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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
| 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2003 |
| Soggetto topico |
Integrated circuits - Design and construction - Very large scale integration
Fault-tolerant computing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214789603316 |
| [Place of publication not identified], : IEEE Computer Society Press, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
| 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2003 |
| Soggetto topico |
Integrated circuits - Design and construction - Very large scale integration
Fault-tolerant computing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872558103321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) / / Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors
| 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) / / Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2022 |
| Descrizione fisica | 1 online resource (1532 pages) : illustrations |
| Disciplina | 620.0042 |
| Soggetto topico | Computer-aided design - Congresses |
| ISBN | 3-9819263-6-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2022 Design, Automation & Test in Europe Conference & Exhibition |
| Record Nr. | UNINA-9910571794603321 |
| Piscataway, NJ : , : IEEE, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) / / Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors
| 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) / / Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2022 |
| Descrizione fisica | 1 online resource (1532 pages) : illustrations |
| Disciplina | 620.0042 |
| Soggetto topico | Computer-aided design - Congresses |
| ISBN | 3-9819263-6-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2022 Design, Automation & Test in Europe Conference & Exhibition |
| Record Nr. | UNISA-996574932703316 |
| Piscataway, NJ : , : IEEE, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216505403316 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145668103321 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
DFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy
| DFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Design and construction - Very large scale integration
Fault-tolerant computing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-8857-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215563303316 |
| [Place of publication not identified], : IEEE Computer Society Press, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
DFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy
| DFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Design and construction - Very large scale integration
Fault-tolerant computing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-8857-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146691303321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||