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Recent Stirling conversion technology developments and operational measurements at NASA Glenn Research Center [[electronic resource] /] / Salvatore M. Oriti and Nicholas A. Schifer ; prepared for the Seventh International Energy Conversion Engineering Conference (IECEC) sponsored by the American Institute of Aeronautics and Astronautics, Denver, Colorado, August 2-5, 2009
Recent Stirling conversion technology developments and operational measurements at NASA Glenn Research Center [[electronic resource] /] / Salvatore M. Oriti and Nicholas A. Schifer ; prepared for the Seventh International Energy Conversion Engineering Conference (IECEC) sponsored by the American Institute of Aeronautics and Astronautics, Denver, Colorado, August 2-5, 2009
Autore Oriti Salvatore M
Pubbl/distr/stampa Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , [2010]
Descrizione fisica 1 online resource (14 pages) : illustrations, color
Altri autori (Persone) SchiferNicholas A
Collana NASA/TM
Soggetto topico Stirling cycle
Acoustic emission
Signal detectors
Piston engines
Electromagnetic interference
Radioisotope heat sources
Stirling engines
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910699920703321
Oriti Salvatore M  
Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , [2010]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
RF analog impairments modeling for communication systems simulation [[electronic resource] ] : application to OFDM-based transceivers / / Lydi Smaini
RF analog impairments modeling for communication systems simulation [[electronic resource] ] : application to OFDM-based transceivers / / Lydi Smaini
Autore Smaini Lydi <1974->
Edizione [1st edition]
Pubbl/distr/stampa Chichester, West Sussex, : Wiley, 2012
Descrizione fisica 1 online resource (220 p.)
Disciplina 621.382
Soggetto topico Electromagnetic interference
Orthogonal frequency division multiplexing
Radio - Transmitter-receivers - Simulation methods
Signal integrity (Electronics)
Telecommunication systems - Simulation methods
ISBN 1-118-43887-6
1-283-64515-7
1-118-43804-3
1-118-43886-8
1-118-43888-4
Classificazione TEC008010
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Machine generated contents note: 1 Chapter 1: Introduction to Communication System- On-Chip, RF analog front-end, OFDM modulation, and performance metrics 1.1 Communication System-on-Chip 1.1.1 Introduction 1.1.2 CMOS technology 1.1.3 Coexistence Issues 1.2 RF Analog Front-End Overview 1.2.1 Introduction 1.2.2 Super-heterodyne transceiver 1.2.3 Homodyne transceiver 1.2.4 Low-IF transceiver 1.2.5 Analog baseband Filter order vs. ADC dynamic range 1.2.6 Digital compensation of RF Analog Front-End imperfections 1.3 OFDM modulation 1.3.1 OFDM as a Multicarrier modulation 1.3.2 Fourier Transform and Orthogonal Subcarriers 1.3.3 Channel estimation and equalization in frequency domain 1.3.4 Pilot-tones 1.3.5 Guard interval 1.3.6 Windowed OFDM 1.3.7 Adaptive Transmission 1.3.8 OFDMA for Multiple Access 1.3.9 Scalable OFDMA 1.3.10 OFDM digital baseband architecture 1.3.11 OFDM-based standards 1.4 SNR, EVM, and Eb/N0 definitions and relationship 1.4.1 Bit error rate 1.4.2 SNR vs. EVM 1.4.3 SNR vs. Eb/N0 1.4.4 Complex baseband representation 2 Chapter 2: RF Analog impairments description and modeling 2.1 Introduction 2.2 Thermal Noise 2.2.1 Additive White Gaussian Noise 2.2.2 Noise Figure and Sensitivity 2.2.3 Cascaded noise voltage in IC design 2.2.4 AWGN in simulations 2.2.5 Flicker Noise and AWGN modeling 2.3 Oscillator Phase Noise 2.3.1 Description and Impact on the system 2.3.2 Phase Noise Modeling in Frequency Domain 2.3.3 Simulation in Temporal Domain 2.3.4 SNR limitation due to the phase noise 2.3.5 Impact of phase noise in OFDM 2.4 Sampling jitter 2.4.1 Jitter definitions 2.4.2 Sampling jitter and phase noise relationship 2.4.3 SNR limitation due to sampling jitter 2.4.4 Impact of sampling jitter in OFDM 2.4.5 Sampling jitter modeling 2.5 Carrier Frequency Offset 2.5.1 Description 2.5.2 Impact of Carrier Frequency Offset in OFDM 2.6 Sampling Frequency Offset 2.6.1 Description 2.6.2 Impact of Sampling Frequency Offset in OFDM 2.7 I&Q mismatch 2.7.1 Description 2.7.2 IQ mismatch modeling 2.7.3 SNR limitation due to IQ mismatch 2.7.4 Impact of IQ mismatch in OFDM 2.8 DAC/ADC quantization noise and clipping 2.8.1 SNR limitation due to the quantization noise and clipping level 2.8.2 Impact of converter clipping level in OFDM 2.8.3 DAC and ADC dynamic range in OFDM 2.8.4 DAC and ADC modeling 2.9 IP2 and IP3: 2nd and 3rd Order non-linearities 2.9.1 Harmonics (Single-tone test) 2.9.2 Intermodulation Distortion (Two-tone test) 2.9.3 Receiver performance degradation due to the non-linearities 3 Chapter 3: Simulation of the RF Analog impairments impact on real OFDM-based transceivers performance 3.1 Introduction 3.2 WLAN and mobile WIMAX PHY overview 3.2.1 WLAN: Standard IEEE 802.11a/g 3.2.2 Mobile WiMAX: Standard IEEE 802.16e 3.3 Simulation bench overview 3.3.1 WiFi and WiMAX OFDM transceiver modeling 3.3.2 EVM estimation as performance metric 3.3.3 EVM vs. SNR simulations in AWGN channel 3.4 WiFi OFDM and mobile WiMAX signals PAPR 3.5 Transmitter impairments simulation 3.5.1 Introduction 3.5.2 DAC clipping and resolution 3.5.3 I&Q mismatch 3.5.4 RF oscillator phase noise 3.5.5 Power amplifier distortion 3.5.6 Transmitter complete simulation 3.6 Receiver impairments simulation 3.6.1 Introduction 3.6.2 Carrier Frequency Offset 3.6.3 Sampling Frequency Offset 3.6.4 Linearity: IIP2 and IIP3 3.6.5 I&Q mismatch 3.6.6 RF oscillator phase noise and reciprocal mixing 3.6.7 Sampling jitter 3.6.8 ADC clipping and resolution 3.6.9 Receiver complete simulation 3.7 Adaptive modulation illustration 3.8 Summary 4 Chapter 4: Digital Compensation of RF analog Impairments 4.1 Introduction 4.2 Carrier Frequency Offset Estimation and Correction 4.2.1 CFO estimation principle 4.2.2 CFO estimation in time domain 4.2.3 CFO estimation in frequency domain 4.2.4 CFO correction 4.3 Sampling Frequency Offset Estimation and Correction 4.3.1 SFO estimation principle 4.3.2 SFO estimation 4.3.3 SFO correction 4.3.4 Joint SFO and CFO estimation 4.4 IQ mismatch estimation and correction 4.4.1 Principle 4.4.2 Effect of the channel 4.4.3 Simulation results 4.5 Power Amplifier Linearization 4.5.1 Digital Predistortion Principle 4.5.2 Memory polynomial predistortion 4.5.3 Polynomial coefficients computation 4.5.4 Simulation results 4.6 Summary .
Record Nr. UNINA-9910141417103321
Smaini Lydi <1974->  
Chichester, West Sussex, : Wiley, 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
RF analog impairments modeling for communication systems simulation [[electronic resource] ] : application to OFDM-based transceivers / / Lydi Smaini
RF analog impairments modeling for communication systems simulation [[electronic resource] ] : application to OFDM-based transceivers / / Lydi Smaini
Autore Smaini Lydi <1974->
Edizione [1st edition]
Pubbl/distr/stampa Chichester, West Sussex, : Wiley, 2012
Descrizione fisica 1 online resource (220 p.)
Disciplina 621.382
Soggetto topico Electromagnetic interference
Orthogonal frequency division multiplexing
Radio - Transmitter-receivers - Simulation methods
Signal integrity (Electronics)
Telecommunication systems - Simulation methods
ISBN 1-118-43887-6
1-283-64515-7
1-118-43804-3
1-118-43886-8
1-118-43888-4
Classificazione TEC008010
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Machine generated contents note: 1 Chapter 1: Introduction to Communication System- On-Chip, RF analog front-end, OFDM modulation, and performance metrics 1.1 Communication System-on-Chip 1.1.1 Introduction 1.1.2 CMOS technology 1.1.3 Coexistence Issues 1.2 RF Analog Front-End Overview 1.2.1 Introduction 1.2.2 Super-heterodyne transceiver 1.2.3 Homodyne transceiver 1.2.4 Low-IF transceiver 1.2.5 Analog baseband Filter order vs. ADC dynamic range 1.2.6 Digital compensation of RF Analog Front-End imperfections 1.3 OFDM modulation 1.3.1 OFDM as a Multicarrier modulation 1.3.2 Fourier Transform and Orthogonal Subcarriers 1.3.3 Channel estimation and equalization in frequency domain 1.3.4 Pilot-tones 1.3.5 Guard interval 1.3.6 Windowed OFDM 1.3.7 Adaptive Transmission 1.3.8 OFDMA for Multiple Access 1.3.9 Scalable OFDMA 1.3.10 OFDM digital baseband architecture 1.3.11 OFDM-based standards 1.4 SNR, EVM, and Eb/N0 definitions and relationship 1.4.1 Bit error rate 1.4.2 SNR vs. EVM 1.4.3 SNR vs. Eb/N0 1.4.4 Complex baseband representation 2 Chapter 2: RF Analog impairments description and modeling 2.1 Introduction 2.2 Thermal Noise 2.2.1 Additive White Gaussian Noise 2.2.2 Noise Figure and Sensitivity 2.2.3 Cascaded noise voltage in IC design 2.2.4 AWGN in simulations 2.2.5 Flicker Noise and AWGN modeling 2.3 Oscillator Phase Noise 2.3.1 Description and Impact on the system 2.3.2 Phase Noise Modeling in Frequency Domain 2.3.3 Simulation in Temporal Domain 2.3.4 SNR limitation due to the phase noise 2.3.5 Impact of phase noise in OFDM 2.4 Sampling jitter 2.4.1 Jitter definitions 2.4.2 Sampling jitter and phase noise relationship 2.4.3 SNR limitation due to sampling jitter 2.4.4 Impact of sampling jitter in OFDM 2.4.5 Sampling jitter modeling 2.5 Carrier Frequency Offset 2.5.1 Description 2.5.2 Impact of Carrier Frequency Offset in OFDM 2.6 Sampling Frequency Offset 2.6.1 Description 2.6.2 Impact of Sampling Frequency Offset in OFDM 2.7 I&Q mismatch 2.7.1 Description 2.7.2 IQ mismatch modeling 2.7.3 SNR limitation due to IQ mismatch 2.7.4 Impact of IQ mismatch in OFDM 2.8 DAC/ADC quantization noise and clipping 2.8.1 SNR limitation due to the quantization noise and clipping level 2.8.2 Impact of converter clipping level in OFDM 2.8.3 DAC and ADC dynamic range in OFDM 2.8.4 DAC and ADC modeling 2.9 IP2 and IP3: 2nd and 3rd Order non-linearities 2.9.1 Harmonics (Single-tone test) 2.9.2 Intermodulation Distortion (Two-tone test) 2.9.3 Receiver performance degradation due to the non-linearities 3 Chapter 3: Simulation of the RF Analog impairments impact on real OFDM-based transceivers performance 3.1 Introduction 3.2 WLAN and mobile WIMAX PHY overview 3.2.1 WLAN: Standard IEEE 802.11a/g 3.2.2 Mobile WiMAX: Standard IEEE 802.16e 3.3 Simulation bench overview 3.3.1 WiFi and WiMAX OFDM transceiver modeling 3.3.2 EVM estimation as performance metric 3.3.3 EVM vs. SNR simulations in AWGN channel 3.4 WiFi OFDM and mobile WiMAX signals PAPR 3.5 Transmitter impairments simulation 3.5.1 Introduction 3.5.2 DAC clipping and resolution 3.5.3 I&Q mismatch 3.5.4 RF oscillator phase noise 3.5.5 Power amplifier distortion 3.5.6 Transmitter complete simulation 3.6 Receiver impairments simulation 3.6.1 Introduction 3.6.2 Carrier Frequency Offset 3.6.3 Sampling Frequency Offset 3.6.4 Linearity: IIP2 and IIP3 3.6.5 I&Q mismatch 3.6.6 RF oscillator phase noise and reciprocal mixing 3.6.7 Sampling jitter 3.6.8 ADC clipping and resolution 3.6.9 Receiver complete simulation 3.7 Adaptive modulation illustration 3.8 Summary 4 Chapter 4: Digital Compensation of RF analog Impairments 4.1 Introduction 4.2 Carrier Frequency Offset Estimation and Correction 4.2.1 CFO estimation principle 4.2.2 CFO estimation in time domain 4.2.3 CFO estimation in frequency domain 4.2.4 CFO correction 4.3 Sampling Frequency Offset Estimation and Correction 4.3.1 SFO estimation principle 4.3.2 SFO estimation 4.3.3 SFO correction 4.3.4 Joint SFO and CFO estimation 4.4 IQ mismatch estimation and correction 4.4.1 Principle 4.4.2 Effect of the channel 4.4.3 Simulation results 4.5 Power Amplifier Linearization 4.5.1 Digital Predistortion Principle 4.5.2 Memory polynomial predistortion 4.5.3 Polynomial coefficients computation 4.5.4 Simulation results 4.6 Summary .
Record Nr. UNINA-9910824578903321
Smaini Lydi <1974->  
Chichester, West Sussex, : Wiley, 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
RHETT2/EPDM Hall thruster propulsion system electromagnetic compatibility evaluation / / Charles J. Sarmiento [and three others]
RHETT2/EPDM Hall thruster propulsion system electromagnetic compatibility evaluation / / Charles J. Sarmiento [and three others]
Autore Sarmiento Charles J.
Pubbl/distr/stampa Cleveland, Ohio : , : National Aeronautics and Space Administration, Lewis Research Center, , December 1997
Descrizione fisica 1 online resource (8 pages) : illustrations
Collana NASA/TM
Soggetto topico Electromagnetic compatibility
Electric propulsion
Electromagnetic interference
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Russian Hall Electric Thruster Technology 2 Electric Propulsion Demonstration Module Hall thruster propulsion system electromagnetic compatibility evaluation
Record Nr. UNINA-9910705764403321
Sarmiento Charles J.  
Cleveland, Ohio : , : National Aeronautics and Space Administration, Lewis Research Center, , December 1997
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Satellite photoelectric sensing technology : communication, navigation and reconnaissance / / Jianjun Zhang, Jing Li
Satellite photoelectric sensing technology : communication, navigation and reconnaissance / / Jianjun Zhang, Jing Li
Autore Zhang Jianjun
Pubbl/distr/stampa Cham, Switzerland : , : Palgrave Macmillan, , [2022]
Descrizione fisica 1 online resource (168 pages)
Disciplina 629.46
Soggetto topico Artificial satellites - Equipment and supplies
Optical detectors
Electromagnetic interference
ISBN 3-030-89843-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910523793403321
Zhang Jianjun  
Cham, Switzerland : , : Palgrave Macmillan, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Signal integrity : applied electromagnetics and professional practice / / Samuel H. Russ
Signal integrity : applied electromagnetics and professional practice / / Samuel H. Russ
Autore Russ Samuel H.
Edizione [Second edition.]
Pubbl/distr/stampa Cham, Switzerland : , : Springer Nature Switzerland AG, , [2022]
Descrizione fisica 1 online resource (241 pages)
Disciplina 621.38224
Soggetto topico Electromagnetic interference
Signal integrity (Electronics)
Electromagnetism
ISBN 9783030869274
9783030869267
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910523727303321
Russ Samuel H.  
Cham, Switzerland : , : Springer Nature Switzerland AG, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Signal integrity and radiated emission of high-speed digital systems [[electronic resource] /] / Spartaco Caniggia, Francescaromana Maradei
Signal integrity and radiated emission of high-speed digital systems [[electronic resource] /] / Spartaco Caniggia, Francescaromana Maradei
Autore Caniggia Spartaco
Edizione [1st edition]
Pubbl/distr/stampa Chichester, U.K., : Wiley, 2008
Descrizione fisica 1 online resource (554 p.)
Disciplina 621.382/24
Altri autori (Persone) MaradeiFrancescaromana
Soggetto topico Electromagnetic interference
Digital electronics
Very high speed integrated circuits
Crosstalk
Signal processing
ISBN 1-282-01071-9
9786612010712
0-470-77287-5
0-470-77288-3
Classificazione 05.42
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto SIGNAL INTEGRITY ANDRADIATED EMISSIONOF HIGH-SPEED DIGITAL SYSTEMS; Contents; List of Examples; Foreword; Preface; 1 Introduction to Signal Integrity and Radiated Emission in a Digital System; 1.1 Power and Signal Integrity; 1.1.1 Power Distribution Network; 1.1.2 Signal Distribution Network; 1.1.3 Noise Limitations and Design for Characteristic Impedance; 1.2 Radiated Emission; 1.2.1 Definition of Radiated Emission Sources; 1.2.2 Radiated Emission Standards; 1.2.3 Radiated Emission from a Real System; 1.3 Signaling and Logic Devices; 1.3.1 Overshoot, Undershoot and Plateau
1.3.2 Noise Immunity1.3.3 Timing Parameters; 1.3.4 Eye Diagram; 1.4 Modeling Digital Systems; 1.4.1 Mathematical Tools; 1.4.2 Spice-Like Circuit Simulators; 1.4.3 Full-Wave Numerical Tools; 1.4.4 Professional Simulators; References; 2 High-Speed Digital Devices; 2.1 Input/Output Static Characteristic; 2.1.1 Current and Voltage Specifications; 2.1.2 Transistor-Transistor Logic (TTL) Devices; 2.1.3 Complementary Metal Oxide Semiconductor (CMOS) Devices; 2.1.4 Emitter-Coupled Logic (ECL) Devices; 2.1.5 Low-Voltage Differential Signal (LVDS) Devices
2.1.6 Logic Devices Powered and the Logic Level2.2 Dynamic Characteristics: Gate Delay and Rise and Fall Times; 2.3 Driver and Receiver Modeling; 2.3.1 Types of Driver Model; 2.3.2 Driver Switching Currents Path; 2.3.3 Driver Non-Linear Behavioral Model; 2.3.4 Receiver Non-Linear Behavioral Modeling; 2.4 I/O Buffer Information Specification (IBIS) Models; 2.4.1 Structure of an IBIS Model; 2.4.2 IBIS Models and Spice; References; 3 Inductance; 3.1 Loop Inductance; 3.1.1 Inductances of Coupled Loops; 3.1.2 Inductances of Thin Filamentary Circuits; 3.1.3 Equivalent Circuit of Two Coupled Loops
3.1.4 L Matrix of Two Coupled Conductors Having a Reference Return Conductor3.1.5 L Calculation of a Three-Conductor Wire-Type Line; 3.1.6 Frequency-Dependent Internal Inductance; 3.2 Partial Inductance; 3.2.1 Partial Inductances of Coupled Loops; 3.2.2 Flux Area of Partial Inductance of Thin Filamentary Segments; 3.2.3 Loop Inductance Decomposed into Partial Inductances; 3.2.4 Self and Mutual Partial Inductance; 3.2.5 Inductance Between Two Parallel Conductors; 3.2.6 Loop Inductance Matrix Calculation by Partial Inductances; 3.2.7 Partial Inductance Associated with a Finite Ground Plane
3.2.8 Solving Inductance Problems in PCBs3.3 Differential Mode and Common Mode Inductance; 3.3.1 Differential Mode Inductance; 3.3.2 Common Mode Inductance; References; 4 Capacitance; 4.1 Capacitance Between Conductors; 4.1.1 Definition of Capacitance; 4.1.2 Partial Capacitance and Capacitance Matrix of Two Coupled Conductors Having a Reference Return Conductor; 4.1.3 Capacitance Matrix of n Coupled Conductors Having a Reference Return Conductor; 4.2 Differential Mode and Common Mode Capacitance; 4.2.1 Differential Mode Capacitance; 4.2.2 Common Mode Capacitance; References
5 Reflection on Signal Lines
Record Nr. UNINA-9910144378903321
Caniggia Spartaco  
Chichester, U.K., : Wiley, 2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Signal integrity and radiated emission of high-speed digital systems [[electronic resource] /] / Spartaco Caniggia, Francescaromana Maradei
Signal integrity and radiated emission of high-speed digital systems [[electronic resource] /] / Spartaco Caniggia, Francescaromana Maradei
Autore Caniggia Spartaco
Edizione [1st edition]
Pubbl/distr/stampa Chichester, U.K., : Wiley, 2008
Descrizione fisica 1 online resource (554 p.)
Disciplina 621.382/24
Altri autori (Persone) MaradeiFrancescaromana
Soggetto topico Electromagnetic interference
Digital electronics
Very high speed integrated circuits
Crosstalk
Signal processing
ISBN 1-282-01071-9
9786612010712
0-470-77287-5
0-470-77288-3
Classificazione 05.42
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto SIGNAL INTEGRITY ANDRADIATED EMISSIONOF HIGH-SPEED DIGITAL SYSTEMS; Contents; List of Examples; Foreword; Preface; 1 Introduction to Signal Integrity and Radiated Emission in a Digital System; 1.1 Power and Signal Integrity; 1.1.1 Power Distribution Network; 1.1.2 Signal Distribution Network; 1.1.3 Noise Limitations and Design for Characteristic Impedance; 1.2 Radiated Emission; 1.2.1 Definition of Radiated Emission Sources; 1.2.2 Radiated Emission Standards; 1.2.3 Radiated Emission from a Real System; 1.3 Signaling and Logic Devices; 1.3.1 Overshoot, Undershoot and Plateau
1.3.2 Noise Immunity1.3.3 Timing Parameters; 1.3.4 Eye Diagram; 1.4 Modeling Digital Systems; 1.4.1 Mathematical Tools; 1.4.2 Spice-Like Circuit Simulators; 1.4.3 Full-Wave Numerical Tools; 1.4.4 Professional Simulators; References; 2 High-Speed Digital Devices; 2.1 Input/Output Static Characteristic; 2.1.1 Current and Voltage Specifications; 2.1.2 Transistor-Transistor Logic (TTL) Devices; 2.1.3 Complementary Metal Oxide Semiconductor (CMOS) Devices; 2.1.4 Emitter-Coupled Logic (ECL) Devices; 2.1.5 Low-Voltage Differential Signal (LVDS) Devices
2.1.6 Logic Devices Powered and the Logic Level2.2 Dynamic Characteristics: Gate Delay and Rise and Fall Times; 2.3 Driver and Receiver Modeling; 2.3.1 Types of Driver Model; 2.3.2 Driver Switching Currents Path; 2.3.3 Driver Non-Linear Behavioral Model; 2.3.4 Receiver Non-Linear Behavioral Modeling; 2.4 I/O Buffer Information Specification (IBIS) Models; 2.4.1 Structure of an IBIS Model; 2.4.2 IBIS Models and Spice; References; 3 Inductance; 3.1 Loop Inductance; 3.1.1 Inductances of Coupled Loops; 3.1.2 Inductances of Thin Filamentary Circuits; 3.1.3 Equivalent Circuit of Two Coupled Loops
3.1.4 L Matrix of Two Coupled Conductors Having a Reference Return Conductor3.1.5 L Calculation of a Three-Conductor Wire-Type Line; 3.1.6 Frequency-Dependent Internal Inductance; 3.2 Partial Inductance; 3.2.1 Partial Inductances of Coupled Loops; 3.2.2 Flux Area of Partial Inductance of Thin Filamentary Segments; 3.2.3 Loop Inductance Decomposed into Partial Inductances; 3.2.4 Self and Mutual Partial Inductance; 3.2.5 Inductance Between Two Parallel Conductors; 3.2.6 Loop Inductance Matrix Calculation by Partial Inductances; 3.2.7 Partial Inductance Associated with a Finite Ground Plane
3.2.8 Solving Inductance Problems in PCBs3.3 Differential Mode and Common Mode Inductance; 3.3.1 Differential Mode Inductance; 3.3.2 Common Mode Inductance; References; 4 Capacitance; 4.1 Capacitance Between Conductors; 4.1.1 Definition of Capacitance; 4.1.2 Partial Capacitance and Capacitance Matrix of Two Coupled Conductors Having a Reference Return Conductor; 4.1.3 Capacitance Matrix of n Coupled Conductors Having a Reference Return Conductor; 4.2 Differential Mode and Common Mode Capacitance; 4.2.1 Differential Mode Capacitance; 4.2.2 Common Mode Capacitance; References
5 Reflection on Signal Lines
Record Nr. UNINA-9910822567603321
Caniggia Spartaco  
Chichester, U.K., : Wiley, 2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Small radioisotope power system testing at NASA Glenn Research Center / / Gina Dugala [and five others]
Small radioisotope power system testing at NASA Glenn Research Center / / Gina Dugala [and five others]
Autore Dugala Gina
Pubbl/distr/stampa Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , November 2013
Descrizione fisica 1 online resource (21 pages) : illustrations
Collana NASA/TM
Soggetto topico Stirling cycle
Radioisotope heat sources
Energy conversion
Vibration tests
Lunar surface
Electromagnetic interference
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910703503703321
Dugala Gina  
Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , November 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space power facility : capabilities for space environmental testing within a single facility / / Richard N. Sorge
Space power facility : capabilities for space environmental testing within a single facility / / Richard N. Sorge
Autore Sorge Richard N.
Pubbl/distr/stampa Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , 2013
Descrizione fisica 1 online resource (2 Volumes) : color illustrations
Collana NASA/TM
Soggetto topico Electromagnetic interference
Environmental tests
Sine waves
Acoustics
Test facilities
Sound waves
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Space power facility
Record Nr. UNINA-9910705252503321
Sorge Richard N.  
Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui