Standard reference materials : preparation and certification of SRM-2530, ellipsometric parameters ? and ? and derived thickness and refractive index of a silicon dioxide layer on silicon / / G. A. Candela, D. Chandler-Horowitz, D. B. Novotny, B. J. Belzer,M. C. Croarkin |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1988 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
BelzerBenjamin Joseph
CandelaG. A (George A.) Chandler-HorowitzDeane CroarkinM. C NovotnyD. B |
Collana | NIST special publication |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Standard reference materials |
Record Nr. | UNINA-9910709560803321 |
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1988 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Standard reference materials and data for Raman spectroscopy, electron paramagnetic resonance, and magnetic moment measurements / / H. S. Bennett; G. A. Candela; T. Chang; R. E. Mundy; G. J. Rosasco |
Autore | Bennett H. S |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1975 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
BennettH. S
CandelaG. A (George A.) ChangTetse <1919-> MundyR. E RosascoG. J |
Collana | NBSIR |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710044003321 |
Bennett H. S | ||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1975 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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