Info
Advances in mathematical modeling for reliability [[electronic resource] /] / edited by Tim Bedford ... [et al.]
| Advances in mathematical modeling for reliability [[electronic resource] /] / edited by Tim Bedford ... [et al.] |
| Pubbl/distr/stampa | Amsterdam ; ; Washington, DC, : IOS Press, c2008 |
| Descrizione fisica | 1 online resource (248 p.) |
| Disciplina |
620
620.00452015118 620/.00452015118 |
| Altri autori (Persone) | BedfordT |
| Soggetto topico |
Engineering - Mathematical models
Reliability (Engineering) |
| Soggetto genere / forma | Electronic books. |
| ISBN |
6611786236
1-281-78623-3 9786611786236 1-4356-7806-0 600-00-0641-1 1-60750-334-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Title page; Introduction; Contents; Graphical Modeling and Bayesian Networks; Repairable Systems Modeling; Competing Risks; Mixture Failure Rate Modeling; Signature; Relations Among Aging and Stochastic Dependence; Theoretical Advances in Modeling, Inference and Computation; Recent Advances in Recurrent Event Modeling and Inference; Point Estimation of the Transition Intensities for a Markov Multi-State System via Output Performance Observation; Keyword Index; Author Index |
| Record Nr. | UNINA-9910453773403321 |
| Amsterdam ; ; Washington, DC, : IOS Press, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advances in mathematical modeling for reliability [[electronic resource] /] / edited by Tim Bedford ... [et al.]
| Advances in mathematical modeling for reliability [[electronic resource] /] / edited by Tim Bedford ... [et al.] |
| Pubbl/distr/stampa | Amsterdam ; ; Washington, DC, : IOS Press, c2008 |
| Descrizione fisica | 1 online resource (248 p.) |
| Disciplina |
620
620.00452015118 620/.00452015118 |
| Altri autori (Persone) | BedfordT |
| Soggetto topico |
Engineering - Mathematical models
Reliability (Engineering) |
| ISBN |
6611786236
1-281-78623-3 9786611786236 1-4356-7806-0 600-00-0641-1 1-60750-334-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Title page; Introduction; Contents; Graphical Modeling and Bayesian Networks; Repairable Systems Modeling; Competing Risks; Mixture Failure Rate Modeling; Signature; Relations Among Aging and Stochastic Dependence; Theoretical Advances in Modeling, Inference and Computation; Recent Advances in Recurrent Event Modeling and Inference; Point Estimation of the Transition Intensities for a Markov Multi-State System via Output Performance Observation; Keyword Index; Author Index |
| Record Nr. | UNINA-9910782590103321 |
| Amsterdam ; ; Washington, DC, : IOS Press, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advances in mathematical modeling for reliability / / edited by Tim Bedford ... [et al.]
| Advances in mathematical modeling for reliability / / edited by Tim Bedford ... [et al.] |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Amsterdam ; ; Washington, DC, : IOS Press, c2008 |
| Descrizione fisica | 1 online resource (248 p.) |
| Disciplina |
620
620.00452015118 620/.00452015118 |
| Altri autori (Persone) | BedfordT |
| Soggetto topico |
Engineering - Mathematical models
Reliability (Engineering) |
| ISBN |
6611786236
1-281-78623-3 9786611786236 1-4356-7806-0 600-00-0641-1 1-60750-334-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Title page; Introduction; Contents; Graphical Modeling and Bayesian Networks; Repairable Systems Modeling; Competing Risks; Mixture Failure Rate Modeling; Signature; Relations Among Aging and Stochastic Dependence; Theoretical Advances in Modeling, Inference and Computation; Recent Advances in Recurrent Event Modeling and Inference; Point Estimation of the Transition Intensities for a Markov Multi-State System via Output Performance Observation; Keyword Index; Author Index |
| Record Nr. | UNINA-9910961378803321 |
| Amsterdam ; ; Washington, DC, : IOS Press, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||