Empirical evidence for increased false reject rate with time lapse in ICE 2006 / / S. E. Baker; K. W. Bowyer; P. J. Flynn; P. J. Phillips
| Empirical evidence for increased false reject rate with time lapse in ICE 2006 / / S. E. Baker; K. W. Bowyer; P. J. Flynn; P. J. Phillips |
| Autore | Baker S. E |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BakerS. E
BowyerK. W FlynnP. J PhillipsP. J |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710741903321 |
Baker S. E
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 | ||
| Lo trovi qui: Univ. Federico II | ||
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Overview of the multiple biometrics grand challenge / / P. J. Phillips; H. A. Sahibzada; P. J. Flynn; K. W. Bowyer; A. O'Toole; S. Weimer; J. R. Beveridge; B. Draper; D. Bolme; G. H. Givens; Y. M. Lui; J. A. Scallan; W. T. Scruggs
| Overview of the multiple biometrics grand challenge / / P. J. Phillips; H. A. Sahibzada; P. J. Flynn; K. W. Bowyer; A. O'Toole; S. Weimer; J. R. Beveridge; B. Draper; D. Bolme; G. H. Givens; Y. M. Lui; J. A. Scallan; W. T. Scruggs |
| Autore | Phillips P. J |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2009 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BeveridgeJ. R
BolmeD BowyerK. W DraperB FlynnP. J (Patrick J.) GivensGeof H LuiY. M O'TooleA PhillipsP. J SahibzadaH. A ScallanJ. A ScruggsW. T WeimerS |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710750203321 |
Phillips P. J
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2009 | ||
| Lo trovi qui: Univ. Federico II | ||
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