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MTV 2007 : Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA
| MTV 2007 : Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2008 |
| Disciplina | 004.2/4 |
| Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8267-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212268603316 |
| [Place of publication not identified], : IEEE Computer Society, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
MTV 2007 : Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA
| MTV 2007 : Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2008 |
| Disciplina | 004.2/4 |
| Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8267-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910139861303321 |
| [Place of publication not identified], : IEEE Computer Society, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
MTV 2017 : 2017 18th International Workshop on Microprocessor and SOC Test, Security and Verification : proceedings : Austin, Texas, USA, 11-12 December 2017 / / Institute of Electrical and Electronics Engineers
| MTV 2017 : 2017 18th International Workshop on Microprocessor and SOC Test, Security and Verification : proceedings : Austin, Texas, USA, 11-12 December 2017 / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (76 pages) |
| Disciplina | 004 |
| Soggetto topico |
Microprocessors - Testing
Systems on a chip - Testing |
| ISBN | 1-5386-3351-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279527703316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
MTV 2017 : 2017 18th International Workshop on Microprocessor and SOC Test, Security and Verification : proceedings : Austin, Texas, USA, 11-12 December 2017 / / Institute of Electrical and Electronics Engineers
| MTV 2017 : 2017 18th International Workshop on Microprocessor and SOC Test, Security and Verification : proceedings : Austin, Texas, USA, 11-12 December 2017 / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (76 pages) |
| Disciplina | 004 |
| Soggetto topico |
Microprocessors - Testing
Systems on a chip - Testing |
| ISBN | 1-5386-3351-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910280940003321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly
| Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly |
| Autore | Schaub Keith B. |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , ©2004 |
| Descrizione fisica | 1 online resource (271 p.) |
| Disciplina |
621.382
621.384 |
| Altri autori (Persone) | KellyJoe, Ph. D. |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Wireless communication systems - Equipment and supplies - Testing |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-58053-848-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Table of Contents vi; Preface xiii; Acknowledgments xvii; CHAPTER 1; An Introduction to Production Testing 1; CHAPTER 2; RF and SOC Devices 13; CHAPTER 3; Cost of Test 33; CHAPTER 4; Production Testing of RF Devices 49; CHAPTER 5; Production Testing of SOC Devices 95; CHAPTER 6; Fundamentals of Analog and Mixed-Signal Testing 145; CHAPTER 7; Moving Beyond Production Testing 175; CHAPTER 8; Production Noise Measurements 193; Appendix A: Power and Voltage Conversions 225; Appendix B: RF Coaxial Connectors 229; List of Acronyms and Abbreviations 233; List of Numerical Prefixes 237
About the Authors 239Index 241 |
| Record Nr. | UNINA-9910451007203321 |
Schaub Keith B.
|
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| Norwood, Massachusetts : , : Artech House, , ©2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly
| Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly |
| Autore | Schaub Keith B. |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , ©2004 |
| Descrizione fisica | 1 online resource (271 p.) |
| Disciplina |
621.382
621.384 |
| Altri autori (Persone) | KellyJoe, Ph. D. |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Wireless communication systems - Equipment and supplies - Testing |
| ISBN | 1-58053-848-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Table of Contents vi; Preface xiii; Acknowledgments xvii; CHAPTER 1; An Introduction to Production Testing 1; CHAPTER 2; RF and SOC Devices 13; CHAPTER 3; Cost of Test 33; CHAPTER 4; Production Testing of RF Devices 49; CHAPTER 5; Production Testing of SOC Devices 95; CHAPTER 6; Fundamentals of Analog and Mixed-Signal Testing 145; CHAPTER 7; Moving Beyond Production Testing 175; CHAPTER 8; Production Noise Measurements 193; Appendix A: Power and Voltage Conversions 225; Appendix B: RF Coaxial Connectors 229; List of Acronyms and Abbreviations 233; List of Numerical Prefixes 237
About the Authors 239Index 241 |
| Record Nr. | UNINA-9910784136803321 |
|
Schaub Keith B.
|
||
| Norwood, Massachusetts : , : Artech House, , ©2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly
| Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly |
| Autore | Schaub Keith B. |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , ©2004 |
| Descrizione fisica | 1 online resource (271 p.) |
| Disciplina |
621.382
621.384 |
| Altri autori (Persone) | KellyJoe, Ph. D. |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Wireless communication systems - Equipment and supplies - Testing |
| ISBN | 1-58053-848-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Table of Contents vi; Preface xiii; Acknowledgments xvii; CHAPTER 1; An Introduction to Production Testing 1; CHAPTER 2; RF and SOC Devices 13; CHAPTER 3; Cost of Test 33; CHAPTER 4; Production Testing of RF Devices 49; CHAPTER 5; Production Testing of SOC Devices 95; CHAPTER 6; Fundamentals of Analog and Mixed-Signal Testing 145; CHAPTER 7; Moving Beyond Production Testing 175; CHAPTER 8; Production Noise Measurements 193; Appendix A: Power and Voltage Conversions 225; Appendix B: RF Coaxial Connectors 229; List of Acronyms and Abbreviations 233; List of Numerical Prefixes 237
About the Authors 239Index 241 |
| Record Nr. | UNINA-9910826636903321 |
|
Schaub Keith B.
|
||
| Norwood, Massachusetts : , : Artech House, , ©2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005
| Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 004.16 |
| Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9743-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142739703321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005
| Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 004.16 |
| Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9743-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996198862103316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
SoC physical design : a comprehensive guide / / Veena S. Chakravarthi and Shivananda R. Koteshwar
| SoC physical design : a comprehensive guide / / Veena S. Chakravarthi and Shivananda R. Koteshwar |
| Autore | Chakravarthi Veena S. |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer International Publishing, , [2022] |
| Descrizione fisica | 1 online resource (173 pages) |
| Disciplina | 004.16 |
| Soggetto topico |
Systems on a chip
Systems on a chip - Testing |
| ISBN | 3-030-98112-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910574861203321 |
|
Chakravarthi Veena S.
|
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| Cham, Switzerland : , : Springer International Publishing, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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