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Biblioteca

MARC Lista (tabellare)
Analysis of the Honeywell uncertified research engine (HURE) with ice crystal cloud ingestion as simulated altitudes : public version / / Philip C.E. Jorgenson [and three others]
Analysis of the Honeywell uncertified research engine (HURE) with ice crystal cloud ingestion as simulated altitudes : public version / / Philip C.E. Jorgenson [and three others]
Autore Jorgenson Philip C. E (Philip Charles Eberhardt)
Pubbl/distr/stampa Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , November 2018
Descrizione fisica 1 online resource (v, 43 pages) : illustrations (mostly color)
Collana NASA/TM
Soggetto topico Crystals
Compressors
Ice formation
Turbofan engines
Thermodynamics
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Analysis of the Honeywell uncertified research engine
Record Nr. UNINA-9910711661203321
Jorgenson Philip C. E (Philip Charles Eberhardt)  
Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , November 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Atomic diffusion in semiconductors / edited by D. Shaw
Atomic diffusion in semiconductors / edited by D. Shaw
Autore Shaw, D.
Pubbl/distr/stampa New York : Plenum Press, 1973
Descrizione fisica xiii, 607 p. : ill. ; 24 cm.
Soggetto topico Crystals
Semiconductors
Classificazione 53.7.6
53.8.1
53.8.2
537.6'22
QC611.6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991000826479707536
Shaw, D.  
New York : Plenum Press, 1973
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Combined analysis [[electronic resource] /] / Daniel Chateigner
Combined analysis [[electronic resource] /] / Daniel Chateigner
Autore Chateigner Daniel
Edizione [1st edition]
Pubbl/distr/stampa London, U.K., : ISTE
Descrizione fisica 1 online resource (517 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico Analytical chemistry
Solid state chemistry
Crystals
ISBN 1-118-62264-2
1-118-62250-2
1-299-31555-0
1-118-62271-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards
1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength
2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures
Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.2.1. Pole figures and orientation spaces
Record Nr. UNINA-9910139243703321
Chateigner Daniel  
London, U.K., : ISTE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Combined analysis [[electronic resource] /] / Daniel Chateigner
Combined analysis [[electronic resource] /] / Daniel Chateigner
Autore Chateigner Daniel
Edizione [1st edition]
Pubbl/distr/stampa London, U.K., : ISTE
Descrizione fisica 1 online resource (517 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico Analytical chemistry
Solid state chemistry
Crystals
ISBN 1-118-62264-2
1-118-62250-2
1-299-31555-0
1-118-62271-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards
1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength
2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures
Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.2.1. Pole figures and orientation spaces
Record Nr. UNINA-9910830141803321
Chateigner Daniel  
London, U.K., : ISTE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Combined analysis [[electronic resource] /] / Daniel Chateigner
Combined analysis [[electronic resource] /] / Daniel Chateigner
Autore Chateigner Daniel
Edizione [1st edition]
Pubbl/distr/stampa London, U.K., : ISTE
Descrizione fisica 1 online resource (517 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico Analytical chemistry
Solid state chemistry
Crystals
ISBN 1-118-62264-2
1-118-62250-2
1-299-31555-0
1-118-62271-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards
1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength
2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures
Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.2.1. Pole figures and orientation spaces
Record Nr. UNINA-9910841539003321
Chateigner Daniel  
London, U.K., : ISTE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Complex metallic alloys [[electronic resource] ] : fundamentals and applications / / edited by Jean-Marie Dubois and Esther Belin-Ferré
Complex metallic alloys [[electronic resource] ] : fundamentals and applications / / edited by Jean-Marie Dubois and Esther Belin-Ferré
Edizione [4th ed.]
Pubbl/distr/stampa Weinheim [Germany], : Wiley-VCH, 2011
Descrizione fisica 1 online resource (435 p.)
Disciplina 546.31
Altri autori (Persone) DuboisJean-Marie
Belin-FerréEsther
Soggetto topico Alloys
Crystals
ISBN 1-282-94454-1
9786612944543
3-527-63304-9
3-527-63271-9
3-527-63272-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Complex Metallic Alloys: Fundamentals and Applications; Foreword; Contents; Preface; List of Contributors; 1 Introduction to the Science of Complex Metallic Alloys; 2 Properties of CMAs: Theory and Experiments; 3 Anisotropic Physical Properties of Complex Metallic Alloys; 4 Surface Science of Complex Metallic Alloys; 5 Metallurgy of Complex Metallic Alloys; 6 Surface Chemistry of CMAs; 7 Mechanical Engineering Properties of CMAs; 8 CMA's as Magnetocaloric Materials; 9 Recent Progress in the Development of Thermoelectric Materials with Complex Crystal Structures
10 Complex Metallic Phases in CatalysisIndex
Record Nr. UNINA-9910140879103321
Weinheim [Germany], : Wiley-VCH, 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Complex metallic alloys [[electronic resource] ] : fundamentals and applications / / edited by Jean-Marie Dubois and Esther Belin-Ferré
Complex metallic alloys [[electronic resource] ] : fundamentals and applications / / edited by Jean-Marie Dubois and Esther Belin-Ferré
Edizione [4th ed.]
Pubbl/distr/stampa Weinheim [Germany], : Wiley-VCH, 2011
Descrizione fisica 1 online resource (435 p.)
Disciplina 546.31
Altri autori (Persone) DuboisJean-Marie
Belin-FerréEsther
Soggetto topico Alloys
Crystals
ISBN 1-282-94454-1
9786612944543
3-527-63304-9
3-527-63271-9
3-527-63272-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Complex Metallic Alloys: Fundamentals and Applications; Foreword; Contents; Preface; List of Contributors; 1 Introduction to the Science of Complex Metallic Alloys; 2 Properties of CMAs: Theory and Experiments; 3 Anisotropic Physical Properties of Complex Metallic Alloys; 4 Surface Science of Complex Metallic Alloys; 5 Metallurgy of Complex Metallic Alloys; 6 Surface Chemistry of CMAs; 7 Mechanical Engineering Properties of CMAs; 8 CMA's as Magnetocaloric Materials; 9 Recent Progress in the Development of Thermoelectric Materials with Complex Crystal Structures
10 Complex Metallic Phases in CatalysisIndex
Record Nr. UNINA-9910830210503321
Weinheim [Germany], : Wiley-VCH, 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Complex metallic alloys [[electronic resource] ] : fundamentals and applications / / edited by Jean-Marie Dubois and Esther Belin-Ferré
Complex metallic alloys [[electronic resource] ] : fundamentals and applications / / edited by Jean-Marie Dubois and Esther Belin-Ferré
Edizione [4th ed.]
Pubbl/distr/stampa Weinheim [Germany], : Wiley-VCH, 2011
Descrizione fisica 1 online resource (435 p.)
Disciplina 546.31
Altri autori (Persone) DuboisJean-Marie
Belin-FerréEsther
Soggetto topico Alloys
Crystals
ISBN 1-282-94454-1
9786612944543
3-527-63304-9
3-527-63271-9
3-527-63272-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Complex Metallic Alloys: Fundamentals and Applications; Foreword; Contents; Preface; List of Contributors; 1 Introduction to the Science of Complex Metallic Alloys; 2 Properties of CMAs: Theory and Experiments; 3 Anisotropic Physical Properties of Complex Metallic Alloys; 4 Surface Science of Complex Metallic Alloys; 5 Metallurgy of Complex Metallic Alloys; 6 Surface Chemistry of CMAs; 7 Mechanical Engineering Properties of CMAs; 8 CMA's as Magnetocaloric Materials; 9 Recent Progress in the Development of Thermoelectric Materials with Complex Crystal Structures
10 Complex Metallic Phases in CatalysisIndex
Record Nr. UNINA-9910841733203321
Weinheim [Germany], : Wiley-VCH, 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Crystal data : version 1.0 database specifications / / J. K. Stalick
Crystal data : version 1.0 database specifications / / J. K. Stalick
Autore Stalick J. K
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986
Descrizione fisica 1 online resource
Altri autori (Persone) StalickJ. K
Collana NBS technical note
Soggetto topico Crystallography
Crystals
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Crystal data
Record Nr. UNINA-9910711220203321
Stalick J. K  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Crystal engineering
Crystal engineering
Pubbl/distr/stampa Oxford, : Pergamon Press
Soggetto topico Crystals
Crystal growth
Crystallography
Cristaux
Cristaux - Croissance
Cristallographie
Soggetto genere / forma Periodicals.
ISSN 1879-2413
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Record Nr. UNISA-996206278403316
Oxford, : Pergamon Press
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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