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7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9459-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNINA-9910145452103321 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
| 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8811-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202098303316 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
| 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8811-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142701303321 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Compact MOSFET models for VLSI design / / A.B. Bhattacharyya
| Compact MOSFET models for VLSI design / / A.B. Bhattacharyya |
| Autore | Bhattacharyya A. B. (Amalendu Bhushan) |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Singapore ; , : John Wiley & Sons (Asia), , c2009 |
| Descrizione fisica | 1 online resource (458 p.) |
| Disciplina |
621.39/5
621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Metal oxide semiconductor field-effect transistors - Design and construction |
| ISBN |
1-282-38210-1
9786612382109 0-470-82344-5 0-470-82343-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Semiconductor physics review for MOSFET modeling -- Ideal metal oxide semiconductor capacitor -- Non-ideal and non-classical MOS capacitors -- Long channel MOS transistor -- The scaled MOS transistor -- Quasistatic, non-quasistatic, and noise models -- Quantum phenomena in MOS transistors -- Non-classical MOSFET structures -- Appendix A : expression for electric field and potential variation in the semiconductor space charge under the gate -- Appendix B : features of select compact MOSFET models -- Appendix C : PSP two-point collocation method. |
| Record Nr. | UNINA-9910139778103321 |
Bhattacharyya A. B. (Amalendu Bhushan)
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| Singapore ; , : John Wiley & Sons (Asia), , c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Compact MOSFET models for VLSI design / / A.B. Bhattacharyya
| Compact MOSFET models for VLSI design / / A.B. Bhattacharyya |
| Autore | Bhattacharyya A. B. (Amalendu Bhushan) |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Singapore ; , : John Wiley & Sons (Asia), , c2009 |
| Descrizione fisica | 1 online resource (458 p.) |
| Disciplina |
621.39/5
621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Metal oxide semiconductor field-effect transistors - Design and construction |
| ISBN |
1-282-38210-1
9786612382109 0-470-82344-5 0-470-82343-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Semiconductor physics review for MOSFET modeling -- Ideal metal oxide semiconductor capacitor -- Non-ideal and non-classical MOS capacitors -- Long channel MOS transistor -- The scaled MOS transistor -- Quasistatic, non-quasistatic, and noise models -- Quantum phenomena in MOS transistors -- Non-classical MOSFET structures -- Appendix A : expression for electric field and potential variation in the semiconductor space charge under the gate -- Appendix B : features of select compact MOSFET models -- Appendix C : PSP two-point collocation method. |
| Record Nr. | UNINA-9910830209303321 |
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Bhattacharyya A. B. (Amalendu Bhushan)
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| Singapore ; , : John Wiley & Sons (Asia), , c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Defect and Fault-Tolerance in VLSI Systems, 1993 Workshop
| Defect and Fault-Tolerance in VLSI Systems, 1993 Workshop |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1993 |
| Descrizione fisica | 1 online resource (xiii, 336 pages) : illustrations |
| Disciplina | 621.38173 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211247503316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On
| Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1994 |
| Descrizione fisica | 1 online resource (304 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996198229503316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Defect and Fault-Tolerance in VLSI Systems, 1995 Workshop
| Defect and Fault-Tolerance in VLSI Systems, 1995 Workshop |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1995 |
| Descrizione fisica | 1 online resource (320 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996210260003316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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DFT '99 : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : November 1-3, 1999, Albuquerque, New Mexico / / sponsored by IEEE Computer Society [and three others]
| DFT '99 : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : November 1-3, 1999, Albuquerque, New Mexico / / sponsored by IEEE Computer Society [and three others] |
| Pubbl/distr/stampa | Los Alamitos, California : , : IEEE Computer Society, , 1999 |
| Descrizione fisica | 1 online resource (405 pages) |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996201987003316 |
| Los Alamitos, California : , : IEEE Computer Society, , 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Digest of papers : microprocesses and nanotechnology '99 : 1999 International Microprocesses and Nanotechnology Conference, July 6-8, 1999, Yokohama, Japan / / sponsored by the Japan Society of Applied Physics ; technical-cosponsored by IEEE Electron Device Society ; cooperation, American Vacuum Society [and seven others]
| Digest of papers : microprocesses and nanotechnology '99 : 1999 International Microprocesses and Nanotechnology Conference, July 6-8, 1999, Yokohama, Japan / / sponsored by the Japan Society of Applied Physics ; technical-cosponsored by IEEE Electron Device Society ; cooperation, American Vacuum Society [and seven others] |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 1999 |
| Descrizione fisica | 1 online resource (234 pages) |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Nanotechnology Microelectronics |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199963103316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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