Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
| An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University |
| Autore | Brillson L. J. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016 |
| Descrizione fisica | 1 online resource (379 p.) |
| Disciplina | 621.381 |
| Soggetto topico |
Electronics - Materials
Surfaces (Technology) - Analysis Spectrum analysis Semiconductors - Materials |
| ISBN |
1-119-02713-6
1-78785-141-9 1-119-02714-4 1-119-02712-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces. |
| Record Nr. | UNINA-9910136943803321 |
Brillson L. J.
|
||
| Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
| An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University |
| Autore | Brillson L. J. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016 |
| Descrizione fisica | 1 online resource (379 p.) |
| Disciplina | 621.381 |
| Soggetto topico |
Electronics - Materials
Surfaces (Technology) - Analysis Spectrum analysis Semiconductors - Materials |
| ISBN |
1-119-02713-6
1-78785-141-9 1-119-02714-4 1-119-02712-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces. |
| Record Nr. | UNINA-9910818236403321 |
|
Brillson L. J.
|
||
| Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||