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2013 IEEE International Interconnect Technology Conference (IITC 2013) : Kyoto, Japan, 13-15 June 2013
2013 IEEE International Interconnect Technology Conference (IITC 2013) : Kyoto, Japan, 13-15 June 2013
Pubbl/distr/stampa IEEE
Disciplina 621.3815
Soggetto topico Interconnects (Integrated circuit technology)
Semiconductors - Design and construction
ISBN 1-4799-0440-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2013 IEEE International Interconnect Technology Conference - IITC
Interconnect Technology Conference
Record Nr. UNISA-996280323203316
IEEE
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2013 IEEE International Interconnect Technology Conference (IITC 2013) : Kyoto, Japan, 13-15 June 2013
2013 IEEE International Interconnect Technology Conference (IITC 2013) : Kyoto, Japan, 13-15 June 2013
Pubbl/distr/stampa IEEE
Disciplina 621.3815
Soggetto topico Interconnects (Integrated circuit technology)
Semiconductors - Design and construction
ISBN 1-4799-0440-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2013 IEEE International Interconnect Technology Conference - IITC
Interconnect Technology Conference
Record Nr. UNINA-9910133229103321
IEEE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2013 : 3rd-5th September 2013, Grand Central Hotel, Glasgow, Scotland / / International Conference on Simulation of Semiconductor Processes and Devices, Institute of Electrical and Electronics Engineers (Publisher), IEEE Electron Devices Society, IEEE Electron Devices Society Scotland Chapter
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2013 : 3rd-5th September 2013, Grand Central Hotel, Glasgow, Scotland / / International Conference on Simulation of Semiconductor Processes and Devices, Institute of Electrical and Electronics Engineers (Publisher), IEEE Electron Devices Society, IEEE Electron Devices Society Scotland Chapter
Pubbl/distr/stampa Piscataway, NJ : , : IEEE, , 2013
Descrizione fisica 1 online resource (463 pages)
Disciplina 620.0042
Soggetto topico Computer-aided design
Semiconductors - Design and construction
Semiconductors - Simulation methods
ISBN 1-4673-5736-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
2013 International Conference on Simulation of Semiconductor Processes and Devices
Simulation of Semiconductor Processes and Devices
Record Nr. UNISA-996279697803316
Piscataway, NJ : , : IEEE, , 2013
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2013 : 3rd-5th September 2013, Grand Central Hotel, Glasgow, Scotland / / International Conference on Simulation of Semiconductor Processes and Devices, Institute of Electrical and Electronics Engineers (Publisher), IEEE Electron Devices Society, IEEE Electron Devices Society Scotland Chapter
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2013 : 3rd-5th September 2013, Grand Central Hotel, Glasgow, Scotland / / International Conference on Simulation of Semiconductor Processes and Devices, Institute of Electrical and Electronics Engineers (Publisher), IEEE Electron Devices Society, IEEE Electron Devices Society Scotland Chapter
Pubbl/distr/stampa Piscataway, NJ : , : IEEE, , 2013
Descrizione fisica 1 online resource (463 pages)
Disciplina 620.0042
Soggetto topico Computer-aided design
Semiconductors - Design and construction
Semiconductors - Simulation methods
ISBN 1-4673-5736-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
2013 International Conference on Simulation of Semiconductor Processes and Devices
Simulation of Semiconductor Processes and Devices
Record Nr. UNINA-9910133229003321
Piscataway, NJ : , : IEEE, , 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference : 16-19 May 2016, Saratoga Springs, New York, USA / / Institute of Electrial and Electronics Engineers, Semiconductor Equipment and Materials International
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference : 16-19 May 2016, Saratoga Springs, New York, USA / / Institute of Electrial and Electronics Engineers, Semiconductor Equipment and Materials International
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2016
Descrizione fisica 1 online resource (474 pages)
Disciplina 621.38152
Soggetto topico Semiconductors - Design and construction
Semiconductor industry
Process control
ISBN 1-5090-0270-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910137041803321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2016
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference : 16-19 May 2016, Saratoga Springs, New York, USA / / Institute of Electrial and Electronics Engineers, Semiconductor Equipment and Materials International
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference : 16-19 May 2016, Saratoga Springs, New York, USA / / Institute of Electrial and Electronics Engineers, Semiconductor Equipment and Materials International
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2016
Descrizione fisica 1 online resource (474 pages)
Disciplina 621.38152
Soggetto topico Semiconductors - Design and construction
Semiconductor industry
Process control
ISBN 1-5090-0270-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996279474803316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2016
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2018 International Conference on Simulation of Semiconductor Processes and Devices : 24-26 September 2018, Austin, TX, USA / / Institute of Electrical and Electronics Engineers
2018 International Conference on Simulation of Semiconductor Processes and Devices : 24-26 September 2018, Austin, TX, USA / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (61 pages)
Disciplina 621.38152015118
Soggetto topico Semiconductors - Mathematical models
Semiconductors - Design and construction
Semiconductors - Simulation methods
ISBN 1-5386-6790-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996280350603316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2018 International Conference on Simulation of Semiconductor Processes and Devices : 24-26 September 2018, Austin, TX, USA / / Institute of Electrical and Electronics Engineers
2018 International Conference on Simulation of Semiconductor Processes and Devices : 24-26 September 2018, Austin, TX, USA / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (61 pages)
Disciplina 621.38152015118
Soggetto topico Semiconductors - Mathematical models
Semiconductors - Design and construction
Semiconductors - Simulation methods
ISBN 1-5386-6790-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910295655903321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) / / Institute of Electrical and Electronics Engineers
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : IEEE, , 2022
Descrizione fisica 1 online resource
Disciplina 621.3815
Soggetto topico Semiconductors - Design and construction
Semiconductor industry
ISBN 1-66549-487-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference
Record Nr. UNISA-996575002003316
Piscataway, New Jersey : , : IEEE, , 2022
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
ASMC : 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference : 30 April-3 May 2018, Saratoga Springs, NY, USA / / Institute of Electrical and Electronics Engineers
ASMC : 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference : 30 April-3 May 2018, Saratoga Springs, NY, USA / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (394 pages)
Disciplina 621.38152
Soggetto topico Semiconductors - Design and construction
Process control
ISBN 1-5386-3748-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996280720003316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui