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Proceedings / / IEEE ... International Symposium on Quality Electronic Design ; sponsored by IEEE Computer Society Technical Committees on VLSI and Design Automation
| Proceedings / / IEEE ... International Symposium on Quality Electronic Design ; sponsored by IEEE Computer Society Technical Committees on VLSI and Design Automation |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society, 2000- |
| Disciplina | 621.3 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits industry - Quality control |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 1948-3295 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Proceedings of the IEEE ... International Symposium on Quality Electronic Design
Proceedings of the International Symposium on Quality Electronic Design Proceedings of the ISQED ISQED IEEE ISQED Quality electronic design |
| Record Nr. | UNINA-9910625197103321 |
| Los Alamitos, Calif., : IEEE Computer Society, 2000- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings / / IEEE ... International Symposium on Quality Electronic Design ; sponsored by IEEE Computer Society Technical Committees on VLSI and Design Automation
| Proceedings / / IEEE ... International Symposium on Quality Electronic Design ; sponsored by IEEE Computer Society Technical Committees on VLSI and Design Automation |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society, 2000- |
| Disciplina | 621.3 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits industry - Quality control |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 1948-3295 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Proceedings of the IEEE ... International Symposium on Quality Electronic Design
Proceedings of the International Symposium on Quality Electronic Design Proceedings of the ISQED ISQED IEEE ISQED Quality electronic design |
| Record Nr. | UNISA-996279380503316 |
| Los Alamitos, Calif., : IEEE Computer Society, 2000- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT)
| Proceedings / / IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT) |
| Pubbl/distr/stampa | Los Alamitos, Calif. : , : IEEE Computer Society Press, , 1996-2010 |
| Descrizione fisica | 15 volumes |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Fault tolerance |
| Soggetto genere / forma |
Electronic journals.
Conference papers and proceedings. Periodicals. |
| ISSN | 2377-7966 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279994503316 |
| Los Alamitos, Calif. : , : IEEE Computer Society Press, , 1996-2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT)
| Proceedings / / IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT) |
| Pubbl/distr/stampa | Los Alamitos, Calif. : , : IEEE Computer Society Press, , 1996-2010 |
| Descrizione fisica | 15 volumes |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Fault tolerance |
| Soggetto genere / forma |
Conference papers and proceedings.
Periodicals. |
| ISSN | 2377-7966 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Defect and Fault-Tolerance in VLSI Systems DFT |
| Record Nr. | UNINA-9910626134203321 |
| Los Alamitos, Calif. : , : IEEE Computer Society Press, , 1996-2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings / / Great Lakes Symposium on VLSI
| Proceedings / / Great Lakes Symposium on VLSI |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society Press, c1991- |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Computer-aided design |
| Soggetto genere / forma | Conference papers and proceedings. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Proceedings of the ... Great Lakes Symposium on VLSI
GLSV |
| Record Nr. | UNISA-996197450703316 |
| Los Alamitos, Calif., : IEEE Computer Society Press, c1991- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / Great Lakes Symposium on VLSI
| Proceedings / / Great Lakes Symposium on VLSI |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society Press, c1991- |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Computer-aided design |
| Soggetto genere / forma | Conference papers and proceedings. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Proceedings of the ... Great Lakes Symposium on VLSI
GLSV |
| Record Nr. | UNINA-9910626131803321 |
| Los Alamitos, Calif., : IEEE Computer Society Press, c1991- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings / / IEEE Computer Society Annual Symposium on VLSI
| Proceedings / / IEEE Computer Society Annual Symposium on VLSI |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society |
| Disciplina | 621.39 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Computers - Circuits - Design and construction System design |
| Soggetto genere / forma | Conference papers and proceedings. |
| ISSN | 2159-3477 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280005103316 |
| Los Alamitos, Calif., : IEEE Computer Society | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings
| Proceedings |
| Pubbl/distr/stampa | Piscataway, NJ, : IEEE |
| Disciplina | 621.39 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Testing Integrated circuits - Fault tolerance |
| Soggetto genere / forma | Conference papers and proceedings. |
| ISSN | 2162-061X |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
International Design and Test Workshop
IDT IEEE International Design and Test Workshop |
| Record Nr. | UNISA-996280903303316 |
| Piscataway, NJ, : IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / IEEE Computer Society Annual Symposium on VLSI
| Proceedings / / IEEE Computer Society Annual Symposium on VLSI |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society |
| Disciplina | 621.39 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Computers - Circuits - Design and construction System design |
| Soggetto genere / forma | Conference papers and proceedings. |
| ISSN | 2159-3477 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910626003603321 |
| Los Alamitos, Calif., : IEEE Computer Society | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings
| Proceedings |
| Pubbl/distr/stampa | Piscataway, NJ, : IEEE |
| Disciplina | 621.39 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Testing Integrated circuits - Fault tolerance |
| Soggetto genere / forma | Conference papers and proceedings. |
| ISSN | 2162-061X |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
International Design and Test Workshop
IDT IEEE International Design and Test Workshop |
| Record Nr. | UNINA-9910626010103321 |
| Piscataway, NJ, : IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
