Modeling minority-carrier lifetime techniques that use transient excess-carrier decay [[electronic resource] /] / Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel
| Modeling minority-carrier lifetime techniques that use transient excess-carrier decay [[electronic resource] /] / Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel |
| Autore | Johnston Steven W |
| Pubbl/distr/stampa | Golden, Colo., : National Renewable Energy Laboratory, 2008 |
| Descrizione fisica | 1 online resource (1 unnumbered page) : color illustrations |
| Altri autori (Persone) |
BermanGregory M
AhrenkielRichard K |
| Collana | NREL/PO |
| Soggetto topico |
Photovoltaic cells - Research
Solar cells - Research Excess carriers (Solid state physics) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Modeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay |
| Record Nr. | UNINA-9910698699403321 |
Johnston Steven W
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| Golden, Colo., : National Renewable Energy Laboratory, 2008 | ||
| Lo trovi qui: Univ. Federico II | ||
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Relationship of recombination lifetime and dark current in silicon p-n junctions [[electronic resource] /] / R.K. Ahrenkiel ... [and others]
| Relationship of recombination lifetime and dark current in silicon p-n junctions [[electronic resource] /] / R.K. Ahrenkiel ... [and others] |
| Pubbl/distr/stampa | Golden, Colo. : , : National Renewable Energy Laboratory, , [2005] |
| Descrizione fisica | 1 volume : digital, PDF file |
| Altri autori (Persone) | AhrenkielRichard K |
| Collana | NREL/CP |
| Soggetto topico |
Photovoltaic cells - Testing
Silicon solar cells - Testing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910698106803321 |
| Golden, Colo. : , : National Renewable Energy Laboratory, , [2005] | ||
| Lo trovi qui: Univ. Federico II | ||
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