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ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / / Institute of Electrical and Electronics Engineers
| ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (xiv, 199 pages) |
| Disciplina | 621.381548 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing |
| ISBN | 1-7281-1466-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910326259103321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / / Institute of Electrical and Electronics Engineers
| ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (xiv, 199 pages) |
| Disciplina | 621.381548 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing |
| ISBN | 1-7281-1466-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996577839503316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
| ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996210152803316 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
| ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910873062103321 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / / sponsored by the IEEE Electron Devices Society
| ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / / sponsored by the IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 |
| Descrizione fisica | 1 online resource (217 pages) |
| Disciplina | 621.381548 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing |
| ISBN | 1-4799-8304-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910131305003321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / / sponsored by the IEEE Electron Devices Society
| ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / / sponsored by the IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 |
| Descrizione fisica | 1 online resource (217 pages) |
| Disciplina | 621.381548 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing |
| ISBN | 1-4799-8304-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280842303316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE Number 256-1963 : IEEE Test Procedure for Semiconductor Diodes / / IEEE
| IEEE Number 256-1963 : IEEE Test Procedure for Semiconductor Diodes / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1963 |
| Descrizione fisica | 1 online resource (10 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Diodes, Semiconductor
Semiconductors - Testing Standards, Engineering |
| ISBN | 1-5044-0227-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE No 256-1963 |
| Record Nr. | UNINA-9910137507703321 |
| Piscataway, NJ : , : IEEE, , 1963 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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IEEE Number 256-1963 : IEEE Test Procedure for Semiconductor Diodes / / IEEE
| IEEE Number 256-1963 : IEEE Test Procedure for Semiconductor Diodes / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1963 |
| Descrizione fisica | 1 online resource (10 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Diodes, Semiconductor
Semiconductors - Testing Standards, Engineering |
| ISBN | 1-5044-0227-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE No 256-1963 |
| Record Nr. | UNISA-996280658603316 |
| Piscataway, NJ : , : IEEE, , 1963 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International
| ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International |
| Pubbl/distr/stampa | Materials Park, Ohio : , : ASM International, , [2015] |
| Descrizione fisica | 1 online resource (536 pages) : illustrations (some color) |
| Soggetto topico |
Electronics - Materials - Testing
Materials - Testing Electronic apparatus and appliances - Testing Semiconductors - Testing |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-5231-0206-3
1-62708-103-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910467594603321 |
| Materials Park, Ohio : , : ASM International, , [2015] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International
| ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International |
| Pubbl/distr/stampa | Materials Park, Ohio : , : ASM International, , [2015] |
| Descrizione fisica | 1 online resource (536 pages) : illustrations (some color) |
| Soggetto topico |
Electronics - Materials - Testing
Materials - Testing Electronic apparatus and appliances - Testing Semiconductors - Testing |
| ISBN |
1-5231-0206-3
1-62708-103-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910796671003321 |
| Materials Park, Ohio : , : ASM International, , [2015] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
