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An analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell / / John C. Tippet; David C. Chang; Myron L. Crawford
An analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell / / John C. Tippet; David C. Chang; Myron L. Crawford
Autore Tippet John C
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976
Descrizione fisica 1 online resource
Altri autori (Persone) ChangDavid C
CrawfordM. L
TippetJohn C
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710030603321
Tippet John C  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Dispersion and attenuation characteristics of mode in a TEM-cell with a lossy dielectric slab / / John C. Tippet; David C. Chang
Dispersion and attenuation characteristics of mode in a TEM-cell with a lossy dielectric slab / / John C. Tippet; David C. Chang
Autore Tippet John C
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979
Descrizione fisica 1 online resource
Altri autori (Persone) ChangDavid C
TippetJohn C
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910709905103321
Tippet John C  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Electromagnetic boundary-value problems based upon a modification of residue calculus and function theoretic techniques / / James Patrick Montgomery, David C. Chang
Electromagnetic boundary-value problems based upon a modification of residue calculus and function theoretic techniques / / James Patrick Montgomery, David C. Chang
Autore Montgomery James Patrick
Pubbl/distr/stampa [Washington] : , : U.S. Dept. of Commerce, National Bureau of Standards : , : For sale by the Supt. of Docs., U.S. Govt. Print. Off., , 1979
Descrizione fisica 1 online resource (vi, 177 pages) : illustrations
Disciplina 602/.18 s
530.1/41
Altri autori (Persone) ChangDavid C
Collana NBS monograph
Soggetto topico Calculus
Electromagnetic theory
Functional analysis
Wave guides
Guides d'ondes
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910712904803321
Montgomery James Patrick  
[Washington] : , : U.S. Dept. of Commerce, National Bureau of Standards : , : For sale by the Supt. of Docs., U.S. Govt. Print. Off., , 1979
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Electromagnetic remote sensing of inhomogeneous media / / Wolfgang A. Bereuter; David C. Chang
Electromagnetic remote sensing of inhomogeneous media / / Wolfgang A. Bereuter; David C. Chang
Autore Bereuter Wolfgang A
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1977
Descrizione fisica 1 online resource
Altri autori (Persone) BereuterWolfgang A
ChangDavid C
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710029203321
Bereuter Wolfgang A  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1977
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Higher order modes in rectangular coaxial line with infinitely thin inner conductor / / John C. Tippet; David C. Chang
Higher order modes in rectangular coaxial line with infinitely thin inner conductor / / John C. Tippet; David C. Chang
Autore Tippet John C
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1978
Descrizione fisica 1 online resource
Altri autori (Persone) ChangDavid C
TippetJohn C
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710299103321
Tippet John C  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1978
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Radiation characteristics of dipole sources located inside a rectangular, coaxial transmission line / / John C. Tippet; David C. Chang
Radiation characteristics of dipole sources located inside a rectangular, coaxial transmission line / / John C. Tippet; David C. Chang
Autore Tippet John C
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976
Descrizione fisica 1 online resource
Altri autori (Persone) ChangDavid C
TippetJohn C
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710037503321
Tippet John C  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
A variational expression for the scattering matrix of a coaxial line step discontinuity and its application to an over moded coaxial TEM cell / / I. Sreenivasiah; David C. Chang
A variational expression for the scattering matrix of a coaxial line step discontinuity and its application to an over moded coaxial TEM cell / / I. Sreenivasiah; David C. Chang
Autore Sreenivasiah I
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979
Descrizione fisica 1 online resource
Altri autori (Persone) ChangDavid C
SreenivasiahI
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910709909403321
Sreenivasiah I  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui