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IEEE Std 1500-2005 : IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / Institute of Electrical and Electronics Engineers
| IEEE Std 1500-2005 : IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, NY : , : IEEE, , 2005 |
| Descrizione fisica | 1 online resource (viii, 117 pages) : illustrations (some color) |
| Disciplina | 004.16 |
| Soggetto topico |
Embedded computer systems
Integrated circuits - Testing Systems on a chip |
| ISBN | 0-7381-4694-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 1500-2005 |
| Record Nr. | UNISA-996280731803316 |
| New York, NY : , : IEEE, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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IEEE Std 1500-2005 : IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / Institute of Electrical and Electronics Engineers
| IEEE Std 1500-2005 : IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, NY : , : IEEE, , 2005 |
| Descrizione fisica | 1 online resource (viii, 117 pages) : illustrations (some color) |
| Disciplina | 004.16 |
| Soggetto topico |
Embedded computer systems
Integrated circuits - Testing Systems on a chip |
| ISBN | 0-7381-4694-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 1500-2005 |
| Record Nr. | UNINA-9910135872503321 |
| New York, NY : , : IEEE, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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IEEE Std 1734-2011 : IEEE standard for quality of electronic and software intellectual property used in system and system on chip (SoC) designs / / Institute of Electrical and Electronics Engineers
| IEEE Std 1734-2011 : IEEE standard for quality of electronic and software intellectual property used in system and system on chip (SoC) designs / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2011 |
| Descrizione fisica | 1 online resource (viii, 31 pages) |
| Disciplina | 621.3815 |
| Soggetto topico | Systems on a chip |
| ISBN | 0-7381-6675-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1734-2011 - IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip
IEEE Std 1734-2011: IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs |
| Record Nr. | UNINA-9910135521203321 |
| New York, New York : , : IEEE, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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IEEE Std 1734-2011 : IEEE standard for quality of electronic and software intellectual property used in system and system on chip (SoC) designs / / Institute of Electrical and Electronics Engineers
| IEEE Std 1734-2011 : IEEE standard for quality of electronic and software intellectual property used in system and system on chip (SoC) designs / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2011 |
| Descrizione fisica | 1 online resource (viii, 31 pages) |
| Disciplina | 621.3815 |
| Soggetto topico | Systems on a chip |
| ISBN | 0-7381-6675-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1734-2011 - IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip
IEEE Std 1734-2011: IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs |
| Record Nr. | UNISA-996278295603316 |
| New York, New York : , : IEEE, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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IFIP VLSI-SoC 2006 : IFIP WG 10.5 International Conference on Very Large Scale Integration & System-on-Chip : Nice, France, October 16-18, 2006
| IFIP VLSI-SoC 2006 : IFIP WG 10.5 International Conference on Very Large Scale Integration & System-on-Chip : Nice, France, October 16-18, 2006 |
| Pubbl/distr/stampa | [Place of publication not identified], : TIMA Laboratory, 2007 |
| Soggetto topico |
Integrated circuits - Very large scale integration
Systems on a chip Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211402203316 |
| [Place of publication not identified], : TIMA Laboratory, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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International SoC Design Conference 2021 (ISOCC 2021) : proceedings of technical papers : October 6-9, 2021, Ramada Plaza Jeju Hotel, Jeju, Korea / / Institute of Electrical and Electronics Engineers
| International SoC Design Conference 2021 (ISOCC 2021) : proceedings of technical papers : October 6-9, 2021, Ramada Plaza Jeju Hotel, Jeju, Korea / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , [2021] |
| Descrizione fisica | 1 online resource (263 pages) : illustrations |
| Disciplina | 621.3815 |
| Soggetto topico | Systems on a chip |
| ISBN | 1-66540-174-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2021 18th International SoC Design Conference |
| Record Nr. | UNINA-9910554086903321 |
| Piscataway, NJ : , : IEEE, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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International SoC Design Conference 2021 (ISOCC 2021) : proceedings of technical papers : October 6-9, 2021, Ramada Plaza Jeju Hotel, Jeju, Korea / / Institute of Electrical and Electronics Engineers
| International SoC Design Conference 2021 (ISOCC 2021) : proceedings of technical papers : October 6-9, 2021, Ramada Plaza Jeju Hotel, Jeju, Korea / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , [2021] |
| Descrizione fisica | 1 online resource (263 pages) : illustrations |
| Disciplina | 621.3815 |
| Soggetto topico | Systems on a chip |
| ISBN | 1-66540-174-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2021 18th International SoC Design Conference |
| Record Nr. | UNISA-996577924703316 |
| Piscataway, NJ : , : IEEE, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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IWSOC 2004 : 4th IEEE International Workshop on System-on-Chip for Real-Time Applications : proceedings : 19-21 July, 2004, Banff, Alberta, Canada
| IWSOC 2004 : 4th IEEE International Workshop on System-on-Chip for Real-Time Applications : proceedings : 19-21 July, 2004, Banff, Alberta, Canada |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Disciplina | 621.3815 |
| Soggetto topico |
Application specific integrated circuits - Design and construction
Systems on a chip Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199769303316 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Machine learning support for fault diagnosis of system-on-chip / / edited by Patrick Girard, Shawn Blanton, and Li-C Wang
| Machine learning support for fault diagnosis of system-on-chip / / edited by Patrick Girard, Shawn Blanton, and Li-C Wang |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2023] |
| Descrizione fisica | 1 online resource (320 pages) |
| Disciplina | 006.31 |
| Soggetto topico |
Electric fault location
Machine learning Systems on a chip |
| ISBN | 3-031-19639-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Prerequisites on Fault Diagnosis -- Conventional Methods for Fault Diagnosis -- Machine Learning and Its Applications in Test -- Machine Learning Support for Logic Diagnosis -- Machine Learning Support for Cell-Aware Diagnosis -- Machine Learning Support for Volume Diagnosis -- Machine Learning Support for Diagnosis of Analog Circuits -- Machine Learning Support for Board-level Functional Fault Diagnosis -- Machine Learning Support for Wafer-level Failure Cluster Identification -- Conclusion. |
| Record Nr. | UNINA-9910682590803321 |
| Cham, Switzerland : , : Springer, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Micro, nanosystems, and systems on chips [[electronic resource]] : modeling, control, and estimation / / edited by Alina Voda
| Micro, nanosystems, and systems on chips [[electronic resource]] : modeling, control, and estimation / / edited by Alina Voda |
| Pubbl/distr/stampa | London, : ISTE |
| Descrizione fisica | 1 online resource (330 p.) |
| Disciplina | 621.381 |
| Altri autori (Persone) | VodaAlina |
| Collana | ISTE |
| Soggetto topico |
Microelectromechanical systems
Systems on a chip |
| ISBN |
1-118-55781-6
1-299-31845-2 1-118-62267-7 1-61344-555-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Title Page; Copyright Page; Table of Contents; Introduction; PART I. MINI AND MICROSYSTEMS; Chapter 1. Modeling and Control of Stick-slip Micropositioning Devices; 1.1. Introduction; 1.2. General description of stick-slip micropositioning devices; 1.2.1. Principle; 1.2.2. Experimental device; 1.3. Model of the sub-step mode; 1.3.1. Assumptions; 1.3.2. Microactuator equation; 1.3.3. The elastoplastic friction model; 1.3.4. The state equation; 1.3.5. The output equation; 1.3.6. Experimental and simulation curves; 1.4. PI control of the sub-step mode; 1.5. Modeling the coarse mode
1.5.1. The model1.5.2. Experimental results; 1.5.3. Remarks; 1.6. Voltage/frequency (U/f) proportional control of the coarse mode; 1.6.1. Principle scheme of the proposed controller; 1.6.2. Analysis; 1.6.3. Stability analysis; 1.6.4. Experiments; 1.7. Conclusion; 1.8. Bibliography; Chapter 2. Microbeam Dynamic Shaping by Closed-loop Electrostatic Actuation using Modal Control; 2.1. Introduction; 2.2. System description; 2.3. Modal analysis; 2.4. Mode-based control; 2.4.1. PID control; 2.4.2. FSF-LTR control; 2.5. Conclusion; 2.6. Bibliography; PART II. NANOSYSTEMS AND NANOWORLD Chapter 3. Observer-based Estimation of Weak Forces in a Nanosystem Measurement Device 3.1. Introduction; 3.2. Observer approach in an AFM measurement set-up; 3.2.1. Considered AFM model and force measurement problem; 3.2.2. Proposed observer approach; 3.2.3. Experimental application and validation; 3.3. Extension to back action evasion; 3.3.1. Back action problem and illustration; 3.3.2. Observer-based approach; 3.3.3. Simulation results and comments; 3.4. Conclusion; 3.5. Acknowledgements; 3.6. Bibliography Chapter 4. Tunnel Current for a Robust, High-bandwidth and Ultraprecise Nanopositioning 4.1. Introduction; 4.2. System description; 4.2.1. Forces between the tip and the beam; 4.3. System modeling; 4.3.1. Cantilever model; 4.3.2. System actuators; 4.3.3. Tunnel current; 4.3.4. System model; 4.3.5. System analysis; 4.4. Problem statement; 4.4.1. Robustness and non-linearities; 4.4.2. Experimental noise; 4.5. Tools to deal with noise; 4.5.1. Kalman filter; 4.5.2. Minimum variance controller; 4.6. Closed-loop requirements; 4.6.1. Sensitivity functions; 4.6.2. Robustness margins 4.6.3. Templates of the sensibility functions 4.7. Control strategy; 4.7.1. Actuator linearization; 4.7.2. Sensor approximation; 4.7.3. Kalman filtering; 4.7.4. RST1 synthesis; 4.7.5. z reconstruction; 4.7.6. RST2 synthesis; 4.8. Results; 4.8.1. Position control; 4.8.2. Distance d control; 4.8.3. Robustness; 4.9. Conclusion; 4.10. Bibliography; Chapter 5. Controller Design and Analysis for High-performance STM; 5.1. Introduction; 5.2. General description of STM; 5.2.1. STM operation modes; 5.2.2. Principle; 5.3. Control design model; 5.3.1. Linear approximation approach 5.3.2. Open-loop analysis |
| Record Nr. | UNINA-9910138300703321 |
| London, : ISTE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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