Physics
Soggetto topico Solid state physics
Spectroscopy
Microscopy
Materials—Surfaces
Thin films
Materials science
Solid State Physics
Spectroscopy and Microscopy
Surfaces and Interfaces, Thin Films
Characterization and Evaluation of Materials
ISBN 3-540-88588-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto The Interaction of X-Rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- X-Ray Reflectivity by Rough Multilayers -- Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures.
Record Nr. UNINA-9910143965603321
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud
X-ray and Neutron Reflectivity [[electronic resource] ] : Principles and Applications / / edited by Jean Daillant, Alain Gibaud
Edizione [1st ed. 2009.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009
Descrizione fisica 1 online resource (XIV, 350 p.)
Disciplina 539.7222
Collana Lecture Notes in Physics
Soggetto topico Solid state physics
Spectroscopy
Microscopy
Materials—Surfaces
Thin films
Materials science
Solid State Physics
Spectroscopy and Microscopy
Surfaces and Interfaces, Thin Films
Characterization and Evaluation of Materials
ISBN 3-540-88588-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto The Interaction of X-Rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- X-Ray Reflectivity by Rough Multilayers -- Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures.
Record Nr. UNISA-996466687803316
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui