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A designer's guide to built-in self-test [[electronic resource] /] / Charles E. Stroud
| A designer's guide to built-in self-test [[electronic resource] /] / Charles E. Stroud |
| Autore | Stroud Charles E |
| Edizione | [1st ed. 2002.] |
| Pubbl/distr/stampa | Boston, : Kluwer Academic Publishers, c2002 |
| Descrizione fisica | 1 online resource (340 p.) |
| Disciplina | 621.381 |
| Collana | Frontiers in electronic testing |
| Soggetto topico |
Electronic apparatus and appliances - Testing
Electronic apparatus and appliances - Design and construction Automatic test equipment |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-20826-0
9786610208265 0-306-47504-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | An Overview of BIST -- Fault Models, Detection, and Simulation -- Design for Testability -- Test Pattern Generation -- Output Response Analysis -- Manufacturing and System-Level Use of BIST -- Built-In Logic Block Observer -- Pseudo-Exhaustive BIST -- Circular BIST -- Scan-Based BIST -- Non-Intrusive BIST -- BIST for Regular Structures -- BIST for FPGAs and CPLDs -- Applying Digital BIST to Mixed-Signal Systems -- Merging BIST and Concurrent Fault Detection. |
| Record Nr. | UNINA-9910450620103321 |
Stroud Charles E
|
||
| Boston, : Kluwer Academic Publishers, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A designer's guide to built-in self-test [[electronic resource] /] / Charles E. Stroud
| A designer's guide to built-in self-test [[electronic resource] /] / Charles E. Stroud |
| Autore | Stroud Charles E |
| Edizione | [1st ed. 2002.] |
| Pubbl/distr/stampa | Boston, : Kluwer Academic Publishers, c2002 |
| Descrizione fisica | 1 online resource (340 p.) |
| Disciplina | 621.381 |
| Collana | Frontiers in electronic testing |
| Soggetto topico |
Electronic apparatus and appliances - Testing
Electronic apparatus and appliances - Design and construction Automatic test equipment |
| ISBN |
1-280-20826-0
9786610208265 0-306-47504-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | An Overview of BIST -- Fault Models, Detection, and Simulation -- Design for Testability -- Test Pattern Generation -- Output Response Analysis -- Manufacturing and System-Level Use of BIST -- Built-In Logic Block Observer -- Pseudo-Exhaustive BIST -- Circular BIST -- Scan-Based BIST -- Non-Intrusive BIST -- BIST for Regular Structures -- BIST for FPGAs and CPLDs -- Applying Digital BIST to Mixed-Signal Systems -- Merging BIST and Concurrent Fault Detection. |
| Record Nr. | UNINA-9910783252403321 |
|
Stroud Charles E
|
||
| Boston, : Kluwer Academic Publishers, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A designer's guide to built-in self-test [[electronic resource] /] / Charles E. Stroud
| A designer's guide to built-in self-test [[electronic resource] /] / Charles E. Stroud |
| Autore | Stroud Charles E |
| Edizione | [1st ed. 2002.] |
| Pubbl/distr/stampa | Boston, : Kluwer Academic Publishers, c2002 |
| Descrizione fisica | 1 online resource (340 p.) |
| Disciplina | 621.381 |
| Collana | Frontiers in electronic testing |
| Soggetto topico |
Electronic apparatus and appliances - Testing
Electronic apparatus and appliances - Design and construction Automatic test equipment |
| ISBN |
1-280-20826-0
9786610208265 0-306-47504-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | An Overview of BIST -- Fault Models, Detection, and Simulation -- Design for Testability -- Test Pattern Generation -- Output Response Analysis -- Manufacturing and System-Level Use of BIST -- Built-In Logic Block Observer -- Pseudo-Exhaustive BIST -- Circular BIST -- Scan-Based BIST -- Non-Intrusive BIST -- BIST for Regular Structures -- BIST for FPGAs and CPLDs -- Applying Digital BIST to Mixed-Signal Systems -- Merging BIST and Concurrent Fault Detection. |
| Record Nr. | UNINA-9910819785703321 |
|
Stroud Charles E
|
||
| Boston, : Kluwer Academic Publishers, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
| Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1993 |
| Disciplina | 621.3815/028/7 |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996209192203316 |
| [Place of publication not identified], : The Conference, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
| Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1992 |
| Disciplina | 621.3815/028/7 |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211917403316 |
| [Place of publication not identified], : The Conference, 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , [2016] |
| Descrizione fisica | 1 online resource (709 pages) : illustrations |
| Disciplina | 621.3815 |
| Collana | Artech House microwave library |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment Very high speed integrated circuits |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-60807-986-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. |
| Altri titoli varianti |
Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910466018103321 |
|
Moreira José <1975->
|
||
| Norwood, Massachusetts : , : Artech House, , [2016] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , [2016] |
| Descrizione fisica | 1 online resource (709 pages) : illustrations |
| Disciplina | 621.3815 |
| Collana | Artech House microwave library |
| Soggetto topico |
Equip de test automàtic
Circuits integrats - Proves Circuits integrats d'alta velocitat - Proves Integrated circuits - Testing Automatic test equipment Very high speed integrated circuits |
| ISBN |
9781608079865
1-5231-4621-4 1-60807-986-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. |
| Altri titoli varianti |
Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910792713303321 |
|
Moreira José <1975->
|
||
| Norwood, Massachusetts : , : Artech House, , [2016] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , [2016] |
| Descrizione fisica | 1 online resource (709 pages) : illustrations |
| Disciplina | 621.3815 |
| Collana | Artech House microwave library |
| Soggetto topico |
Equip de test automàtic
Circuits integrats - Proves Circuits integrats d'alta velocitat - Proves Integrated circuits - Testing Automatic test equipment Very high speed integrated circuits |
| ISBN |
9781608079865
1-5231-4621-4 1-60807-986-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards.
3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. |
| Altri titoli varianti |
Guide to automated testing of high-speed interfaces
Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910809724203321 |
|
Moreira José <1975->
|
||
| Norwood, Massachusetts : , : Artech House, , [2016] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2010 |
| Descrizione fisica | 1 online resource (590 p.) |
| Disciplina | 621.381548 |
| Altri autori (Persone) | WerkmannHubert |
| Collana | Artech House microwave library |
| Soggetto topico |
Very high speed integrated circuits
Automatic test equipment |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-60783-984-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC
E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index |
| Altri titoli varianti | Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910458768003321 |
|
Moreira José <1975->
|
||
| Boston : , : Artech House, , ©2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann
| An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
| Autore | Moreira José <1975-> |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2010 |
| Descrizione fisica | 1 online resource (590 p.) |
| Disciplina | 621.381548 |
| Altri autori (Persone) | WerkmannHubert |
| Collana | Artech House microwave library |
| Soggetto topico |
Very high speed integrated circuits
Automatic test equipment |
| ISBN | 1-60783-984-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC
E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index |
| Altri titoli varianti | Automated testing of high-speed interfaces |
| Record Nr. | UNINA-9910785116003321 |
|
Moreira José <1975->
|
||
| Boston : , : Artech House, , ©2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
