Miniaturized Transistors, Volume II |
Autore | Filipovic Lado |
Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
Descrizione fisica | 1 electronic resource (352 p.) |
Soggetto topico |
Research & information: general
Mathematics & science |
Soggetto non controllato |
FinFETs
CMOS device processing integrated circuits silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs) solid state circuit breaker (SSCB) prototype circuit design GaN HEMT high gate multi-recessed buffer power density power-added efficiency 4H-SiC MESFET IMRD structure power added efficiency 1200 V SiC MOSFET body diode surge reliability silvaco simulation floating gate transistor control gate CMOS device active noise control vacuum channel mean free path vertical air-channel diode vertical transistor field emission particle trajectory model F-N plot space-charge-limited currents 4H-SiC MESFET simulation power added efficiency (PAE) new device three-input transistor T-channel compact circuit style CMOS compatible technology avalanche photodiode SPICE model bandwidth high responsivity silicon photodiode AlGaN/GaN HEMTs thermal simulation transient channel temperature pulse width gate structures band-to-band tunnelling (BTBT) tunnelling field-effect transistor (TFET) germanium-around-source gate-all-around TFET (GAS GAA TFET) average subthreshold swing direct source-to-drain tunneling transport effective mass confinement effective mass multi-subband ensemble Monte Carlo non-equilibrium Green's function DGSOI FinFET core-insulator gate-all-around field effect transistor GAA nanowire one-transistor dynamic random-access memory (1T-DRAM) polysilicon grain boundary electron trapping flexible transistors polymers metal oxides nanocomposites dielectrics active layers nanotransistor quantum transport Landauer-Büttiker formalism R-matrix method nanoscale mosfet quantum current surface transfer doping 2D hole gas (2DHG) diamond MoO3 V2O5 MOSFET reliability random telegraph noise oxide defects SiO2 split-gate trench power MOSFET multiple epitaxial layers specific on-resistance device reliability nanoscale transistor bias temperature instabilities (BTI) defects single-defect spectroscopy non-radiative multiphonon (NMP) model time-dependent defect spectroscopy |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910580205803321 |
Filipovic Lado
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Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
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Lo trovi qui: Univ. Federico II | ||
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New Indicators for the Assessment and Prevention of Noise Nuisance |
Autore | Fredianelli Luca |
Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
Descrizione fisica | 1 electronic resource (170 p.) |
Soggetto topico |
Technology: general issues
History of engineering & technology |
Soggetto non controllato |
sound emergence
legislation annoyance measurement prediction uncertainty audibility signal-to-noise ratio sound pressure level field measurements spectrum analysis interior noise and vibration of vehicle COVID-19 noise soundscape metrics indicators descriptors sound lockdown geolocation noise classification seafarers acoustic pollution noise onboard ship health impact environmental pollution noise survey hypertension environmental noise railway noise recreational noise airport noise road traffic noise blood pressure noise annoyance diastolic blood pressure helicopter cabin noise levels noise reduction acoustic evaluation IAR Puma 330 ultrasound active noise control adjustable PAL quiet areas macro-temporal pattern noise indicator cognitive performance Stroop task listening experiment port noise noise sources noise mapping noise mitigations noise modeling ship noise sustainable management noise exposure prevention noise measurements research projects noise indicators noise metrics psychoacoustic nuisance sleep disturbance peak noise impulsive events health related quality of life health effects |
ISBN | 3-0365-5740-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910637791903321 |
Fredianelli Luca
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Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
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Lo trovi qui: Univ. Federico II | ||
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