Surface characteristics of etched and non-etched silicon germanium (SiGe)/Si graded structure with varying Ge concentration grown by ultra-high vacuum (UHV)/chemical vapor deposition (CVD) for optoelectronic and power conversion applications / / Fred Semendy [and three others] |
Autore | Semendy Fred |
Pubbl/distr/stampa | Adelphi, MD : , : Army Research Laboratory, , 2012 |
Descrizione fisica | 1 online resource (vi, 16 pages) : color illustrations |
Collana | ARL-TR |
Soggetto topico |
Surfaces (Technology) - Analysis
Chemical vapor deposition Optoelectronic devices |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Surface characteristics of etched and non-etched silicon germanium |
Record Nr. | UNINA-9910702307603321 |
Semendy Fred
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Adelphi, MD : , : Army Research Laboratory, , 2012 | ||
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Lo trovi qui: Univ. Federico II | ||
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Surface characterization [[electronic resource] ] : a user's sourcebook / / edited by D. Brune ... [et al.] |
Pubbl/distr/stampa | [Oslo], : Scandinavian Science Publisher |
Descrizione fisica | 1 online resource (716 p.) |
Disciplina | 541.33 |
Altri autori (Persone) | BruneDag <1931-> |
Soggetto topico |
Surfaces (Technology) - Analysis
Chemistry, Analytic |
ISBN |
1-281-76393-4
9786611763930 3-527-61245-9 3-527-61244-0 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 31. Optical second-harmonic and sum-frequency generation32. Electrical and magnetic properties of thin films; 33. Measurement and properties of thin films; Part 6: Surface reactions; 34. Adhesion and surface energy; 35. Surface reactivity; 36. Emanation thermal analysis; 37. Electrochemical methods; 38. Corrosion measurements by use of thin-layer activation; 39. Nuclear-based corrosion monitoring; Part 7: Tribology; 40. Tribosurface properties; 41. Wear measurements using thin-layer activation; Part 8: Life sciences; 42. Biomaterials; 43. Biological nuclear microscopy; Index |
Record Nr. | UNINA-9910143968003321 |
[Oslo], : Scandinavian Science Publisher | ||
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Lo trovi qui: Univ. Federico II | ||
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Surface characterization : a user's sourcebook [e-book] / edited by D. Brune ... [et al.] |
Pubbl/distr/stampa | [Oslo] : Scandinavian Science Publisher |
Descrizione fisica | 1 online resource (xiii, 702 p.) : illustrations |
Altri autori (Persone) |
Brune, D.
Hellborg, R. Whitlow, H.J. Hunderi, O. |
Soggetto topico | Surfaces (Technology) - Analysis |
ISBN | 9783527612451 |
Formato | Software ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISALENTO-991003939309707536 |
[Oslo] : Scandinavian Science Publisher | ||
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Lo trovi qui: Univ. del Salento | ||
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Surface characterization [[electronic resource] ] : a user's sourcebook / / edited by D. Brune ... [et al.] |
Pubbl/distr/stampa | [Oslo], : Scandinavian Science Publisher |
Descrizione fisica | 1 online resource (716 p.) |
Disciplina | 541.33 |
Altri autori (Persone) | BruneDag <1931-> |
Soggetto topico |
Surfaces (Technology) - Analysis
Chemistry, Analytic |
ISBN |
1-281-76393-4
9786611763930 3-527-61245-9 3-527-61244-0 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 31. Optical second-harmonic and sum-frequency generation32. Electrical and magnetic properties of thin films; 33. Measurement and properties of thin films; Part 6: Surface reactions; 34. Adhesion and surface energy; 35. Surface reactivity; 36. Emanation thermal analysis; 37. Electrochemical methods; 38. Corrosion measurements by use of thin-layer activation; 39. Nuclear-based corrosion monitoring; Part 7: Tribology; 40. Tribosurface properties; 41. Wear measurements using thin-layer activation; Part 8: Life sciences; 42. Biomaterials; 43. Biological nuclear microscopy; Index |
Record Nr. | UNINA-9910830618103321 |
[Oslo], : Scandinavian Science Publisher | ||
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Lo trovi qui: Univ. Federico II | ||
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Surface characterization : a user's sourcebook / / edited by D. Brune ... [et al.] |
Pubbl/distr/stampa | [Oslo], : Scandinavian Science Publisher |
Descrizione fisica | 1 online resource (716 p.) |
Disciplina | 541.33 |
Altri autori (Persone) | BruneDag <1931-> |
Soggetto topico |
Surfaces (Technology) - Analysis
Chemistry, Analytic |
ISBN |
1-281-76393-4
9786611763930 3-527-61245-9 3-527-61244-0 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 31. Optical second-harmonic and sum-frequency generation32. Electrical and magnetic properties of thin films; 33. Measurement and properties of thin films; Part 6: Surface reactions; 34. Adhesion and surface energy; 35. Surface reactivity; 36. Emanation thermal analysis; 37. Electrochemical methods; 38. Corrosion measurements by use of thin-layer activation; 39. Nuclear-based corrosion monitoring; Part 7: Tribology; 40. Tribosurface properties; 41. Wear measurements using thin-layer activation; Part 8: Life sciences; 42. Biomaterials; 43. Biological nuclear microscopy; Index |
Record Nr. | UNINA-9910877432903321 |
[Oslo], : Scandinavian Science Publisher | ||
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Lo trovi qui: Univ. Federico II | ||
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Surface science techniques / / Gianangelo Bracco, Bodil Holst, editors |
Edizione | [1st ed. 2013.] |
Pubbl/distr/stampa | Berlin ; ; New York, : Springer, c2013 |
Descrizione fisica | 1 online resource (666 p.) |
Disciplina | 541.3 |
Altri autori (Persone) |
BraccoGianangelo
HolstBodil |
Collana | Springer series in surface sciences |
Soggetto topico |
Surfaces (Technology)
Surfaces (Technology) - Analysis Surfaces (Physics) |
ISBN |
1-299-19777-9
3-642-34243-4 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Macroscopic Techniques -- Optical Techniques -- X-ray Techniques -- Neutral Particle Techniques -- Charged Particle Techniques -- Scanning Probe Techniques. |
Record Nr. | UNINA-9910437822803321 |
Berlin ; ; New York, : Springer, c2013 | ||
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Lo trovi qui: Univ. Federico II | ||
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Three-dimensional surface topography [e-book] / K.J. Stout and L. Blunt ; contributors, W.P. Dong ... [et al.] |
Edizione | [2nd ed.] |
Pubbl/distr/stampa | London : Penton Press, c2000 |
Descrizione fisica | xxii, 285 p. : ill. ; 25 cm |
Disciplina | 620.440287 |
Altri autori (Persone) |
Stout, K. J.
Blunt, Liamauthor |
Soggetto topico |
Surfaces (Technology) - Analysis
Three-dimensional display systems |
Soggetto genere / forma | Electronic books. |
ISBN |
9781857180268
1857180267 |
Formato | Risorse elettroniche ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Part I: Development of Surface Characterization -- 1. History of the subject 2. Development of surface parameters 3. Progress in filtering 4. Instrumentation 5. Development of integrated 3-D parameter set 6. Future Developments 7. Contents of the proposed standard. Part II: Instruments and Measurement Techniques of Three-dimensional Surface Topography -- 1. Introduction 2. Differences in measurement and analysis methods for 3-D and 3-D surface topography 3. Stylus instruments 4. Optical instruments 5. Non-optical scanning microscopy 6. Characteristics of the different types of available instruments 7. Conclusions. Part III: Filtering Technology for Three-Dimensional Surface Topography Analysis. 1. Nomenclature 2. Introduction 3. History of surface data filters 4. 3-D general filtering techniques 5. Robust filters 6. The problems of frequency domain filters 7. Wavelet digital filters 8. Motif filters 9. Conclusion. Part IV: Visualization Techniques and Parameters for Characterizing Three-Dimensional Surface Topography 1. Nomenclature 2. Introduction 3. Surface topography in three dimensions 4.Visualization techniques 5. Specification of parameters 6. A primary parameter set amplitude, height distribution, spatial, hybrid and functional. Part V: Applications of Three-Dimensional Surface Metrology 1. Introduction 2. Measurement of a gear surface with a stylus lead screw-driven instrument 3. Measurement of an engine bore surface with a stylus linear motor-driven instrument 4. Measurement of thick-film superconductors with a focus detection instrument 5. Measurement of human skin with a focus detection instrument 6. Measurement of the topography of hip prostheses using phase shifting interferometer 7. Measurement of a polished brass surface using a scanning tunnelling microscope 8. Characterization of surface topography of indentations 9. Conclusions. Part VI: Engineered Surfaces - A Philosophy of Manufacture 1. A philosophy of manufacture 2. The complex interrelationships in producing an engineered surface 3. Surface topographical features and their effect on the functional performance of surfaces 4. Surface mechanical features that can effect the functional performance of surfaces (surface integrity) 5. Subsurface features that can effect the functional performance of surfaces 6. Some examples of engineered surfaces 7. Future approach to the engineered surface 8. An example of a comprehensive testing procedure 9. FE simulations 10. Final comments |
Record Nr. | UNISALENTO-991003242619707536 |
London : Penton Press, c2000 | ||
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Lo trovi qui: Univ. del Salento | ||
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X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.) |
Pubbl/distr/stampa | Weinheim ; ; New York, : Wiley-VCH, 1999 |
Descrizione fisica | 1 online resource (280 p.) |
Disciplina |
620.11272
778.33 |
Altri autori (Persone) | LifshinEric |
Soggetto topico |
X-ray spectroscopy
Materials - Analysis Surfaces (Technology) - Analysis X-rays - Industrial applications |
Soggetto genere / forma | Electronic books. |
ISBN |
1-281-76425-6
9786611764258 3-527-61374-9 3-527-61375-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index |
Record Nr. | UNINA-9910144722403321 |
Weinheim ; ; New York, : Wiley-VCH, 1999 | ||
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Lo trovi qui: Univ. Federico II | ||
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X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.) |
Pubbl/distr/stampa | Weinheim ; ; New York, : Wiley-VCH, 1999 |
Descrizione fisica | 1 online resource (280 p.) |
Disciplina |
620.11272
778.33 |
Altri autori (Persone) | LifshinEric |
Soggetto topico |
X-ray spectroscopy
Materials - Analysis Surfaces (Technology) - Analysis X-rays - Industrial applications |
ISBN |
1-281-76425-6
9786611764258 3-527-61374-9 3-527-61375-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index |
Record Nr. | UNINA-9910831178403321 |
Weinheim ; ; New York, : Wiley-VCH, 1999 | ||
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Lo trovi qui: Univ. Federico II | ||
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X-ray characterization of materials / / Eric Lifshin (ed.) |
Pubbl/distr/stampa | Weinheim ; ; New York, : Wiley-VCH, 1999 |
Descrizione fisica | 1 online resource (280 p.) |
Disciplina |
620.11272
778.33 |
Altri autori (Persone) | LifshinEric |
Soggetto topico |
X-ray spectroscopy
Materials - Analysis Surfaces (Technology) - Analysis X-rays - Industrial applications |
ISBN |
1-281-76425-6
9786611764258 3-527-61374-9 3-527-61375-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index |
Record Nr. | UNINA-9910877986703321 |
Weinheim ; ; New York, : Wiley-VCH, 1999 | ||
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Lo trovi qui: Univ. Federico II | ||
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