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Surface characteristics of etched and non-etched silicon germanium (SiGe)/Si graded structure with varying Ge concentration grown by ultra-high vacuum (UHV)/chemical vapor deposition (CVD) for optoelectronic and power conversion applications / / Fred Semendy [and three others]
Surface characteristics of etched and non-etched silicon germanium (SiGe)/Si graded structure with varying Ge concentration grown by ultra-high vacuum (UHV)/chemical vapor deposition (CVD) for optoelectronic and power conversion applications / / Fred Semendy [and three others]
Autore Semendy Fred
Pubbl/distr/stampa Adelphi, MD : , : Army Research Laboratory, , 2012
Descrizione fisica 1 online resource (vi, 16 pages) : color illustrations
Collana ARL-TR
Soggetto topico Surfaces (Technology) - Analysis
Chemical vapor deposition
Optoelectronic devices
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Surface characteristics of etched and non-etched silicon germanium
Record Nr. UNINA-9910702307603321
Semendy Fred  
Adelphi, MD : , : Army Research Laboratory, , 2012
Materiale a stampa
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Surface characterization [[electronic resource] ] : a user's sourcebook / / edited by D. Brune ... [et al.]
Surface characterization [[electronic resource] ] : a user's sourcebook / / edited by D. Brune ... [et al.]
Pubbl/distr/stampa [Oslo], : Scandinavian Science Publisher
Descrizione fisica 1 online resource (716 p.)
Disciplina 541.33
Altri autori (Persone) BruneDag <1931->
Soggetto topico Surfaces (Technology) - Analysis
Chemistry, Analytic
ISBN 1-281-76393-4
9786611763930
3-527-61245-9
3-527-61244-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 31. Optical second-harmonic and sum-frequency generation32. Electrical and magnetic properties of thin films; 33. Measurement and properties of thin films; Part 6: Surface reactions; 34. Adhesion and surface energy; 35. Surface reactivity; 36. Emanation thermal analysis; 37. Electrochemical methods; 38. Corrosion measurements by use of thin-layer activation; 39. Nuclear-based corrosion monitoring; Part 7: Tribology; 40. Tribosurface properties; 41. Wear measurements using thin-layer activation; Part 8: Life sciences; 42. Biomaterials; 43. Biological nuclear microscopy; Index
Record Nr. UNINA-9910143968003321
[Oslo], : Scandinavian Science Publisher
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Surface characterization : a user's sourcebook [e-book] / edited by D. Brune ... [et al.]
Surface characterization : a user's sourcebook [e-book] / edited by D. Brune ... [et al.]
Pubbl/distr/stampa [Oslo] : Scandinavian Science Publisher
Descrizione fisica 1 online resource (xiii, 702 p.) : illustrations
Altri autori (Persone) Brune, D.
Hellborg, R.
Whitlow, H.J.
Hunderi, O.
Soggetto topico Surfaces (Technology) - Analysis
ISBN 9783527612451
Formato Software
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991003939309707536
[Oslo] : Scandinavian Science Publisher
Software
Lo trovi qui: Univ. del Salento
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Surface characterization [[electronic resource] ] : a user's sourcebook / / edited by D. Brune ... [et al.]
Surface characterization [[electronic resource] ] : a user's sourcebook / / edited by D. Brune ... [et al.]
Pubbl/distr/stampa [Oslo], : Scandinavian Science Publisher
Descrizione fisica 1 online resource (716 p.)
Disciplina 541.33
Altri autori (Persone) BruneDag <1931->
Soggetto topico Surfaces (Technology) - Analysis
Chemistry, Analytic
ISBN 1-281-76393-4
9786611763930
3-527-61245-9
3-527-61244-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 31. Optical second-harmonic and sum-frequency generation32. Electrical and magnetic properties of thin films; 33. Measurement and properties of thin films; Part 6: Surface reactions; 34. Adhesion and surface energy; 35. Surface reactivity; 36. Emanation thermal analysis; 37. Electrochemical methods; 38. Corrosion measurements by use of thin-layer activation; 39. Nuclear-based corrosion monitoring; Part 7: Tribology; 40. Tribosurface properties; 41. Wear measurements using thin-layer activation; Part 8: Life sciences; 42. Biomaterials; 43. Biological nuclear microscopy; Index
Record Nr. UNINA-9910830618103321
[Oslo], : Scandinavian Science Publisher
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Surface characterization : a user's sourcebook / / edited by D. Brune ... [et al.]
Surface characterization : a user's sourcebook / / edited by D. Brune ... [et al.]
Pubbl/distr/stampa [Oslo], : Scandinavian Science Publisher
Descrizione fisica 1 online resource (716 p.)
Disciplina 541.33
Altri autori (Persone) BruneDag <1931->
Soggetto topico Surfaces (Technology) - Analysis
Chemistry, Analytic
ISBN 1-281-76393-4
9786611763930
3-527-61245-9
3-527-61244-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 31. Optical second-harmonic and sum-frequency generation32. Electrical and magnetic properties of thin films; 33. Measurement and properties of thin films; Part 6: Surface reactions; 34. Adhesion and surface energy; 35. Surface reactivity; 36. Emanation thermal analysis; 37. Electrochemical methods; 38. Corrosion measurements by use of thin-layer activation; 39. Nuclear-based corrosion monitoring; Part 7: Tribology; 40. Tribosurface properties; 41. Wear measurements using thin-layer activation; Part 8: Life sciences; 42. Biomaterials; 43. Biological nuclear microscopy; Index
Record Nr. UNINA-9910877432903321
[Oslo], : Scandinavian Science Publisher
Materiale a stampa
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Surface science techniques / / Gianangelo Bracco, Bodil Holst, editors
Surface science techniques / / Gianangelo Bracco, Bodil Holst, editors
Edizione [1st ed. 2013.]
Pubbl/distr/stampa Berlin ; ; New York, : Springer, c2013
Descrizione fisica 1 online resource (666 p.)
Disciplina 541.3
Altri autori (Persone) BraccoGianangelo
HolstBodil
Collana Springer series in surface sciences
Soggetto topico Surfaces (Technology)
Surfaces (Technology) - Analysis
Surfaces (Physics)
ISBN 1-299-19777-9
3-642-34243-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Macroscopic Techniques -- Optical Techniques -- X-ray Techniques -- Neutral Particle Techniques -- Charged Particle Techniques -- Scanning Probe Techniques.
Record Nr. UNINA-9910437822803321
Berlin ; ; New York, : Springer, c2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Three-dimensional surface topography [e-book] / K.J. Stout and L. Blunt ; contributors, W.P. Dong ... [et al.]
Three-dimensional surface topography [e-book] / K.J. Stout and L. Blunt ; contributors, W.P. Dong ... [et al.]
Edizione [2nd ed.]
Pubbl/distr/stampa London : Penton Press, c2000
Descrizione fisica xxii, 285 p. : ill. ; 25 cm
Disciplina 620.440287
Altri autori (Persone) Stout, K. J.
Blunt, Liamauthor
Soggetto topico Surfaces (Technology) - Analysis
Three-dimensional display systems
Soggetto genere / forma Electronic books.
ISBN 9781857180268
1857180267
Formato Risorse elettroniche
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Part I: Development of Surface Characterization -- 1. History of the subject 2. Development of surface parameters 3. Progress in filtering 4. Instrumentation 5. Development of integrated 3-D parameter set 6. Future Developments 7. Contents of the proposed standard. Part II: Instruments and Measurement Techniques of Three-dimensional Surface Topography -- 1. Introduction 2. Differences in measurement and analysis methods for 3-D and 3-D surface topography 3. Stylus instruments 4. Optical instruments 5. Non-optical scanning microscopy 6. Characteristics of the different types of available instruments 7. Conclusions. Part III: Filtering Technology for Three-Dimensional Surface Topography Analysis. 1. Nomenclature 2. Introduction 3. History of surface data filters 4. 3-D general filtering techniques 5. Robust filters 6. The problems of frequency domain filters 7. Wavelet digital filters 8. Motif filters 9. Conclusion. Part IV: Visualization Techniques and Parameters for Characterizing Three-Dimensional Surface Topography 1. Nomenclature 2. Introduction 3. Surface topography in three dimensions 4.Visualization techniques 5. Specification of parameters 6. A primary parameter set amplitude, height distribution, spatial, hybrid and functional. Part V: Applications of Three-Dimensional Surface Metrology 1. Introduction 2. Measurement of a gear surface with a stylus lead screw-driven instrument 3. Measurement of an engine bore surface with a stylus linear motor-driven instrument 4. Measurement of thick-film superconductors with a focus detection instrument 5. Measurement of human skin with a focus detection instrument 6. Measurement of the topography of hip prostheses using phase shifting interferometer 7. Measurement of a polished brass surface using a scanning tunnelling microscope 8. Characterization of surface topography of indentations 9. Conclusions. Part VI: Engineered Surfaces - A Philosophy of Manufacture 1. A philosophy of manufacture 2. The complex interrelationships in producing an engineered surface 3. Surface topographical features and their effect on the functional performance of surfaces 4. Surface mechanical features that can effect the functional performance of surfaces (surface integrity) 5. Subsurface features that can effect the functional performance of surfaces 6. Some examples of engineered surfaces 7. Future approach to the engineered surface 8. An example of a comprehensive testing procedure 9. FE simulations 10. Final comments
Record Nr. UNISALENTO-991003242619707536
London : Penton Press, c2000
Risorse elettroniche
Lo trovi qui: Univ. del Salento
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X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
Pubbl/distr/stampa Weinheim ; ; New York, : Wiley-VCH, 1999
Descrizione fisica 1 online resource (280 p.)
Disciplina 620.11272
778.33
Altri autori (Persone) LifshinEric
Soggetto topico X-ray spectroscopy
Materials - Analysis
Surfaces (Technology) - Analysis
X-rays - Industrial applications
Soggetto genere / forma Electronic books.
ISBN 1-281-76425-6
9786611764258
3-527-61374-9
3-527-61375-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index
Record Nr. UNINA-9910144722403321
Weinheim ; ; New York, : Wiley-VCH, 1999
Materiale a stampa
Lo trovi qui: Univ. Federico II
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X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
Pubbl/distr/stampa Weinheim ; ; New York, : Wiley-VCH, 1999
Descrizione fisica 1 online resource (280 p.)
Disciplina 620.11272
778.33
Altri autori (Persone) LifshinEric
Soggetto topico X-ray spectroscopy
Materials - Analysis
Surfaces (Technology) - Analysis
X-rays - Industrial applications
ISBN 1-281-76425-6
9786611764258
3-527-61374-9
3-527-61375-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index
Record Nr. UNINA-9910831178403321
Weinheim ; ; New York, : Wiley-VCH, 1999
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
X-ray characterization of materials / / Eric Lifshin (ed.)
X-ray characterization of materials / / Eric Lifshin (ed.)
Pubbl/distr/stampa Weinheim ; ; New York, : Wiley-VCH, 1999
Descrizione fisica 1 online resource (280 p.)
Disciplina 620.11272
778.33
Altri autori (Persone) LifshinEric
Soggetto topico X-ray spectroscopy
Materials - Analysis
Surfaces (Technology) - Analysis
X-rays - Industrial applications
ISBN 1-281-76425-6
9786611764258
3-527-61374-9
3-527-61375-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index
Record Nr. UNINA-9910877986703321
Weinheim ; ; New York, : Wiley-VCH, 1999
Materiale a stampa
Lo trovi qui: Univ. Federico II
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