1997 2nd IEEE-CAS Region 8 Workshop on Analog and Mixed IC Design : proceedings, Baveno, Italy, 12-13 September, 1997 |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Disciplina | 621.3815 |
Soggetto topico |
Linear integrated circuits - Congresses - Design and construction
Mixed signal circuits - Congresses - Design and construction Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996212471803316 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. di Salerno | ||
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1997 2nd IEEE-CAS Region 8 Workshop on Analog and Mixed IC Design : proceedings, Baveno, Italy, 12-13 September, 1997 |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Disciplina | 621.3815 |
Soggetto topico |
Linear integrated circuits - Congresses - Design and construction
Mixed signal circuits - Congresses - Design and construction Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872604103321 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. Federico II | ||
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1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA |
Pubbl/distr/stampa | [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997 |
Disciplina | 621.3815/2 |
Soggetto topico |
Semiconductor wafers - Defects
Semiconductors - Effect of radiation on Plasma etching - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996206561003316 |
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997 | ||
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Lo trovi qui: Univ. di Salerno | ||
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1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA |
Pubbl/distr/stampa | [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997 |
Disciplina | 621.3815/2 |
Soggetto topico |
Semiconductor wafers - Defects
Semiconductors - Effect of radiation on Plasma etching - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872954903321 |
[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997 | ||
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Lo trovi qui: Univ. Federico II | ||
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1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Soggetto topico |
Semiconductors - Statistical methods - Characterization - Congresses
Semiconductors - Measurement - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996217395003316 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. di Salerno | ||
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1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Soggetto topico |
Semiconductors - Statistical methods - Characterization - Congresses
Semiconductors - Measurement - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872858003321 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. Federico II | ||
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1997 Annual Meeting of the North American Fuzzy Information Processing Society--NAFIPS : September 21-24, 1997, Syracuse, New York, U.S.A |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Disciplina | 006.3 |
Soggetto topico |
Soft computing - Congresses
Neural networks (Computer science) - Congresses Fuzzy systems - Congresses Engineering & Applied Sciences Computer Science |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996212485903316 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. di Salerno | ||
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1997 Annual Meeting of the North American Fuzzy Information Processing Society--NAFIPS : September 21-24, 1997, Syracuse, New York, U.S.A |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Disciplina | 006.3 |
Soggetto topico |
Soft computing - Congresses
Neural networks (Computer science) - Congresses Fuzzy systems - Congresses Engineering & Applied Sciences Computer Science |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872427403321 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. Federico II | ||
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1997 Digest of the IEEE/LEOS Summer Topical Meetings, 11-15 August 1997 at the Queen Elizabeth Hotel, Montreal, Quebec, Canada |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Disciplina | 621.39 |
Soggetto topico |
Optical communications - Industrial applications
Optoelectronic devices Lasers Integrated optics Broadband communication systems Electrical & Computer Engineering Telecommunications Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Vertical-cavity lasers -- Technologies for a global information infrastructure -- WDM components technology -- Advanced semiconductor lasers and applications -- Gallium nitride materials, processing, and devices. |
Record Nr. | UNISA-996217387803316 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. di Salerno | ||
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1997 Digest of the IEEE/LEOS Summer Topical Meetings, 11-15 August 1997 at the Queen Elizabeth Hotel, Montreal, Quebec, Canada |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
Disciplina | 621.39 |
Soggetto topico |
Optical communications - Industrial applications
Optoelectronic devices Lasers Integrated optics Broadband communication systems Electrical & Computer Engineering Telecommunications Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Vertical-cavity lasers -- Technologies for a global information infrastructure -- WDM components technology -- Advanced semiconductor lasers and applications -- Gallium nitride materials, processing, and devices. |
Record Nr. | UNINA-9910872431703321 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
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Lo trovi qui: Univ. Federico II | ||
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