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An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2010 |
| Descrizione fisica | 1 online resource (590 p.) |
| Disciplina | 621.381548 |
| Altri autori (Persone) | WerkmannHubert |
| Collana | Artech House microwave library |
| Soggetto topico |
Very high speed integrated circuits
Automatic test equipment |
| ISBN | 1-60783-984-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC
E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index |
| Altri titoli varianti | Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910827729403321 |
Moreira José <1975->
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| Boston : , : Artech House, , ©2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings
| ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1993 |
| Disciplina | 621.381028/7 |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202590703316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEC 61671:2012(E) : Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML / / IEEE
| IEC 61671:2012(E) : Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2012 |
| Descrizione fisica | 1 online resource (391 pages) |
| Disciplina | 621.381548 |
| Collana | IEEE Std |
| Soggetto topico |
Automatic test equipment
XML (Document markup language) |
| ISBN | 0-7381-7297-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
61671-2012 - IEC 61671
IEC 61671:2012(E) (IEEE Std 1671-2010): IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML IEC 61671 |
| Record Nr. | UNINA-9910135766303321 |
| Piscataway, NJ : , : IEEE, , 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEC 61671:2012(E) : Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML / / IEEE
| IEC 61671:2012(E) : Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2012 |
| Descrizione fisica | 1 online resource (391 pages) |
| Disciplina | 621.381548 |
| Collana | IEEE Std |
| Soggetto topico |
Automatic test equipment
XML (Document markup language) |
| ISBN | 0-7381-7297-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
61671-2012 - IEC 61671
IEC 61671:2012(E) (IEEE Std 1671-2010): IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML IEC 61671 |
| Record Nr. | UNISA-996279346403316 |
| Piscataway, NJ : , : IEEE, , 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE C37.09a-1991 (Supplement to IEEE C37.09-1979) : Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis / / IEEE
| IEEE C37.09a-1991 (Supplement to IEEE C37.09-1979) : Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1991 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3 |
| Soggetto topico | Automatic test equipment |
| ISBN | 0-7381-2594-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IEEE C37.09a-1991: Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis
IEEE C37.09a-1991 |
| Record Nr. | UNINA-9910147059003321 |
| Piscataway, NJ : , : IEEE, , 1991 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE C37.09a-1991 (Supplement to IEEE C37.09-1979) : Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis / / IEEE
| IEEE C37.09a-1991 (Supplement to IEEE C37.09-1979) : Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1991 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3 |
| Soggetto topico | Automatic test equipment |
| ISBN | 0-7381-2594-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IEEE C37.09a-1991: Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis
IEEE C37.09a-1991 |
| Record Nr. | UNISA-996280653103316 |
| Piscataway, NJ : , : IEEE, , 1991 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE Circuits and Systems International Conference on Testing and Diagnosis : ICTD
| IEEE Circuits and Systems International Conference on Testing and Diagnosis : ICTD |
| Pubbl/distr/stampa | [Piscataway, N.J.], : IEEE |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic circuits - Testing
Computer programs - Testing Automatic test equipment |
| Soggetto genere / forma | Conference papers and proceedings. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280220803316 |
| [Piscataway, N.J.], : IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description : Redline / / IEEE
| IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description : Redline / / IEEE |
| Edizione | [(Revision of IEEE Std 1671.5-2008).] |
| Pubbl/distr/stampa | Piscataway, N.J. : , : IEEE, , 2015 |
| Descrizione fisica | 1 online resource (52 pages) |
| Disciplina | 620.0 |
| Soggetto topico | Automatic test equipment |
| ISBN | 0-7381-9824-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1671.5-2015 - IEEE Standard for Automatic Test Markup Language
IEEE Std 1671.5-2015 (Revision of IEEE Std 1671.5-2008) - Redline: IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline IEEE Standard for Automatic Test Markup Language IEEE Std 1671.5-2015 |
| Record Nr. | UNINA-9910135874403321 |
| Piscataway, N.J. : , : IEEE, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description / / IEEE
| IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description / / IEEE |
| Edizione | [(Revision of IEEE Std 1671.5-2008).] |
| Pubbl/distr/stampa | New York, N.Y. : , : IEEE, , 2015 |
| Descrizione fisica | 1 online resource (viii, 17 pages) : illustrations |
| Disciplina | 620.0 |
| Soggetto topico | Automatic test equipment |
| ISBN | 0-7381-9622-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1671.5-2015 - IEEE Standard for Automatic Test Markup Language
IEEE Std 1671.5-2015 (Revision of IEEE Std 1671.5-2008): IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description IEEE Standard for Automatic Test Markup Language IEEE Std 1671.5-2015 |
| Record Nr. | UNINA-9910135874603321 |
| New York, N.Y. : , : IEEE, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description / / IEEE
| IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description / / IEEE |
| Edizione | [(Revision of IEEE Std 1671.5-2008).] |
| Pubbl/distr/stampa | New York, N.Y. : , : IEEE, , 2015 |
| Descrizione fisica | 1 online resource (viii, 17 pages) : illustrations |
| Disciplina | 620.0 |
| Soggetto topico | Automatic test equipment |
| ISBN | 0-7381-9622-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1671.5-2015 - IEEE Standard for Automatic Test Markup Language
IEEE Std 1671.5-2015 (Revision of IEEE Std 1671.5-2008): IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description IEEE Standard for Automatic Test Markup Language IEEE Std 1671.5-2015 |
| Record Nr. | UNISA-996278284503316 |
| New York, N.Y. : , : IEEE, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
