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Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference / / Institute of Electrical and Electronics Engineers
Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, NJ : , : IEEE, , 2006
Descrizione fisica 1 online resource (1 CD-ROM) : illustrations
Disciplina 621.381045
Soggetto topico Electrooptical devices
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996575258503316
Piscataway, NJ : , : IEEE, , 2006
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Handbook of organic materials for optical and (opto)electronic devices : properties and applications / / edited by Oksana Ostroverkhova
Handbook of organic materials for optical and (opto)electronic devices : properties and applications / / edited by Oksana Ostroverkhova
Edizione [1st edition]
Pubbl/distr/stampa Cambridge, UK : , : Woodhead Publishing, , 2013
Descrizione fisica 1 online resource (xxvii, 804 pages) : illustrations
Disciplina 621.381045
Collana Woodhead Publishing series in electronic and optical materials
Soggetto topico Optoelectronic devices - Materials
Electrooptical devices
Optical materials
Nonlinear optics
Electronic apparatus and appliances - Materials
ISBN 0-85709-876-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto part I. Materials for organic (opto)electronics and nonlinear optics : structure-property relations -- part II. (Opto)electronic and nonlinear optical properties of organic materials and their characterization -- part III. Applications of (opto)electronic and nonlinear optical organic materials in devices.
Record Nr. UNINA-9910787688103321
Cambridge, UK : , : Woodhead Publishing, , 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Handbook of organic materials for optical and (opto)electronic devices : properties and applications / / edited by Oksana Ostroverkhova
Handbook of organic materials for optical and (opto)electronic devices : properties and applications / / edited by Oksana Ostroverkhova
Edizione [1st edition]
Pubbl/distr/stampa Cambridge, UK : , : Woodhead Publishing, , 2013
Descrizione fisica 1 online resource (xxvii, 804 pages) : illustrations
Disciplina 621.381045
Collana Woodhead Publishing series in electronic and optical materials
Soggetto topico Optoelectronic devices - Materials
Electrooptical devices
Optical materials
Nonlinear optics
Electronic apparatus and appliances - Materials
ISBN 0-85709-876-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto part I. Materials for organic (opto)electronics and nonlinear optics : structure-property relations -- part II. (Opto)electronic and nonlinear optical properties of organic materials and their characterization -- part III. Applications of (opto)electronic and nonlinear optical organic materials in devices.
Record Nr. UNINA-9910814892703321
Cambridge, UK : , : Woodhead Publishing, , 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, and John W. Devitt
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, and John W. Devitt
Autore Driggers Ronald G.
Edizione [Third edition.]
Pubbl/distr/stampa Boston, MA : , : Artech House, , [2022]
Descrizione fisica 1 online resource (739 pages)
Disciplina 621.36
Soggetto topico Electrooptical devices
Electrooptics
Infrared technology
Soggetto non controllato Optoelectronics
Technology & Engineering
ISBN 1-63081-833-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Introduction to Infrared and Electro-Optical Systems Third Edition -- Contents -- Preface -- Acknowledgments -- Chapter 1 Introduction -- 1.1 Introduction to Imaging -- 1.2 Infrared and EO Systems -- 1.3 Wavelength Dependencies -- 1.4 Typical EO Scenario -- 1.5 Typical Infrared Scenario -- 1.6 Analytical Parameters -- 1.7 Sensitivity and Resolution -- 1.8 Linear Systems Approach -- 1.9 Summary -- 1.10 Guide to the References -- References -- Chapter 2 Mathematics -- 2.1 Complex Functions -- 2.2 Common One-Dimensional Functions -- 2.3 The 2-D Functions -- 2.4 Convolution and Correlation -- 2.5 The Fourier Transform -- 2.6 Fourier Transform Properties -- 2.7 Transform Pairs and Delta Function Properties -- 2.8 Probability -- 2.9 Important Examples -- 2.10 Guide to the References -- References -- Selected Bibliography -- Software -- Chapter 3 Linear Shift-Invariant Systems -- 3.1 Linear Systems -- 3.2 Shift Invariance -- 3.3 Basics of LSI Systems -- 3.4 Impulse Response -- 3.5 Transfer Function -- 3.6 System PSF and MTF Versus Component PSF and MTF -- 3.7 Spatial Sampling -- 3.8 Spatial Sampling and Resolution -- 3.9 Sampled Imaging Systems -- 3.10 Guide to the References -- References -- Selected Bilbiography -- Chapter 4 Diffraction -- 4.1 Electromagnetic Waves -- 4.2 Coherence -- 4.3 Fresnel and Fraunhofer Diffraction from an Aperture -- 4.3.1 Fresnel Diffraction -- 4.3.2 Fraunhofer Diffraction -- 4.4 Fraunhofer Diffraction from a Thin Lens -- 4.5 Thin Lens Optical System Diffraction PSF -- 4.6 Thin Lens Diffraction MTF -- 4.6.1 Modulation and MTF -- 4.6.2 Incoherent Diffraction MTF -- 4.6.3 Coherent Diffraction MTF -- 4.7 Calculation of Diffraction MTF -- 4.7.1 Circular Pupil: Coherent MTF -- 4.7.2 Circular Pupil: Incoherent MTF -- 4.8 Programs for Calculating Incoherent Diffraction MTF -- 4.9 Applications of Diffraction Theory.
4.9.1 Frequency Analysis of Optical Systems -- 4.9.2 Application to Geometric Optics -- 4.9.3 PSF of Distributed Aperture -- 4.9.4 Optical Image Processing -- 4.9.5 Stellar Interferometry -- 4.9.6 Apodization -- 4.9.7 Detector MTF from the Fraunhofer Diffraction Pattern -- 4.10 Light Goes Around Corners: The Poisson Spot -- References -- Chapter 5 Sources of Radiation -- 5.1 Radiometry and Photometry -- 5.1.1 Radiometric Units -- 5.1.2 Photometric Units -- 5.2 Infrared Targets and Backgrounds -- 5.2.1 Blackbody Radiation -- 5.2.2 Emissivity -- 5.2.3 Equivalent Differential Temperature (Delta T) -- 5.2.4 Apparent Differential Temperature (Apparent Delta T) -- 5.3 EO Targets and Backgrounds -- 5.3.1 External Sources -- 5.3.2 Contrast -- 5.4 Other Sensitivity Considerations -- 5.4.1 Bidirectional Reflectance Distribution Function -- 5.4.2 Color Considerations -- 5.5 Target and Background Spatial Characteristics -- 5.5.1 Bar Target Representation of Targets -- 5.5.2 Target Delta T and Characteristic Dimension -- 5.5.3 Summary of Target Characteristics -- 5.5.4 Clutter -- 5.5.5 Simulation of Target Characteristics -- 5.6 Typical Mid-Wave and Long-Wave Contrasts and Solar Effects -- References -- Selected Bibliography -- Chapter 6 Atmospherics -- 6.1 Atmospheric Components and Structure -- 6.2 Atmospheric Transmission -- 6.3 Absorption -- 6.4 Scattering -- 6.5 Path Radiance -- 6.6 Turbulence -- 6.7 Atmospheric Modulation Transfer Function -- 6.8 Models and Tools -- 6.9 Model Background Discussion -- 6.10 Some Practical Considerations -- References -- Chapter 7 Optics -- 7.1 Light Representation and the Optical Path Length -- 7.2 Reflection and Snell's Law of Refraction -- 7.3 The Thin Lens, Ray-Tracing Rules, and Gauss's Equation -- 7.4 Spherical Mirrors -- 7.5 Modeling the Thick Lens -- 7.6 Vergence -- 7.7 Multiple-Lens Systems -- 7.8 FOV.
7.9 Resolution -- 7.10 Aperture Stop, Pupils, and Rays -- 7.11 f-Number and Numerical Aperture -- 7.12 Telescopes and Angular Magnification -- 7.13 MTF -- 7.14 Aberrations -- 7.15 Optical Materials -- 7.16 Cold Stop and Cold Shield -- 7.17 A Typical Optical System -- 7.18 Diffraction Blur -- References -- Chapter 8 Detectors -- 8.1 Types of Detectors -- 8.1.1 Photon Detectors -- 8.1.2 Photoconductors -- 8.1.3 Photovoltaic -- 8.1.4 Photoemissive -- 8.1.5 Thermal Detectors -- 8.1.6 Bolometers -- 8.1.7 Pyroelectric Detectors -- 8.2 CCD and ROIC -- 8.2.1 CCD -- 8.2.2 Multiplexed Analog Readout -- 8.2.3 Column ADC ROIC or D-ROIC -- 8.3 Detector Sensitivity Analysis -- 8.3.1 Quantum Efficiency -- 8.3.2 Responsivity -- 8.3.3 Sensitivity -- 8.3.4 Detector Angular Subtense -- 8.3.5 FPA and Detector Noise (Including Detector 1/f Noise) -- 8.3.6 Dark Current and Rule'07 -- 8.3.7 1/f Noise -- 8.3.8 Photon Shot Noise -- 8.3.9 FPA and ROIC Noise (Including Fixed Pattern Noise) in Staring Systems -- 8.3.10 BLIP -- 8.4 EO Systems: Staring and Scanning Configurations -- 8.4.1 Raster Scan Systems -- 8.4.2 Linear Scan and TDI -- 8.4.3 Staring Systems: Focal Plane Arrays -- 8.5 Detector Transfer Functions -- 8.6 EO Detectors: Materials and Technology -- 8.6.1 MWIR and LWIR Photon Detectors -- 8.6.2 Far Infrared: VLWIR -- 8.6.3 Uncooled Bolometer -- 8.6.4 Visible and NIR -- 8.7 New and Emerging Infrared Detector Technology -- 8.7.1 Ultra-Large-Format Arrays and Small Pitch -- 8.7.2 Dual-Band Detectors (Third Generation) -- 8.7.2 Dual-Band Detectors (Third Generation) -- 8.7.3 Direct Bond Hybridization -- 8.7.4 Advanced ROIC Technology and Digital Pixel -- 8.7.5 Next Generation Imagers -- 8.7.6 Avalanche Photodiodes, Laser Range Gating, and Active and PassiveDetectors -- References -- Chapter 9 Electronics -- 9.1 Detector Circuits.
9.2 Conversion of Spatial and Temporal Frequencies -- 9.3 Electronics Transfer Function -- 9.4 Noise -- 9.4.1 Johnson Noise -- 9.4.2 1/f Noise -- 9.4.3 Shot Noise -- 9.5 MTF Boost Filter -- 9.6 Digital Filter MTF -- 9.7 CCDs -- 9.8 Uniformity Correction or NUC -- 9.9 Design and Construction of Camera Electronics -- References -- Chapter 10 Image Processing -- 10.1 Basics of Sampling Theory -- 10.2 Applications of Image Filtering -- 10.2.1 Localized Contrast Enhancement -- 10.2.2 Boost Filtering -- 10.2.3 Sensor Design Considerations -- 10.3 Super-Resolution Image Reconstruction -- 10.3.1 Image Acquisition: Microdither Scanner Versus Natural Jitter -- 10.3.2 Subpixel Shift Estimation -- 10.3.3 Image Reconstruction -- 10.3.4 Example and Performance Estimates -- 10.4 Image Fusion -- 10.4.1 Fusion Algorithms -- 10.5 Scene-Based NUC -- 10.6 Deep Learning -- 10.6.1 Super-Resolution -- 10.6.2 Contrast Enhancement -- 10.6.3 Image Fusion -- 10.6.4 Scene-Based NUC -- 10.7 Summary -- References -- Chapter 11 Displays, Human Perception, and Automatic Target Recognizers -- 11.1 Displays -- 11.2 CRTs -- 11.2.1 CRT Example Results -- 11.3 LEDs -- 11.4 LCDs -- 11.5 Plasma Displays -- 11.6 Emerging Display Technologies -- 11.7 Sampling and Display Processing -- 11.8 Human Perception and the Human Eye -- 11.9 MTF of the Eye -- 11.10 CTF of the Eye -- 11.11 Automatic Target Recognition -- References -- Chapter 12 Historical Performance Models -- 12.1 Introduction -- 12.2 Johnson Model Fundamentals -- 12.3 The MRT Model -- 12.4 The First FLIRs and Models -- 12.5 Model Improvements for Resolution and Noise -- 12.6 Incorporating Eye Contrast Limitations -- 12.7 Model Improvement to Add Sampling -- 12.8 Other Improvements Prior to the TTP Metric -- 12.9 The TRM3 Model -- 12.10 Triangle Orientation Discrimination (TOD).
12.11 Imager Modeling, Measurement, and Field Performance -- References -- Chapter 13 Contrast Threshold and TTP Metric -- 13.1 CTF of the Naked Eye -- 13.2 CTF for the Eye-Display System -- 13.3 Validation of Eye-Display CTF -- 13.4 Eye-Display Contrast Threshold Model -- 13.4.1 Eye-Display Contrast Threshold Model -- 13.4.2 Define Functions -- 13.4.3 Define Input Parameters -- 13.4.4 Run the Program -- 13.4.5 Comparison with Existing Models -- 13.5 TTP Metric and Range Performance Mode -- 13.6 Guide to the References -- References -- Appendix 13A -- 13A.1 Direct Calculation of CTFeye-disp,h -- Chapter 14 EO and Infrared System Performance andTarget Acquisition -- 14.1 Sensitivity and Resolution -- 14.2 NETD -- 14.3 EO Noise and Noise Equivalent Irradiance -- 14.3.1 Noise Equivalent Irradiance -- 14.4 3-D Noise -- 14.5 MTF -- 14.6 MRTD (Including 2-D MRT) -- 14.6.1 2-D MRT -- 14.7 Target Acquisition with Limiting Frequency (Johnson's N50) -- 14.8 System CTF -- 14.9 Target Acquisition with the Target Task Performance (TTP)Metric (and Vollmerhausen's V50) -- 14.10 Target Sets -- 14.11 Classic ISR, NIIRS, and General Image Quality -- 14.11.1 NIIRS -- 14.11.2 GIQE Model -- 14.12 The Performance Benefits of Dual-Band Infrared Imagers -- 14.12.1 Dual-Band Imagers -- 14.12.2 Long-Range Target Detection and Identification -- 14.12.3 Imaging with Hot Targets in the FOV -- 14.12.4 Cold-Weather Performance -- 14.12.5 Imaging Through Turbulence -- 14.12.6 Imaging Through Fog-Oil Smoke -- 14.12.7 Target Contrast (Up Close) -- 14.12.8 ATR Performance -- 14.12.9 Motion Blur and Integration Time -- 14.12.10 Target Spectral Exploitation -- 14.12.11 Signal and Image Processing: Boost, Local Area Contrast Enhancement -- 14.12.12 Imaging Through Fog, High Humidity, Rain, Haze, Smoke, and Dust -- 14.12.13 Discussion -- 14.13 Small Detector Infrared Systems.
14.13.1 Small Detector Infrared System Fundamentals.
Record Nr. UNINA-9910795995603321
Driggers Ronald G.  
Boston, MA : , : Artech House, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, and John W. Devitt
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, and John W. Devitt
Autore Driggers Ronald G.
Edizione [Third edition.]
Pubbl/distr/stampa Boston, MA : , : Artech House, , [2022]
Descrizione fisica 1 online resource (739 pages)
Disciplina 621.36
Soggetto topico Electrooptical devices
Electrooptics
Infrared technology
Soggetto non controllato Optoelectronics
Technology & Engineering
ISBN 1-63081-833-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Introduction to Infrared and Electro-Optical Systems Third Edition -- Contents -- Preface -- Acknowledgments -- Chapter 1 Introduction -- 1.1 Introduction to Imaging -- 1.2 Infrared and EO Systems -- 1.3 Wavelength Dependencies -- 1.4 Typical EO Scenario -- 1.5 Typical Infrared Scenario -- 1.6 Analytical Parameters -- 1.7 Sensitivity and Resolution -- 1.8 Linear Systems Approach -- 1.9 Summary -- 1.10 Guide to the References -- References -- Chapter 2 Mathematics -- 2.1 Complex Functions -- 2.2 Common One-Dimensional Functions -- 2.3 The 2-D Functions -- 2.4 Convolution and Correlation -- 2.5 The Fourier Transform -- 2.6 Fourier Transform Properties -- 2.7 Transform Pairs and Delta Function Properties -- 2.8 Probability -- 2.9 Important Examples -- 2.10 Guide to the References -- References -- Selected Bibliography -- Software -- Chapter 3 Linear Shift-Invariant Systems -- 3.1 Linear Systems -- 3.2 Shift Invariance -- 3.3 Basics of LSI Systems -- 3.4 Impulse Response -- 3.5 Transfer Function -- 3.6 System PSF and MTF Versus Component PSF and MTF -- 3.7 Spatial Sampling -- 3.8 Spatial Sampling and Resolution -- 3.9 Sampled Imaging Systems -- 3.10 Guide to the References -- References -- Selected Bilbiography -- Chapter 4 Diffraction -- 4.1 Electromagnetic Waves -- 4.2 Coherence -- 4.3 Fresnel and Fraunhofer Diffraction from an Aperture -- 4.3.1 Fresnel Diffraction -- 4.3.2 Fraunhofer Diffraction -- 4.4 Fraunhofer Diffraction from a Thin Lens -- 4.5 Thin Lens Optical System Diffraction PSF -- 4.6 Thin Lens Diffraction MTF -- 4.6.1 Modulation and MTF -- 4.6.2 Incoherent Diffraction MTF -- 4.6.3 Coherent Diffraction MTF -- 4.7 Calculation of Diffraction MTF -- 4.7.1 Circular Pupil: Coherent MTF -- 4.7.2 Circular Pupil: Incoherent MTF -- 4.8 Programs for Calculating Incoherent Diffraction MTF -- 4.9 Applications of Diffraction Theory.
4.9.1 Frequency Analysis of Optical Systems -- 4.9.2 Application to Geometric Optics -- 4.9.3 PSF of Distributed Aperture -- 4.9.4 Optical Image Processing -- 4.9.5 Stellar Interferometry -- 4.9.6 Apodization -- 4.9.7 Detector MTF from the Fraunhofer Diffraction Pattern -- 4.10 Light Goes Around Corners: The Poisson Spot -- References -- Chapter 5 Sources of Radiation -- 5.1 Radiometry and Photometry -- 5.1.1 Radiometric Units -- 5.1.2 Photometric Units -- 5.2 Infrared Targets and Backgrounds -- 5.2.1 Blackbody Radiation -- 5.2.2 Emissivity -- 5.2.3 Equivalent Differential Temperature (Delta T) -- 5.2.4 Apparent Differential Temperature (Apparent Delta T) -- 5.3 EO Targets and Backgrounds -- 5.3.1 External Sources -- 5.3.2 Contrast -- 5.4 Other Sensitivity Considerations -- 5.4.1 Bidirectional Reflectance Distribution Function -- 5.4.2 Color Considerations -- 5.5 Target and Background Spatial Characteristics -- 5.5.1 Bar Target Representation of Targets -- 5.5.2 Target Delta T and Characteristic Dimension -- 5.5.3 Summary of Target Characteristics -- 5.5.4 Clutter -- 5.5.5 Simulation of Target Characteristics -- 5.6 Typical Mid-Wave and Long-Wave Contrasts and Solar Effects -- References -- Selected Bibliography -- Chapter 6 Atmospherics -- 6.1 Atmospheric Components and Structure -- 6.2 Atmospheric Transmission -- 6.3 Absorption -- 6.4 Scattering -- 6.5 Path Radiance -- 6.6 Turbulence -- 6.7 Atmospheric Modulation Transfer Function -- 6.8 Models and Tools -- 6.9 Model Background Discussion -- 6.10 Some Practical Considerations -- References -- Chapter 7 Optics -- 7.1 Light Representation and the Optical Path Length -- 7.2 Reflection and Snell's Law of Refraction -- 7.3 The Thin Lens, Ray-Tracing Rules, and Gauss's Equation -- 7.4 Spherical Mirrors -- 7.5 Modeling the Thick Lens -- 7.6 Vergence -- 7.7 Multiple-Lens Systems -- 7.8 FOV.
7.9 Resolution -- 7.10 Aperture Stop, Pupils, and Rays -- 7.11 f-Number and Numerical Aperture -- 7.12 Telescopes and Angular Magnification -- 7.13 MTF -- 7.14 Aberrations -- 7.15 Optical Materials -- 7.16 Cold Stop and Cold Shield -- 7.17 A Typical Optical System -- 7.18 Diffraction Blur -- References -- Chapter 8 Detectors -- 8.1 Types of Detectors -- 8.1.1 Photon Detectors -- 8.1.2 Photoconductors -- 8.1.3 Photovoltaic -- 8.1.4 Photoemissive -- 8.1.5 Thermal Detectors -- 8.1.6 Bolometers -- 8.1.7 Pyroelectric Detectors -- 8.2 CCD and ROIC -- 8.2.1 CCD -- 8.2.2 Multiplexed Analog Readout -- 8.2.3 Column ADC ROIC or D-ROIC -- 8.3 Detector Sensitivity Analysis -- 8.3.1 Quantum Efficiency -- 8.3.2 Responsivity -- 8.3.3 Sensitivity -- 8.3.4 Detector Angular Subtense -- 8.3.5 FPA and Detector Noise (Including Detector 1/f Noise) -- 8.3.6 Dark Current and Rule'07 -- 8.3.7 1/f Noise -- 8.3.8 Photon Shot Noise -- 8.3.9 FPA and ROIC Noise (Including Fixed Pattern Noise) in Staring Systems -- 8.3.10 BLIP -- 8.4 EO Systems: Staring and Scanning Configurations -- 8.4.1 Raster Scan Systems -- 8.4.2 Linear Scan and TDI -- 8.4.3 Staring Systems: Focal Plane Arrays -- 8.5 Detector Transfer Functions -- 8.6 EO Detectors: Materials and Technology -- 8.6.1 MWIR and LWIR Photon Detectors -- 8.6.2 Far Infrared: VLWIR -- 8.6.3 Uncooled Bolometer -- 8.6.4 Visible and NIR -- 8.7 New and Emerging Infrared Detector Technology -- 8.7.1 Ultra-Large-Format Arrays and Small Pitch -- 8.7.2 Dual-Band Detectors (Third Generation) -- 8.7.2 Dual-Band Detectors (Third Generation) -- 8.7.3 Direct Bond Hybridization -- 8.7.4 Advanced ROIC Technology and Digital Pixel -- 8.7.5 Next Generation Imagers -- 8.7.6 Avalanche Photodiodes, Laser Range Gating, and Active and PassiveDetectors -- References -- Chapter 9 Electronics -- 9.1 Detector Circuits.
9.2 Conversion of Spatial and Temporal Frequencies -- 9.3 Electronics Transfer Function -- 9.4 Noise -- 9.4.1 Johnson Noise -- 9.4.2 1/f Noise -- 9.4.3 Shot Noise -- 9.5 MTF Boost Filter -- 9.6 Digital Filter MTF -- 9.7 CCDs -- 9.8 Uniformity Correction or NUC -- 9.9 Design and Construction of Camera Electronics -- References -- Chapter 10 Image Processing -- 10.1 Basics of Sampling Theory -- 10.2 Applications of Image Filtering -- 10.2.1 Localized Contrast Enhancement -- 10.2.2 Boost Filtering -- 10.2.3 Sensor Design Considerations -- 10.3 Super-Resolution Image Reconstruction -- 10.3.1 Image Acquisition: Microdither Scanner Versus Natural Jitter -- 10.3.2 Subpixel Shift Estimation -- 10.3.3 Image Reconstruction -- 10.3.4 Example and Performance Estimates -- 10.4 Image Fusion -- 10.4.1 Fusion Algorithms -- 10.5 Scene-Based NUC -- 10.6 Deep Learning -- 10.6.1 Super-Resolution -- 10.6.2 Contrast Enhancement -- 10.6.3 Image Fusion -- 10.6.4 Scene-Based NUC -- 10.7 Summary -- References -- Chapter 11 Displays, Human Perception, and Automatic Target Recognizers -- 11.1 Displays -- 11.2 CRTs -- 11.2.1 CRT Example Results -- 11.3 LEDs -- 11.4 LCDs -- 11.5 Plasma Displays -- 11.6 Emerging Display Technologies -- 11.7 Sampling and Display Processing -- 11.8 Human Perception and the Human Eye -- 11.9 MTF of the Eye -- 11.10 CTF of the Eye -- 11.11 Automatic Target Recognition -- References -- Chapter 12 Historical Performance Models -- 12.1 Introduction -- 12.2 Johnson Model Fundamentals -- 12.3 The MRT Model -- 12.4 The First FLIRs and Models -- 12.5 Model Improvements for Resolution and Noise -- 12.6 Incorporating Eye Contrast Limitations -- 12.7 Model Improvement to Add Sampling -- 12.8 Other Improvements Prior to the TTP Metric -- 12.9 The TRM3 Model -- 12.10 Triangle Orientation Discrimination (TOD).
12.11 Imager Modeling, Measurement, and Field Performance -- References -- Chapter 13 Contrast Threshold and TTP Metric -- 13.1 CTF of the Naked Eye -- 13.2 CTF for the Eye-Display System -- 13.3 Validation of Eye-Display CTF -- 13.4 Eye-Display Contrast Threshold Model -- 13.4.1 Eye-Display Contrast Threshold Model -- 13.4.2 Define Functions -- 13.4.3 Define Input Parameters -- 13.4.4 Run the Program -- 13.4.5 Comparison with Existing Models -- 13.5 TTP Metric and Range Performance Mode -- 13.6 Guide to the References -- References -- Appendix 13A -- 13A.1 Direct Calculation of CTFeye-disp,h -- Chapter 14 EO and Infrared System Performance andTarget Acquisition -- 14.1 Sensitivity and Resolution -- 14.2 NETD -- 14.3 EO Noise and Noise Equivalent Irradiance -- 14.3.1 Noise Equivalent Irradiance -- 14.4 3-D Noise -- 14.5 MTF -- 14.6 MRTD (Including 2-D MRT) -- 14.6.1 2-D MRT -- 14.7 Target Acquisition with Limiting Frequency (Johnson's N50) -- 14.8 System CTF -- 14.9 Target Acquisition with the Target Task Performance (TTP)Metric (and Vollmerhausen's V50) -- 14.10 Target Sets -- 14.11 Classic ISR, NIIRS, and General Image Quality -- 14.11.1 NIIRS -- 14.11.2 GIQE Model -- 14.12 The Performance Benefits of Dual-Band Infrared Imagers -- 14.12.1 Dual-Band Imagers -- 14.12.2 Long-Range Target Detection and Identification -- 14.12.3 Imaging with Hot Targets in the FOV -- 14.12.4 Cold-Weather Performance -- 14.12.5 Imaging Through Turbulence -- 14.12.6 Imaging Through Fog-Oil Smoke -- 14.12.7 Target Contrast (Up Close) -- 14.12.8 ATR Performance -- 14.12.9 Motion Blur and Integration Time -- 14.12.10 Target Spectral Exploitation -- 14.12.11 Signal and Image Processing: Boost, Local Area Contrast Enhancement -- 14.12.12 Imaging Through Fog, High Humidity, Rain, Haze, Smoke, and Dust -- 14.12.13 Discussion -- 14.13 Small Detector Infrared Systems.
14.13.1 Small Detector Infrared System Fundamentals.
Record Nr. UNINA-9910808822603321
Driggers Ronald G.  
Boston, MA : , : Artech House, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, Jonathan Nichols
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, Jonathan Nichols
Autore Driggers Ronald G.
Edizione [Second edition.]
Pubbl/distr/stampa Boston ; , : Artech House, , ©2012
Descrizione fisica 1 online resource (600 p.)
Disciplina 600
Altri autori (Persone) FriedmanMelvin H
NicholsJonathan
Collana Artech optoelectronics and applied optics series
Artech House applied photonics series
Soggetto topico Infrared technology
Electrooptical devices
Soggetto genere / forma Electronic books.
ISBN 1-60807-101-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction to Infrared and Electro-Optical Systems; Contents; Preface; Chapter 1 Introduction; 1.1 Introduction to Imaging; 1.2 Infrared and EO Systems; 1.3 Wavelength Dependencies; 1.4 Typical EO Scenario; 1.5 Typical Infrared Scenario; 1.6 Analytical Parameters; 1.7 Sensitivity and Resolution; 1.8 Linear Systems Approach; 1.9 Summary; 1.10 Guide to the References; References; Chapter 2 Mathematics; 2.1 Complex Functions; 2.2 Common One-Dimensional Functions; 2.3 Two-Dimensional Functions; 2.4 Convolution and Correlation; 2.5 The Fourier Transform; 2.6 Properties of the Fourier Transform.
2.7 Transform Pairs2.8 Probability; 2.9 Important Examples; 2.10 Guide to the References; 2.11 Exercises; References; Software; Chapter 3 Linear Shift-Invariant Systems; 3.1 Linear Systems; 3.2 Shift Invariance; 3.3 Basics of LSI Systems; 3.4 Impulse Response; 3.5 Transfer Function; 3.6 System PSF and MTF Versus Component PSF and MTF; 3.7 Spatial Sampling; 3.8 Spatial Sampling and Resolution; 3.9 Sampled Imaging Systems; 3.10 Guide to the References; 3.11 Exercises; References; Chapter 4 Diffraction; 4.1 Electromagnetic Waves; 4.2 Coherence.
4.3 Fresnel and Fraunhofer Diffraction from an ApertureFresnel Diffraction; Fraunhofer Diffraction; 4.4 Fraunhofer Diffraction from a Thin Lens; 4.5 Thin Lens Optical System Diffraction Psf; 4.6 Thin Lens Diffraction Mtf; Modulation and Modulation Transfer Function; Incoherent Diffraction MTF; Coherent Diffraction MTF; 4.7 Calculating Diffraction Mtf with Pencil and Paper; Circular Pupil: Coherent MTF; Circular Pupil: Incoherent MTF; 4.8 Programs for Calculating Incoherent Diffraction Mtf; 4.9 Applications of Diffraction Theory; 4.10 Exercises; References; Chapter 5 Sources of Radiation.
5.1 Radiometry and PhotometryRadiometric Units; Photometric Units; 5.2 Infrared Targets and Backgrounds; Blackbody Radiation; Emissivity; Equivalent Differential Temperature (Delta T); Apparent Differential Temperature (Apparent Delta T); Technique 1: Temperature-Broadband Beer's Law Product; Technique 2: Temperature-Broadband Transmission as a Function of Range; Technique 3: Flux-Broadband Beer's Law Product; Technique 4: Flux-Temperature Differential; 5.3 Electro-Optical Targets and Backgrounds; External Sources; Contrast; 5.4 Other Sensitivity Considerations.
Bidirectional Reflectance Distribution FunctionColor Considerations; 5.5 Target and Background Spatial Characteristics; Bar Target Representation of Targets; Target Delta T and Characteristic Dimension; Summary of Target Characteristics; Clutter; Simulation of Target Characteristics; 5.6 Typical Midwave and Longwave Contrasts and Solar Effects; 5.7 Exercises; References; Chapter 6 Atmospherics; 6.1 Atmospheric Components and Structure; 6.2 Atmospheric Transmission; 6.3 Absorption; 6.4 Scattering; 6.5 Path Radiance; 6.6 Turbulence; 6.7 Atmospheric MTF; 6.8 Models; 6.9 Model Discussion.
Altri titoli varianti Infrared and electro-optical systems
Record Nr. UNINA-9910463419803321
Driggers Ronald G.  
Boston ; , : Artech House, , ©2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, Jonathan Nichols
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, Jonathan Nichols
Autore Driggers Ronald G.
Edizione [Second edition.]
Pubbl/distr/stampa Boston ; , : Artech House, , ©2012
Descrizione fisica 1 online resource (600 p.)
Disciplina 600
Altri autori (Persone) FriedmanMelvin H
NicholsJonathan
Collana Artech optoelectronics and applied optics series
Artech House applied photonics series
Soggetto topico Infrared technology
Electrooptical devices
ISBN 1-60807-101-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction to Infrared and Electro-Optical Systems; Contents; Preface; Chapter 1 Introduction; 1.1 Introduction to Imaging; 1.2 Infrared and EO Systems; 1.3 Wavelength Dependencies; 1.4 Typical EO Scenario; 1.5 Typical Infrared Scenario; 1.6 Analytical Parameters; 1.7 Sensitivity and Resolution; 1.8 Linear Systems Approach; 1.9 Summary; 1.10 Guide to the References; References; Chapter 2 Mathematics; 2.1 Complex Functions; 2.2 Common One-Dimensional Functions; 2.3 Two-Dimensional Functions; 2.4 Convolution and Correlation; 2.5 The Fourier Transform; 2.6 Properties of the Fourier Transform.
2.7 Transform Pairs2.8 Probability; 2.9 Important Examples; 2.10 Guide to the References; 2.11 Exercises; References; Software; Chapter 3 Linear Shift-Invariant Systems; 3.1 Linear Systems; 3.2 Shift Invariance; 3.3 Basics of LSI Systems; 3.4 Impulse Response; 3.5 Transfer Function; 3.6 System PSF and MTF Versus Component PSF and MTF; 3.7 Spatial Sampling; 3.8 Spatial Sampling and Resolution; 3.9 Sampled Imaging Systems; 3.10 Guide to the References; 3.11 Exercises; References; Chapter 4 Diffraction; 4.1 Electromagnetic Waves; 4.2 Coherence.
4.3 Fresnel and Fraunhofer Diffraction from an ApertureFresnel Diffraction; Fraunhofer Diffraction; 4.4 Fraunhofer Diffraction from a Thin Lens; 4.5 Thin Lens Optical System Diffraction Psf; 4.6 Thin Lens Diffraction Mtf; Modulation and Modulation Transfer Function; Incoherent Diffraction MTF; Coherent Diffraction MTF; 4.7 Calculating Diffraction Mtf with Pencil and Paper; Circular Pupil: Coherent MTF; Circular Pupil: Incoherent MTF; 4.8 Programs for Calculating Incoherent Diffraction Mtf; 4.9 Applications of Diffraction Theory; 4.10 Exercises; References; Chapter 5 Sources of Radiation.
5.1 Radiometry and PhotometryRadiometric Units; Photometric Units; 5.2 Infrared Targets and Backgrounds; Blackbody Radiation; Emissivity; Equivalent Differential Temperature (Delta T); Apparent Differential Temperature (Apparent Delta T); Technique 1: Temperature-Broadband Beer's Law Product; Technique 2: Temperature-Broadband Transmission as a Function of Range; Technique 3: Flux-Broadband Beer's Law Product; Technique 4: Flux-Temperature Differential; 5.3 Electro-Optical Targets and Backgrounds; External Sources; Contrast; 5.4 Other Sensitivity Considerations.
Bidirectional Reflectance Distribution FunctionColor Considerations; 5.5 Target and Background Spatial Characteristics; Bar Target Representation of Targets; Target Delta T and Characteristic Dimension; Summary of Target Characteristics; Clutter; Simulation of Target Characteristics; 5.6 Typical Midwave and Longwave Contrasts and Solar Effects; 5.7 Exercises; References; Chapter 6 Atmospherics; 6.1 Atmospheric Components and Structure; 6.2 Atmospheric Transmission; 6.3 Absorption; 6.4 Scattering; 6.5 Path Radiance; 6.6 Turbulence; 6.7 Atmospheric MTF; 6.8 Models; 6.9 Model Discussion.
Altri titoli varianti Infrared and electro-optical systems
Record Nr. UNINA-9910786162303321
Driggers Ronald G.  
Boston ; , : Artech House, , ©2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, Jonathan Nichols
Introduction to infrared and electro-optical systems / / Ronald G. Driggers, Melvin H. Friedman, Jonathan Nichols
Autore Driggers Ronald G.
Edizione [Second edition.]
Pubbl/distr/stampa Boston ; , : Artech House, , ©2012
Descrizione fisica 1 online resource (600 p.)
Disciplina 600
Altri autori (Persone) FriedmanMelvin H
NicholsJonathan
Collana Artech optoelectronics and applied optics series
Artech House applied photonics series
Soggetto topico Infrared technology
Electrooptical devices
ISBN 1-60807-101-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction to Infrared and Electro-Optical Systems; Contents; Preface; Chapter 1 Introduction; 1.1 Introduction to Imaging; 1.2 Infrared and EO Systems; 1.3 Wavelength Dependencies; 1.4 Typical EO Scenario; 1.5 Typical Infrared Scenario; 1.6 Analytical Parameters; 1.7 Sensitivity and Resolution; 1.8 Linear Systems Approach; 1.9 Summary; 1.10 Guide to the References; References; Chapter 2 Mathematics; 2.1 Complex Functions; 2.2 Common One-Dimensional Functions; 2.3 Two-Dimensional Functions; 2.4 Convolution and Correlation; 2.5 The Fourier Transform; 2.6 Properties of the Fourier Transform.
2.7 Transform Pairs2.8 Probability; 2.9 Important Examples; 2.10 Guide to the References; 2.11 Exercises; References; Software; Chapter 3 Linear Shift-Invariant Systems; 3.1 Linear Systems; 3.2 Shift Invariance; 3.3 Basics of LSI Systems; 3.4 Impulse Response; 3.5 Transfer Function; 3.6 System PSF and MTF Versus Component PSF and MTF; 3.7 Spatial Sampling; 3.8 Spatial Sampling and Resolution; 3.9 Sampled Imaging Systems; 3.10 Guide to the References; 3.11 Exercises; References; Chapter 4 Diffraction; 4.1 Electromagnetic Waves; 4.2 Coherence.
4.3 Fresnel and Fraunhofer Diffraction from an ApertureFresnel Diffraction; Fraunhofer Diffraction; 4.4 Fraunhofer Diffraction from a Thin Lens; 4.5 Thin Lens Optical System Diffraction Psf; 4.6 Thin Lens Diffraction Mtf; Modulation and Modulation Transfer Function; Incoherent Diffraction MTF; Coherent Diffraction MTF; 4.7 Calculating Diffraction Mtf with Pencil and Paper; Circular Pupil: Coherent MTF; Circular Pupil: Incoherent MTF; 4.8 Programs for Calculating Incoherent Diffraction Mtf; 4.9 Applications of Diffraction Theory; 4.10 Exercises; References; Chapter 5 Sources of Radiation.
5.1 Radiometry and PhotometryRadiometric Units; Photometric Units; 5.2 Infrared Targets and Backgrounds; Blackbody Radiation; Emissivity; Equivalent Differential Temperature (Delta T); Apparent Differential Temperature (Apparent Delta T); Technique 1: Temperature-Broadband Beer's Law Product; Technique 2: Temperature-Broadband Transmission as a Function of Range; Technique 3: Flux-Broadband Beer's Law Product; Technique 4: Flux-Temperature Differential; 5.3 Electro-Optical Targets and Backgrounds; External Sources; Contrast; 5.4 Other Sensitivity Considerations.
Bidirectional Reflectance Distribution FunctionColor Considerations; 5.5 Target and Background Spatial Characteristics; Bar Target Representation of Targets; Target Delta T and Characteristic Dimension; Summary of Target Characteristics; Clutter; Simulation of Target Characteristics; 5.6 Typical Midwave and Longwave Contrasts and Solar Effects; 5.7 Exercises; References; Chapter 6 Atmospherics; 6.1 Atmospheric Components and Structure; 6.2 Atmospheric Transmission; 6.3 Absorption; 6.4 Scattering; 6.5 Path Radiance; 6.6 Turbulence; 6.7 Atmospheric MTF; 6.8 Models; 6.9 Model Discussion.
Altri titoli varianti Infrared and electro-optical systems
Record Nr. UNINA-9910819246203321
Driggers Ronald G.  
Boston ; , : Artech House, , ©2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
LEOS 1993, Summer Topical Meeting Digest on Optical Microwave Interactions, July 19-21, 1993 ; Visible Semiconductor Lasers, July 21-22, 1993 ; Impact of Fiber Nonlinearities on Lightwave Systems, July 26-27, 1993 ; Hybrid Optoelectronic Integration and Pa
LEOS 1993, Summer Topical Meeting Digest on Optical Microwave Interactions, July 19-21, 1993 ; Visible Semiconductor Lasers, July 21-22, 1993 ; Impact of Fiber Nonlinearities on Lightwave Systems, July 26-27, 1993 ; Hybrid Optoelectronic Integration and Pa
Pubbl/distr/stampa [Place of publication not identified], : Institute of Electronics and Electrical Engineers, 1993
Disciplina 621.381/3
Soggetto topico Optoelectronic devices
Microwave optics
Microwave integrated circuits
Nonlinear optics
Electrooptical devices
Engineering & Applied Sciences
Applied Physics
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996209198903316
[Place of publication not identified], : Institute of Electronics and Electrical Engineers, 1993
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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Optical electronics : self-organized integration and applications / / by Tetsuzo Yoshimura
Optical electronics : self-organized integration and applications / / by Tetsuzo Yoshimura
Autore Yoshimura Tetsuzo
Edizione [First edition.]
Pubbl/distr/stampa Singapore : , : Pan Stanford Publishing, an imprint of Pan Stanford, , 2012
Descrizione fisica 1 online resource (396 p.)
Disciplina 621.36
Soggetto topico Electrooptical devices
Optical instruments - Data processing
Soggetto genere / forma Electronic books.
ISBN 0-429-06555-8
981-4364-08-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Contents; Preface; Chapter 1: Introduction; Chapter 2: From Electronics to Optical Electronics; Chapter 3: Analysis Tools for Optical Circuits; Chapter 4: Self-Organized Optical Waveguides:Theoretical Analysis; Chapter 5: Self-Organized Optical Waveguides:Experimental Demonstrations; Chapter 6: Optical Waveguide Films with VerticalMirrors; Chapter 7: 3-D Optical Circuits with Stacked Waveguide Films; Chapter 8: Heterogeneous Thin-Film Device Integration; Chapter 9: Optical Switches; Chapter 10: OE Hardware Built by Optical Electronics
Chapter 11: Integrated Solar Energy Conversion SystemsChapter 12: Future Challenges; Epilogue; Color Insert; Back Cover
Record Nr. UNINA-9910460734603321
Yoshimura Tetsuzo  
Singapore : , : Pan Stanford Publishing, an imprint of Pan Stanford, , 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
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