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21st International Conference on VLSI Design : held jointly with 7th International Conference on Embedded Systems : proceedings : Hyderabad, India, January 4-8, 2008
| 21st International Conference on VLSI Design : held jointly with 7th International Conference on Embedded Systems : proceedings : Hyderabad, India, January 4-8, 2008 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2008 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Signal processing - Digital techniques Electronic digital computers - Circuits Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-8159-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212317003316 |
| [Place of publication not identified], : IEEE Computer Society Press, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
21st International Conference on VLSI Design : held jointly with 7th International Conference on Embedded Systems : proceedings : Hyderabad, India, January 4-8, 2008
| 21st International Conference on VLSI Design : held jointly with 7th International Conference on Embedded Systems : proceedings : Hyderabad, India, January 4-8, 2008 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2008 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Signal processing - Digital techniques Electronic digital computers - Circuits Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-8159-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910140045203321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216505403316 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145668103321 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
32nd International Conference on VLSI Design : held concurrently with 18th International Conference on Embedded Systems : proceedings : New Delhi, India, 5-9 January, 2019 / / Institute of Electrical and Electronics Engineers ; in-cooperation with ACM SIGDA/SIGMICRO ; technical co-sponsorship, IEEE Circuits and Systems Society (IEEE CASS) [and six others] ; sponsored by VLSI Society of India
| 32nd International Conference on VLSI Design : held concurrently with 18th International Conference on Embedded Systems : proceedings : New Delhi, India, 5-9 January, 2019 / / Institute of Electrical and Electronics Engineers ; in-cooperation with ACM SIGDA/SIGMICRO ; technical co-sponsorship, IEEE Circuits and Systems Society (IEEE CASS) [and six others] ; sponsored by VLSI Society of India |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (554 pages) |
| Disciplina | 65621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Electronic digital computers - Circuits Signal processing - Digital techniques Embedded computer systems |
| ISBN | 1-7281-0409-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910324056703321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
32nd International Conference on VLSI Design : held concurrently with 18th International Conference on Embedded Systems : proceedings : New Delhi, India, 5-9 January, 2019 / / Institute of Electrical and Electronics Engineers ; in-cooperation with ACM SIGDA/SIGMICRO ; technical co-sponsorship, IEEE Circuits and Systems Society (IEEE CASS) [and six others] ; sponsored by VLSI Society of India
| 32nd International Conference on VLSI Design : held concurrently with 18th International Conference on Embedded Systems : proceedings : New Delhi, India, 5-9 January, 2019 / / Institute of Electrical and Electronics Engineers ; in-cooperation with ACM SIGDA/SIGMICRO ; technical co-sponsorship, IEEE Circuits and Systems Society (IEEE CASS) [and six others] ; sponsored by VLSI Society of India |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (554 pages) |
| Disciplina | 65621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Electronic digital computers - Circuits Signal processing - Digital techniques Embedded computer systems |
| ISBN | 1-7281-0409-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996575376003316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
| 5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Quality control - Very large scale integration - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214938303316 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0067-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202254303316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0067-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146498103321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9459-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNISA-996197586203316 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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