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2018 IEEE International Conference on Electron Devices and Solid State Circuits : 6-8 June 2018, Shenzhen, China / / Institute of Electrical and Electronics Engineers
| 2018 IEEE International Conference on Electron Devices and Solid State Circuits : 6-8 June 2018, Shenzhen, China / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (124 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Electronic apparatus and appliances
Solid state electronics Semiconductors |
| ISBN | 1-5386-6234-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910289356503321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference : 15-18 October 2018, Burlingame, CA, USA / / IEEE Electron Devices Society
| 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference : 15-18 October 2018, Burlingame, CA, USA / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (88 pages) |
| Disciplina | 621.38152 |
| Soggetto topico |
Silicon-on-insulator technology
Semiconductors Microelectronics |
| ISBN | 1-5386-7627-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910310658703321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference : 15-18 October 2018, Burlingame, CA, USA / / IEEE Electron Devices Society
| 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference : 15-18 October 2018, Burlingame, CA, USA / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (88 pages) |
| Disciplina | 621.38152 |
| Soggetto topico |
Silicon-on-insulator technology
Semiconductors Microelectronics |
| ISBN | 1-5386-7627-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996575285203316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers
| 2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Santa Clara, CA : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.38152 |
| Soggetto topico | Semiconductors |
| ISBN | 1-7355325-0-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium |
| Record Nr. | UNINA-9910437203703321 |
| Santa Clara, CA : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers
| 2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Santa Clara, CA : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.38152 |
| Soggetto topico | Semiconductors |
| ISBN | 1-7355325-0-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium |
| Record Nr. | UNISA-996575632903316 |
| Santa Clara, CA : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2019 International Vacuum Electronics Conference : 28 April-1 May 2019, Busan, Korea (South) / / IEEE Electron Devices Society
| 2019 International Vacuum Electronics Conference : 28 April-1 May 2019, Busan, Korea (South) / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (366 pages) |
| Disciplina | 621.55 |
| Soggetto topico |
Vacuum technology
Electronic apparatus and appliances Semiconductors |
| ISBN | 1-5386-7534-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910330357803321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2019 International Vacuum Electronics Conference : 28 April-1 May 2019, Busan, Korea (South) / / IEEE Electron Devices Society
| 2019 International Vacuum Electronics Conference : 28 April-1 May 2019, Busan, Korea (South) / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (366 pages) |
| Disciplina | 621.55 |
| Soggetto topico |
Vacuum technology
Electronic apparatus and appliances Semiconductors |
| ISBN | 1-5386-7534-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996575572503316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers
| 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 2020 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.38152 |
| Soggetto topico | Semiconductors |
| ISBN | 0-578-43862-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium |
| Record Nr. | UNINA-9910437346603321 |
| Piscataway, New Jersey : , : IEEE, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers
| 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 2020 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.38152 |
| Soggetto topico | Semiconductors |
| ISBN | 0-578-43862-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium |
| Record Nr. | UNISA-996575523003316 |
| Piscataway, New Jersey : , : IEEE, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2021 China Semiconductor Technology International Conference (CSTIC) : 14-15 March 2021, Shanghai, China / / Institute of Electrical and Electronics Engineers
| 2021 China Semiconductor Technology International Conference (CSTIC) : 14-15 March 2021, Shanghai, China / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , [2021] |
| Descrizione fisica | 1 online resource (533 pages) : illustrations |
| Disciplina | 621.38152 |
| Soggetto topico | Semiconductors |
| ISBN | 1-66544-945-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2021 China Semiconductor Technology International Conference |
| Record Nr. | UNINA-9910554158103321 |
| Piscataway, New Jersey : , : IEEE, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Soggetto topico
-
Semiconductors
(897)
- Optical materials (128)
- Optical and Electronic Materials (120)
- Electronic materials (118)
- Electrical Engineering (84)