Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Introduction of intelligent machine fault diagnosis and prognosis [[electronic resource] /] / Bo-Suk Yang and Achmad Widodo
| Introduction of intelligent machine fault diagnosis and prognosis [[electronic resource] /] / Bo-Suk Yang and Achmad Widodo |
| Autore | Yang O-Suk |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2009 |
| Descrizione fisica | 1 online resource (363 p.) |
| Disciplina | 620/.0044 |
| Altri autori (Persone) | WidodoAchmad |
| Soggetto topico |
Fault location (Engineering) - Automation
Automatic test equipment Expert systems (Computer science) Conscious automata Machine learning Machinery - Testing |
| ISBN | 1-61470-111-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Data acquisition, processing, and analysis -- Feature extraction and clustering -- Feature selection -- Fault classification algorithms -- Decision fusion algorithms -- Fault prognosis algorithms. |
| Record Nr. | UNINA-9910808150403321 |
Yang O-Suk
|
||
| New York, : Nova Science Publishers, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
| Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section |
| Disciplina | 620/.0044 |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211383003316 |
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
|
Multisensor instrumentation 6[sigma] design [[electronic resource] ] : defined accuracy computer-integrated measurement systems / / Patrick H. Garrett
| Multisensor instrumentation 6[sigma] design [[electronic resource] ] : defined accuracy computer-integrated measurement systems / / Patrick H. Garrett |
| Autore | Garrett Patrick H |
| Pubbl/distr/stampa | New York, : J. Wiley, c2002 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina |
629.895
670.42/7 |
| Soggetto topico |
Electrooptical devices - Testing
Automatic test equipment |
| ISBN |
1-280-36655-9
9786610366552 0-470-24467-4 0-471-46098-2 0-471-22155-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
MULTISENSOR INSTRUMENTATION 6s DESIGN; CONTENTS; Preface; 1 Process, Quantum, and Analytical Sensors; 1-0 Introduction; 1-1 Instrumentation Error Representation; 1-2 Temperature Sensors; 1-3 Mechanical Sensors; 1-4 Quantum Sensors; 1-5 Analytical Sensors; Bibliography; 2 Instrumentation Amplifiers and Parameter Errors; 2-0 Introduction; 2-1 Device Temperature Characteristics; 2-2 Differential Amplifiers; 2-3 Operational Amplifiers; 2-4 Instrumentation Amplifiers; 2-5 Amplifier Parameter Error Evaluation; Bibliography; 3 Active Filter Design with Nominal Error; 3-0 Introduction
3-1 Lowpass Instrumentation Filters3-2 Active Filter Networks; 3-3 Filter Error Analysis; 3-4 Bandpass Instrumentation Filters; Bibliography; 4 Linear Signal Conditioning to Six-Sigma Confidence; 4-0 Introduction; 4-1 Signal Conditioning Input Considerations; 4-2 Signal Quality Evaluation and Improvement; 4-3 DC, Sinusoidal, and Harmonic Signal Conditioning; 4-4 Redundant Signal Conditioning and Diagnostics; Bibliography; 5 Data Conversion Devices and Errors; 5-0 Introduction; 5-1 Analog Multiplexers; 5-2 Sample-Holds; 5-3 Digital-to-Analog Converters; 5-4 Analog-to-Digital Converters Bibliography6 Sampling and Reconstruction with Intersample Error; 6-0 Introduction; 6-1 Sampled Data Theory; 6-2 Aliasing of Signal and Noise; 6-3 Step-Interpolated Data Intersample Error; 6-4 Output Signal Interpolation, Oversampling, and Digital Conditioning; Bibliography; 7 Measurement and Control Instrumentation Error Analysis; 7-0 Introduction; 7-1 Low-Data-Rate Digital Control Instrumentation; 7-2 High-Data-Rate Video Acquisition; 7-3 Computer-Integrated Instrumentation Analysis Suite; Bibliography; 8 Multisensor Architectures and Error Propagation; 8-0 Introduction 8-1 Multisensor Fusion, Integration, and Error8-2 Sequential Multisensor Architecture; 8-3 Homogeneous Multisensor Architecture; 8-4 Heterogeneous Multisensor Architecture; Bibliography; 9 Instrumentation System Integration and Interfaces; 9-0 Introduction; 9-1 System Integration and Interface Buses; 9-2 Instrument Serial Bus Interfaces; 9-3 Microwave Microscopy Virtual Instrument; 9-4 Analytical Instrumentation in Advanced Control; Bibliography; Index |
| Record Nr. | UNINA-9910142516003321 |
|
Garrett Patrick H
|
||
| New York, : J. Wiley, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
| New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC |
| Pubbl/distr/stampa | [Place of publication not identified], : Computer Society Press of the IEEE, 1988 |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Automatic test equipment Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215160203316 |
| [Place of publication not identified], : Computer Society Press of the IEEE, 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
PHM-Chengdu : proceedings of 2016 Prognostics and System Health Management Conference : October 19-21, 2016, Chengdu, Sichuan, China
| PHM-Chengdu : proceedings of 2016 Prognostics and System Health Management Conference : October 19-21, 2016, Chengdu, Sichuan, China |
| Pubbl/distr/stampa | New York : , : IEEE, , 2017 |
| Descrizione fisica | 1 online resource (210 pages) |
| Soggetto topico |
Reliability (Engineering)
Automatic test equipment Electronic systems - Testing |
| ISBN | 1-5090-2778-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910172613403321 |
| New York : , : IEEE, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
PHM-Chengdu : proceedings of 2016 Prognostics and System Health Management Conference : October 19-21, 2016, Chengdu, Sichuan, China
| PHM-Chengdu : proceedings of 2016 Prognostics and System Health Management Conference : October 19-21, 2016, Chengdu, Sichuan, China |
| Pubbl/distr/stampa | New York : , : IEEE, , 2017 |
| Descrizione fisica | 1 online resource (210 pages) |
| Soggetto topico |
Reliability (Engineering)
Automatic test equipment Electronic systems - Testing |
| ISBN | 1-5090-2778-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280185303316 |
| New York : , : IEEE, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
PHM-Chongqing 2018 : 2018 Prognostics and System Health Management Conference : proceedings : 26-28 October 2018, Chongqing, China / / edited by Ping Ding [and three others] ; sponsored by Institute of Electrical and Electronics Engineers [and eleven others]
| PHM-Chongqing 2018 : 2018 Prognostics and System Health Management Conference : proceedings : 26-28 October 2018, Chongqing, China / / edited by Ping Ding [and three others] ; sponsored by Institute of Electrical and Electronics Engineers [and eleven others] |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (1358 pages) |
| Disciplina | 620.0044 |
| Soggetto topico |
Automatic test equipment
Electronic systems - Testing |
| ISBN | 1-5386-5380-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910305151103321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
PHM-Chongqing 2018 : 2018 Prognostics and System Health Management Conference : proceedings : 26-28 October 2018, Chongqing, China / / edited by Ping Ding [and three others] ; sponsored by Institute of Electrical and Electronics Engineers [and eleven others]
| PHM-Chongqing 2018 : 2018 Prognostics and System Health Management Conference : proceedings : 26-28 October 2018, Chongqing, China / / edited by Ping Ding [and three others] ; sponsored by Institute of Electrical and Electronics Engineers [and eleven others] |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (1358 pages) |
| Disciplina | 620.0044 |
| Soggetto topico |
Automatic test equipment
Electronic systems - Testing |
| ISBN | 1-5386-5380-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996580870103316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / European Test Workshop
| Proceedings / / European Test Workshop |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society |
| Disciplina | 621 |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment Electronic digital computers - Circuits - Testing |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 1558-1780 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IEEE European Test Workshop
ETW |
| Record Nr. | UNINA-9910626169603321 |
| Los Alamitos, Calif., : IEEE Computer Society | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings / / European Test Workshop
| Proceedings / / European Test Workshop |
| Pubbl/distr/stampa | Los Alamitos, Calif., : IEEE Computer Society |
| Disciplina | 621 |
| Soggetto topico |
Integrated circuits - Testing
Automatic test equipment Electronic digital computers - Circuits - Testing |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 1558-1780 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IEEE European Test Workshop
ETW |
| Record Nr. | UNISA-996280994103316 |
| Los Alamitos, Calif., : IEEE Computer Society | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
