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OCM 2023 : 6th International Conference on Optical Characterization of Materials : March 22nd - 23rd, 2023 : Karlsruhe, Germany / / Jürgen Beyerer, Thomas Längle, Michael Heizmann
| OCM 2023 : 6th International Conference on Optical Characterization of Materials : March 22nd - 23rd, 2023 : Karlsruhe, Germany / / Jürgen Beyerer, Thomas Längle, Michael Heizmann |
| Autore | Beyerer Jürgen |
| Pubbl/distr/stampa | Karlsruhe : , : KIT Scientific Publishing, , [2023] |
| Descrizione fisica | 1 online resource (vii, 178 pages) |
| Disciplina | 006.37 |
| Soggetto topico |
Multispectral imaging
Computer vision |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910727271803321 |
Beyerer Jürgen
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| Karlsruhe : , : KIT Scientific Publishing, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Pattern Recognition : introduction, features, classifiers and principles / / Jürgen Beyerer, Matthias Richter, Matthias Nagel
| Pattern Recognition : introduction, features, classifiers and principles / / Jürgen Beyerer, Matthias Richter, Matthias Nagel |
| Autore | Beyerer Jürgen |
| Pubbl/distr/stampa | Berlin : , : De Gruyter, , [2018] |
| Descrizione fisica | 1 online resource (306 pages) |
| Collana | De Gruyter graduate |
| Soggetto topico | Pattern recognition systems |
| Soggetto genere / forma | Electronic books. |
| ISBN | 3-11-053796-6 |
| Classificazione | ST 330 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Frontmatter -- Preface / Beyerer, Jürgen / Richter, Matthias / Nagel, Matthias -- Contents -- List of Tables -- List of Figures -- Notation -- Introduction -- 1. Fundamentals and definitions -- 2. Features -- 3. Bayesian decision theory -- 4. Parameter estimation -- 5. Parameter free methods -- 6. General considerations -- 7. Special classifiers -- 8. Classification with nominal features -- 9. Classifier-independent concepts -- A. Solutions to the exercises -- B. A primer on Lie theory -- C. Random processes -- Bibliography -- Glossary -- Index |
| Record Nr. | UNINA-9910467414703321 |
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Beyerer Jürgen
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| Berlin : , : De Gruyter, , [2018] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Pattern Recognition : introduction, features, classifiers and principles / / Jürgen Beyerer, Matthias Richter, Matthias Nagel
| Pattern Recognition : introduction, features, classifiers and principles / / Jürgen Beyerer, Matthias Richter, Matthias Nagel |
| Autore | Beyerer Jürgen |
| Pubbl/distr/stampa | Berlin : , : De Gruyter, , [2018] |
| Descrizione fisica | 1 online resource (306 pages) |
| Disciplina | 006.4 |
| Collana | De Gruyter graduate |
| Soggetto topico | Pattern recognition systems |
| ISBN | 3-11-053796-6 |
| Classificazione | ST 330 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Frontmatter -- Preface / Beyerer, Jürgen / Richter, Matthias / Nagel, Matthias -- Contents -- List of Tables -- List of Figures -- Notation -- Introduction -- 1. Fundamentals and definitions -- 2. Features -- 3. Bayesian decision theory -- 4. Parameter estimation -- 5. Parameter free methods -- 6. General considerations -- 7. Special classifiers -- 8. Classification with nominal features -- 9. Classifier-independent concepts -- A. Solutions to the exercises -- B. A primer on Lie theory -- C. Random processes -- Bibliography -- Glossary -- Index |
| Record Nr. | UNINA-9910796616803321 |
|
Beyerer Jürgen
|
||
| Berlin : , : De Gruyter, , [2018] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Pattern Recognition : introduction, features, classifiers and principles / / Jürgen Beyerer, Matthias Richter, Matthias Nagel
| Pattern Recognition : introduction, features, classifiers and principles / / Jürgen Beyerer, Matthias Richter, Matthias Nagel |
| Autore | Beyerer Jürgen |
| Pubbl/distr/stampa | Berlin : , : De Gruyter, , [2018] |
| Descrizione fisica | 1 online resource (306 pages) |
| Disciplina | 006.4 |
| Collana | De Gruyter graduate |
| Soggetto topico | Pattern recognition systems |
| ISBN | 3-11-053796-6 |
| Classificazione | ST 330 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Frontmatter -- Preface / Beyerer, Jürgen / Richter, Matthias / Nagel, Matthias -- Contents -- List of Tables -- List of Figures -- Notation -- Introduction -- 1. Fundamentals and definitions -- 2. Features -- 3. Bayesian decision theory -- 4. Parameter estimation -- 5. Parameter free methods -- 6. General considerations -- 7. Special classifiers -- 8. Classification with nominal features -- 9. Classifier-independent concepts -- A. Solutions to the exercises -- B. A primer on Lie theory -- C. Random processes -- Bibliography -- Glossary -- Index |
| Record Nr. | UNINA-9910821118703321 |
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Beyerer Jürgen
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| Berlin : , : De Gruyter, , [2018] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Proceedings of the 2021 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory / / Jürgen Beyerer, Tim Zander
| Proceedings of the 2021 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory / / Jürgen Beyerer, Tim Zander |
| Autore | Beyerer Jürgen |
| Pubbl/distr/stampa | [Place of publication not identified] : , : KIT Scientific Publishing, , 2022 |
| Descrizione fisica | 1 online resource (244 pages) |
| Disciplina | 006.37 |
| Soggetto topico | Computer vision |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910583587403321 |
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Beyerer Jürgen
|
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| [Place of publication not identified] : , : KIT Scientific Publishing, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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