Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Extended abstracts of the third International Workshop on Junction Technology : IWJT : December 2-3, 2002, Tokyo, Japan
| Extended abstracts of the third International Workshop on Junction Technology : IWJT : December 2-3, 2002, Tokyo, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : Business Center for Academic Societies Japan, 2002 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Junctions
Semiconductors - Design and construction Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996206246403316 |
| [Place of publication not identified], : Business Center for Academic Societies Japan, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Extended abstracts of the third International Workshop on Junction Technology : IWJT : December 2-3, 2002, Tokyo, Japan
| Extended abstracts of the third International Workshop on Junction Technology : IWJT : December 2-3, 2002, Tokyo, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : Business Center for Academic Societies Japan, 2002 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Junctions
Semiconductors - Design and construction Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872557603321 |
| [Place of publication not identified], : Business Center for Academic Societies Japan, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fabrication engineering at the micro- and nanoscale / Stephen A. Campbell
| Fabrication engineering at the micro- and nanoscale / Stephen A. Campbell |
| Autore | Campbell, Stephen A. |
| Edizione | [Fourth edition] |
| Descrizione fisica | xiv, 671 pages; 24 cm |
| Disciplina | 621.3815/2 |
| Collana | The Oxford series in electrical and computer engineering |
| Soggetto topico | Semiconductors - Design and construction |
| ISBN | 9780199861224 |
| Classificazione |
LC TK7871.85
621.3.2.4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991003427979707536 |
Campbell, Stephen A.
|
||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
| ||
Fourth International Workshop on Junction Technology, 2004 : 16 March 2004, Shanghai, China / / Institute of Electrical and Electronics Engineers
| Fourth International Workshop on Junction Technology, 2004 : 16 March 2004, Shanghai, China / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2004 |
| Descrizione fisica | 1 online resource (68 pages) |
| Disciplina | 621.395 |
| Altri autori (Persone) | QuXin-Ping |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Semiconductors - Junctions Semiconductors - Design and construction |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202923903316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S. |
| Pubbl/distr/stampa | [Piscataway, New Jersey] : , : IEEE, , c2006 |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina |
621.3815/2
621.38152 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNINA-9910143417603321 |
|
May Gary S.
|
||
| [Piscataway, New Jersey] : , : IEEE, , c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S. |
| Pubbl/distr/stampa | [Piscataway, New Jersey] : , : IEEE, , c2006 |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina |
621.3815/2
621.38152 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNISA-996202373203316 |
|
May Gary S.
|
||
| [Piscataway, New Jersey] : , : IEEE, , c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S. |
| Pubbl/distr/stampa | [Piscataway, New Jersey] : , : IEEE, , c2006 |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina |
621.3815/2
621.38152 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNINA-9910830857403321 |
|
May Gary S.
|
||
| [Piscataway, New Jersey] : , : IEEE, , c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of Semiconductor Technology
| Handbook of Semiconductor Technology |
| Pubbl/distr/stampa | [Place of publication not identified], : Wiley VCH Imprint, 2000 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Analysis
Semiconductors - Materials Semiconductors - Design and construction Electronic structure - Defects Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 3-527-61929-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910144686403321 |
| [Place of publication not identified], : Wiley VCH Imprint, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of Semiconductor Technology
| Handbook of Semiconductor Technology |
| Pubbl/distr/stampa | [Place of publication not identified], : Wiley VCH Imprint, 2000 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Analysis
Semiconductors - Materials Semiconductors - Design and construction Electronic structure - Defects Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 3-527-61929-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910830491703321 |
| [Place of publication not identified], : Wiley VCH Imprint, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ICICDT : IEEE International Conference on IC Design and Technology : May 28th-30th, 2014, Austin, Texas, USA
| ICICDT : IEEE International Conference on IC Design and Technology : May 28th-30th, 2014, Austin, Texas, USA |
| Pubbl/distr/stampa | New York : , : IEEE, , 2014 |
| Descrizione fisica | 1 online resource (246 pages) |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction |
| ISBN |
1-4799-2153-X
1-4799-2154-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279277803316 |
| New York : , : IEEE, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
