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Surface analysis with STM and AFM [[electronic resource] ] : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo
| Surface analysis with STM and AFM [[electronic resource] ] : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo |
| Autore | Magonov Sergei N |
| Pubbl/distr/stampa | Weinheim [Germany] ; ; New York, : VCH, 2008 |
| Descrizione fisica | 1 online resource (338 p.) |
| Disciplina |
502.82
541.37 |
| Soggetto topico |
Surfaces (Technology) - Analysis
Scanning tunneling microscopy Atomic force microscopy |
| ISBN |
1-281-84271-0
9786611842710 3-527-61511-3 3-527-61510-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Surface Analysis with STM and AFM; Preface; Contents; 1 Introduction; 1.1 Development of Scanning Probe Microscopy; 1.2 Key Problems of STM and AFM Applications; 1.2.1 Image Interpretation; 1.2.2 Tip-Sample Interactions; 1.2.3 Surface Relaxation and Local Hardness; 1.2.4 Surface Forces and AFM; 1.3 Objectives; References; 2 Physical Phenomena Relevant to STM and AFM; 2.1 Electron Transport Processes; 2.1.1 Conventional Electron Tunneling Regime; 2.1.2 Electronic and Mechanical Contact Regimes; 2.1.3 STM in Different Environments; 2.2 Survey of Force Interactions
2.2.1 Force-vs.-Distance Curves2.2.2 Short-Range Forces and Sample Deformation; 2.2.3 Long-Range and Other Forces; 2.2.3.1 Long-Range Forces; 2.2.3.2 Adhesion and Capillary Forces; References; 3 Scanning Probe Microscopes; 3.1 Operating Principles and Main Components; 3.1.1 Scanner; 3.1.2 Tip-Sample Approach and Electronic Feedback; 3.1.3 Scanning Modes and Parameters; 3.1.4 Images and Filtering; 3.1.5 Isolation of Vibrational Noise; 3.2 Scanning Tunneling Microscope; 3.2.1 STM Tips and Current Detection; 3.2.2 Bias Voltage; 3.2.3 Scanning Tunneling Spectroscopy; 3.3 Atomic Force Microscope 3.3.1 Contact Mode and Force Detection3.3.2 AFM Probes; 3.3.3 Dynamic AFM Measurements; 3.3.3.1 AFM Operation in the Attractive Force Regime; 3.3.3.2 Tapping Mode; 3.3.3.3 Force-Modulation Techniques; 3.3.3.4 Magnetic Force Microscopy; 3.4 STM and AFM as Metrology Tools; 3.4.1 Resolution in STM and AFM; 3.4.2 Metrological Applications; References; 4 Practical Aspects of STM and AFM Measurements; 4.1 Samples; 4.2 Optimization of Experiments; 4.2.1 Optimization of STM Experiments; 4.2.2 Optimization of Contact-Mode AFM Experiments; 4.2.3 Optimization of Tapping-Mode AFM Experiments 4.3 STM and AFM Measurements4.3.1 Large-Scale Imaging; 4.3.2 Atomic-Scale Imaging; 4.3.3 Image Artifacts; References; 5 Simulations of STM and AFM Images; 5.1 Electronic Structures of Solids; 5.2 Theoretical Aspects of STM; 5.2.1 Tunneling Between Metals; 5.2.2 Tunneling Between Metal and Semiconductor; 5.2.3 Tersoff-Hamman Theory and its Extension; 5.2.4 Other Theories; 5.3 Theoretical Aspects of AFM; 5.4 Image Simulation by Density Plot Calculations; 5.4.1 STM Image Simulation; 5.4.2 AFM Image Simulation; 5.4.3 STM and AFM Images of Graphite; References 7.3 Cases Tractable by Electronic Band Structure Calculations |
| Record Nr. | UNINA-9910144719503321 |
Magonov Sergei N
|
||
| Weinheim [Germany] ; ; New York, : VCH, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo
| Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo |
| Autore | Magonov Sergei N |
| Pubbl/distr/stampa | Weinheim [Germany] ; ; New York, : VCH, 2008 |
| Descrizione fisica | 1 online resource (338 p.) |
| Disciplina |
502.82
541.37 |
| Soggetto topico |
Surfaces (Technology) - Analysis
Scanning tunneling microscopy Atomic force microscopy |
| ISBN |
1-281-84271-0
9783527615117 9786611842710 3-527-61511-3 3-527-61510-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Surface Analysis with STM and AFM; Preface; Contents; 1 Introduction; 1.1 Development of Scanning Probe Microscopy; 1.2 Key Problems of STM and AFM Applications; 1.2.1 Image Interpretation; 1.2.2 Tip-Sample Interactions; 1.2.3 Surface Relaxation and Local Hardness; 1.2.4 Surface Forces and AFM; 1.3 Objectives; References; 2 Physical Phenomena Relevant to STM and AFM; 2.1 Electron Transport Processes; 2.1.1 Conventional Electron Tunneling Regime; 2.1.2 Electronic and Mechanical Contact Regimes; 2.1.3 STM in Different Environments; 2.2 Survey of Force Interactions
2.2.1 Force-vs.-Distance Curves2.2.2 Short-Range Forces and Sample Deformation; 2.2.3 Long-Range and Other Forces; 2.2.3.1 Long-Range Forces; 2.2.3.2 Adhesion and Capillary Forces; References; 3 Scanning Probe Microscopes; 3.1 Operating Principles and Main Components; 3.1.1 Scanner; 3.1.2 Tip-Sample Approach and Electronic Feedback; 3.1.3 Scanning Modes and Parameters; 3.1.4 Images and Filtering; 3.1.5 Isolation of Vibrational Noise; 3.2 Scanning Tunneling Microscope; 3.2.1 STM Tips and Current Detection; 3.2.2 Bias Voltage; 3.2.3 Scanning Tunneling Spectroscopy; 3.3 Atomic Force Microscope 3.3.1 Contact Mode and Force Detection3.3.2 AFM Probes; 3.3.3 Dynamic AFM Measurements; 3.3.3.1 AFM Operation in the Attractive Force Regime; 3.3.3.2 Tapping Mode; 3.3.3.3 Force-Modulation Techniques; 3.3.3.4 Magnetic Force Microscopy; 3.4 STM and AFM as Metrology Tools; 3.4.1 Resolution in STM and AFM; 3.4.2 Metrological Applications; References; 4 Practical Aspects of STM and AFM Measurements; 4.1 Samples; 4.2 Optimization of Experiments; 4.2.1 Optimization of STM Experiments; 4.2.2 Optimization of Contact-Mode AFM Experiments; 4.2.3 Optimization of Tapping-Mode AFM Experiments 4.3 STM and AFM Measurements4.3.1 Large-Scale Imaging; 4.3.2 Atomic-Scale Imaging; 4.3.3 Image Artifacts; References; 5 Simulations of STM and AFM Images; 5.1 Electronic Structures of Solids; 5.2 Theoretical Aspects of STM; 5.2.1 Tunneling Between Metals; 5.2.2 Tunneling Between Metal and Semiconductor; 5.2.3 Tersoff-Hamman Theory and its Extension; 5.2.4 Other Theories; 5.3 Theoretical Aspects of AFM; 5.4 Image Simulation by Density Plot Calculations; 5.4.1 STM Image Simulation; 5.4.2 AFM Image Simulation; 5.4.3 STM and AFM Images of Graphite; References 7.3 Cases Tractable by Electronic Band Structure Calculations |
| Record Nr. | UNINA-9910877715303321 |
|
Magonov Sergei N
|
||
| Weinheim [Germany] ; ; New York, : VCH, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface analysis with STM and AFM [[electronic resource] ] : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo
| Surface analysis with STM and AFM [[electronic resource] ] : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo |
| Autore | Magonov Sergei N |
| Pubbl/distr/stampa | Weinheim [Germany] ; ; New York, : VCH, 1996 |
| Descrizione fisica | 1 online resource (338 p.) |
| Disciplina |
502.82
541.37 |
| Soggetto topico |
Surfaces (Technology) - Analysis
Scanning tunneling microscopy Atomic force microscopy |
| ISBN |
1-281-84271-0
9783527615117 9786611842710 3-527-61511-3 3-527-61510-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Surface Analysis with STM and AFM; Preface; Contents; 1 Introduction; 1.1 Development of Scanning Probe Microscopy; 1.2 Key Problems of STM and AFM Applications; 1.2.1 Image Interpretation; 1.2.2 Tip-Sample Interactions; 1.2.3 Surface Relaxation and Local Hardness; 1.2.4 Surface Forces and AFM; 1.3 Objectives; References; 2 Physical Phenomena Relevant to STM and AFM; 2.1 Electron Transport Processes; 2.1.1 Conventional Electron Tunneling Regime; 2.1.2 Electronic and Mechanical Contact Regimes; 2.1.3 STM in Different Environments; 2.2 Survey of Force Interactions
2.2.1 Force-vs.-Distance Curves2.2.2 Short-Range Forces and Sample Deformation; 2.2.3 Long-Range and Other Forces; 2.2.3.1 Long-Range Forces; 2.2.3.2 Adhesion and Capillary Forces; References; 3 Scanning Probe Microscopes; 3.1 Operating Principles and Main Components; 3.1.1 Scanner; 3.1.2 Tip-Sample Approach and Electronic Feedback; 3.1.3 Scanning Modes and Parameters; 3.1.4 Images and Filtering; 3.1.5 Isolation of Vibrational Noise; 3.2 Scanning Tunneling Microscope; 3.2.1 STM Tips and Current Detection; 3.2.2 Bias Voltage; 3.2.3 Scanning Tunneling Spectroscopy; 3.3 Atomic Force Microscope 3.3.1 Contact Mode and Force Detection3.3.2 AFM Probes; 3.3.3 Dynamic AFM Measurements; 3.3.3.1 AFM Operation in the Attractive Force Regime; 3.3.3.2 Tapping Mode; 3.3.3.3 Force-Modulation Techniques; 3.3.3.4 Magnetic Force Microscopy; 3.4 STM and AFM as Metrology Tools; 3.4.1 Resolution in STM and AFM; 3.4.2 Metrological Applications; References; 4 Practical Aspects of STM and AFM Measurements; 4.1 Samples; 4.2 Optimization of Experiments; 4.2.1 Optimization of STM Experiments; 4.2.2 Optimization of Contact-Mode AFM Experiments; 4.2.3 Optimization of Tapping-Mode AFM Experiments 4.3 STM and AFM Measurements4.3.1 Large-Scale Imaging; 4.3.2 Atomic-Scale Imaging; 4.3.3 Image Artifacts; References; 5 Simulations of STM and AFM Images; 5.1 Electronic Structures of Solids; 5.2 Theoretical Aspects of STM; 5.2.1 Tunneling Between Metals; 5.2.2 Tunneling Between Metal and Semiconductor; 5.2.3 Tersoff-Hamman Theory and its Extension; 5.2.4 Other Theories; 5.3 Theoretical Aspects of AFM; 5.4 Image Simulation by Density Plot Calculations; 5.4.1 STM Image Simulation; 5.4.2 AFM Image Simulation; 5.4.3 STM and AFM Images of Graphite; References 7.3 Cases Tractable by Electronic Band Structure Calculations |
| Record Nr. | UNISA-996199396403316 |
|
Magonov Sergei N
|
||
| Weinheim [Germany] ; ; New York, : VCH, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Surface analysis with STM and AFM [[electronic resource] ] : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo
| Surface analysis with STM and AFM [[electronic resource] ] : experimental and theoretical aspects of image analysis / / Sergei N. Magonov, Myung-Hwan Whangbo |
| Autore | Magonov Sergei N |
| Pubbl/distr/stampa | Weinheim [Germany] ; ; New York, : VCH, 1996 |
| Descrizione fisica | 1 online resource (338 p.) |
| Disciplina |
502.82
541.37 |
| Soggetto topico |
Surfaces (Technology) - Analysis
Scanning tunneling microscopy Atomic force microscopy |
| ISBN |
1-281-84271-0
9783527615117 9786611842710 3-527-61511-3 3-527-61510-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Surface Analysis with STM and AFM; Preface; Contents; 1 Introduction; 1.1 Development of Scanning Probe Microscopy; 1.2 Key Problems of STM and AFM Applications; 1.2.1 Image Interpretation; 1.2.2 Tip-Sample Interactions; 1.2.3 Surface Relaxation and Local Hardness; 1.2.4 Surface Forces and AFM; 1.3 Objectives; References; 2 Physical Phenomena Relevant to STM and AFM; 2.1 Electron Transport Processes; 2.1.1 Conventional Electron Tunneling Regime; 2.1.2 Electronic and Mechanical Contact Regimes; 2.1.3 STM in Different Environments; 2.2 Survey of Force Interactions
2.2.1 Force-vs.-Distance Curves2.2.2 Short-Range Forces and Sample Deformation; 2.2.3 Long-Range and Other Forces; 2.2.3.1 Long-Range Forces; 2.2.3.2 Adhesion and Capillary Forces; References; 3 Scanning Probe Microscopes; 3.1 Operating Principles and Main Components; 3.1.1 Scanner; 3.1.2 Tip-Sample Approach and Electronic Feedback; 3.1.3 Scanning Modes and Parameters; 3.1.4 Images and Filtering; 3.1.5 Isolation of Vibrational Noise; 3.2 Scanning Tunneling Microscope; 3.2.1 STM Tips and Current Detection; 3.2.2 Bias Voltage; 3.2.3 Scanning Tunneling Spectroscopy; 3.3 Atomic Force Microscope 3.3.1 Contact Mode and Force Detection3.3.2 AFM Probes; 3.3.3 Dynamic AFM Measurements; 3.3.3.1 AFM Operation in the Attractive Force Regime; 3.3.3.2 Tapping Mode; 3.3.3.3 Force-Modulation Techniques; 3.3.3.4 Magnetic Force Microscopy; 3.4 STM and AFM as Metrology Tools; 3.4.1 Resolution in STM and AFM; 3.4.2 Metrological Applications; References; 4 Practical Aspects of STM and AFM Measurements; 4.1 Samples; 4.2 Optimization of Experiments; 4.2.1 Optimization of STM Experiments; 4.2.2 Optimization of Contact-Mode AFM Experiments; 4.2.3 Optimization of Tapping-Mode AFM Experiments 4.3 STM and AFM Measurements4.3.1 Large-Scale Imaging; 4.3.2 Atomic-Scale Imaging; 4.3.3 Image Artifacts; References; 5 Simulations of STM and AFM Images; 5.1 Electronic Structures of Solids; 5.2 Theoretical Aspects of STM; 5.2.1 Tunneling Between Metals; 5.2.2 Tunneling Between Metal and Semiconductor; 5.2.3 Tersoff-Hamman Theory and its Extension; 5.2.4 Other Theories; 5.3 Theoretical Aspects of AFM; 5.4 Image Simulation by Density Plot Calculations; 5.4.1 STM Image Simulation; 5.4.2 AFM Image Simulation; 5.4.3 STM and AFM Images of Graphite; References 7.3 Cases Tractable by Electronic Band Structure Calculations |
| Record Nr. | UNINA-9910830817403321 |
|
Magonov Sergei N
|
||
| Weinheim [Germany] ; ; New York, : VCH, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface and Interface Science . Volume 9 Applications of surface science I / / edited by Klaus Wandelt
| Surface and Interface Science . Volume 9 Applications of surface science I / / edited by Klaus Wandelt |
| Pubbl/distr/stampa | John Wiley & Sons, Inc., 2020 |
| Descrizione fisica | 1 online resource |
| Soggetto topico |
Surfaces (Physics)
Surfaces (Technology) - Analysis Surface chemistry |
| ISBN | 3-527-82249-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910555265703321 |
| John Wiley & Sons, Inc., 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface and interface science . Volume 10 Applications of surface science II / / edited by Klaus Wandelt
| Surface and interface science . Volume 10 Applications of surface science II / / edited by Klaus Wandelt |
| Pubbl/distr/stampa | John Wiley & Sons, Inc., 2020 |
| Descrizione fisica | 1 online resource |
| Soggetto topico |
Surfaces (Physics)
Surfaces (Technology) - Analysis Surface chemistry |
| ISBN | 3-527-82250-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910554816603321 |
| John Wiley & Sons, Inc., 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface and Interface Science . Volume 9 Applications of surface science I / / edited by Klaus Wandelt
| Surface and Interface Science . Volume 9 Applications of surface science I / / edited by Klaus Wandelt |
| Pubbl/distr/stampa | John Wiley & Sons, Inc., 2020 |
| Descrizione fisica | 1 online resource |
| Soggetto topico |
Surfaces (Physics)
Surfaces (Technology) - Analysis Surface chemistry |
| ISBN | 3-527-82249-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910877118603321 |
| John Wiley & Sons, Inc., 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface and interface science . Volume 10 Applications of surface science II / / edited by Klaus Wandelt
| Surface and interface science . Volume 10 Applications of surface science II / / edited by Klaus Wandelt |
| Pubbl/distr/stampa | John Wiley & Sons, Inc., 2020 |
| Descrizione fisica | 1 online resource |
| Soggetto topico |
Surfaces (Physics)
Surfaces (Technology) - Analysis Surface chemistry |
| ISBN | 3-527-82250-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910877283203321 |
| John Wiley & Sons, Inc., 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface and interface science . Volume 5 Solid-Gas Interfaces I / / edited by Klaus Wandelt
| Surface and interface science . Volume 5 Solid-Gas Interfaces I / / edited by Klaus Wandelt |
| Pubbl/distr/stampa | Weinheim, Germany : , : John Wiley & Sons, Inc., , 2015 |
| Descrizione fisica | 1 online resource (xxiv-627 pages) : illustrations |
| Disciplina | 530.417 |
| Soggetto topico |
Surfaces (Physics)
Surfaces (Technology) - Analysis |
| ISBN | 3-527-68057-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Basics of Adsorption / Klaus Wandelt -- Surface Microcalorimetry / J Michael Gottfried, Rolf Schuster -- Rare Gas Adsorption / Peter Zeppenfeld -- Adsorption of Alkali and Other Electropositive Metals / AntonG Naumovets -- Halogen Adsorption on Metals / Boris V Andryushechkin -- Adsorption of Hydrogen / Klaus Christmann -- Adsorption of Water / Sabine Maier, Miquel Salmeron -- Adsorption of (Small) Molecules on Metals / Reinhard Denecke, Hans-Peter Steinrück -- Surface Science Approach to Heterogeneous Catalysis / Günther Rupprechter -- Adsorption of Unsaturated and Multifunctional Molecules: Bonding and Reactivity / Jan Haubrich, Klaus Wandelt. |
| Record Nr. | UNINA-9910830404803321 |
| Weinheim, Germany : , : John Wiley & Sons, Inc., , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surface and interface science . Volume 3 Properties of composite surfaces: alloys, compounds, semiconductors / / edited by Klaus Wandelt
| Surface and interface science . Volume 3 Properties of composite surfaces: alloys, compounds, semiconductors / / edited by Klaus Wandelt |
| Pubbl/distr/stampa | Weinheim : , : Wiley-VCH, , 2014 |
| Descrizione fisica | 1 online resource |
| Soggetto topico |
Surfaces (Physics)
Surfaces (Technology) - Analysis Surface chemistry |
| ISBN |
3-527-41157-7
3-527-68055-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front Matter -- Surface Properties of Alloys / Tobias C Kerscher, Stefan Müller -- Properties of Surface Alloys / Harry Hoster -- Surfaces of Compound Semiconductors / Patrick Vogt, Norbert Esser -- Physical Properties of Surface Silicides / EG Michel -- Properties of Oxide Surfaces / Martin Sterrer, Hans-Joachim Freund -- Surfaces of Simple Ionic Crystals / Annemarie Pucci, Jochen Vogt, Helmut Weiß, Michael Reichling -- Surfaces of Ice / Yoshinori Furukawa, Gen Sazaki, Hiroki Nada -- Surfaces of Quasicrystals and Complex Metallic Alloys / Patricia A Thiel, Ronan McGrath -- Surfaces of Amorphous Materials / Enrico Barletta, Klaus Wandelt. |
| Record Nr. | UNINA-9910132469003321 |
| Weinheim : , : Wiley-VCH, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
