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Environmental statistics [[electronic resource] ] : methods and applications / / Vic Barnett
Environmental statistics [[electronic resource] ] : methods and applications / / Vic Barnett
Autore Barnett Vic
Pubbl/distr/stampa Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2004
Descrizione fisica 1 online resource (318 p.)
Disciplina 363.70072
519.5
Collana Wiley series in probability and statistics
Soggetto topico Mathematical statistics
Environmental sciences - Statistical methods
ISBN 1-280-28762-4
9786610287628
0-470-02474-7
0-470-02697-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Environmental Statistics; Contents; Preface; Chapter 1 Introduction; 1.1 Tomorrow is too Late!; 1.2 Environmental Statistics; 1.3 Some Examples; 1.3.1 'Getting it all together'; 1.3.2 'In time and space'; 1.3.3 'Keep it simple'; 1.3.4 'How much can we take?'; 1.3.5 'Over the top'; 1.4 Fundamentals; 1.5 Bibliography; PART I EXTREMAL STRESSES: EXTREMES, OUTLIERS, ROBUSTNESS; Chapter 2 Ordering and Extremes: Applications, models, inference; 2.1 Ordering the Sample; 2.1.1 Order statistics; 2.2 Order-based Inference; 2.3 Extremes and Extremal Processes; 2.3.1 Practical study and empirical models
generalized extreme-value distributions2.4 Peaks over Thresholds and the Generalized Pareto Distribution; Chapter 3 Outliers and Robustness; 3.1 What is an Outlier?; 3.2 Outlier Aims and Objectives; 3.3 Outlier-Generating Models; 3.3.1 Discordancy and models for outlier generation; 3.3.2 Tests of discordancy for specific distributions; 3.4 Multiple Outliers: Masking and Swamping; 3.5 Accommodation: Outlier-Robust Methods; 3.6 A Possible New Approach to Outliers; 3.7 Multivariate Outliers; 3.8 Detecting Multivariate Outliers; 3.8.1 Principles; 3.8.2 Informal methods; 3.9 Tests of Discordancy
3.10 Accommodation3.11 Outliers in linear models; 3.12 Robustness in General; PART II COLLECTING ENVIRONMENTAL DATA: SAMPLING AND MONITORING; Chapter 4 Finite-Population Sampling; 4.1 A Probabilistic Sampling Scheme; 4.2 Simple Random Sampling; 4.2.1 Estimating the mean, X; 4.2.2 Estimating the variance, S(2); 4.2.3 Choice of sample size, n; 4.2.4 Estimating the population total, X(T); 4.2.5 Estimating a proportion, P; 4.3 Ratios and Ratio Estimators; 4.3.1 The estimation of a ratio; 4.3.2 Ratio estimator of a population total or mean; 4.4 Stratified (simple) Random Sampling
4.4.1 Comparing the simple random sample mean and the stratified sample mean4.4.2 Choice of sample sizes; 4.4.3 Comparison of proportional allocation and optimum allocation; 4.4.4 Optimum allocation for estimating proportions; 4.5 Developments of Survey Sampling; Chapter 5 Inaccessible and Sensitive Data; 5.1 Encountered Data; 5.2 Length-Biased or Size-Biased Sampling and Weighted Distributions; 5.2.1 Weighted distribution methods; 5.3 Composite Sampling; 5.3.1 Attribute Sampling; 5.3.2 Continuous variables; 5.3.3 Estimating mean and variance; 5.4 Ranked-Set Sampling
5.4.1 The ranked-set sample mean5.4.2 Optimal estimation; 5.4.3 Ranked-set sampling for normal and exponential distributions; 5.4.4 Imperfect ordering; Chapter 6 Sampling in the Wild; 6.1 Quadrat Sampling; 6.2 Recapture Sampling; 6.2.1 The Petersen and Chapman estimators; 6.2.2 Capture-recapture methods in open populations; 6.3 Transect Sampling; 6.3.1 The simplest case: strip transects; 6.3.2 Using a detectability function; 6.3.3 Estimating f (y); 6.3.4 Modifications of approach; 6.3.5 Point transects or variable circular plots; 6.4 Adaptive Sampling
6.4.1 Simple models for adaptive sampling
Record Nr. UNINA-9910143557803321
Barnett Vic  
Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Environmental statistics [[electronic resource] ] : methods and applications / / Vic Barnett
Environmental statistics [[electronic resource] ] : methods and applications / / Vic Barnett
Autore Barnett Vic
Pubbl/distr/stampa Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2004
Descrizione fisica 1 online resource (318 p.)
Disciplina 363.70072
519.5
Collana Wiley series in probability and statistics
Soggetto topico Mathematical statistics
Environmental sciences - Statistical methods
ISBN 1-280-28762-4
9786610287628
0-470-02474-7
0-470-02697-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Environmental Statistics; Contents; Preface; Chapter 1 Introduction; 1.1 Tomorrow is too Late!; 1.2 Environmental Statistics; 1.3 Some Examples; 1.3.1 'Getting it all together'; 1.3.2 'In time and space'; 1.3.3 'Keep it simple'; 1.3.4 'How much can we take?'; 1.3.5 'Over the top'; 1.4 Fundamentals; 1.5 Bibliography; PART I EXTREMAL STRESSES: EXTREMES, OUTLIERS, ROBUSTNESS; Chapter 2 Ordering and Extremes: Applications, models, inference; 2.1 Ordering the Sample; 2.1.1 Order statistics; 2.2 Order-based Inference; 2.3 Extremes and Extremal Processes; 2.3.1 Practical study and empirical models
generalized extreme-value distributions2.4 Peaks over Thresholds and the Generalized Pareto Distribution; Chapter 3 Outliers and Robustness; 3.1 What is an Outlier?; 3.2 Outlier Aims and Objectives; 3.3 Outlier-Generating Models; 3.3.1 Discordancy and models for outlier generation; 3.3.2 Tests of discordancy for specific distributions; 3.4 Multiple Outliers: Masking and Swamping; 3.5 Accommodation: Outlier-Robust Methods; 3.6 A Possible New Approach to Outliers; 3.7 Multivariate Outliers; 3.8 Detecting Multivariate Outliers; 3.8.1 Principles; 3.8.2 Informal methods; 3.9 Tests of Discordancy
3.10 Accommodation3.11 Outliers in linear models; 3.12 Robustness in General; PART II COLLECTING ENVIRONMENTAL DATA: SAMPLING AND MONITORING; Chapter 4 Finite-Population Sampling; 4.1 A Probabilistic Sampling Scheme; 4.2 Simple Random Sampling; 4.2.1 Estimating the mean, X; 4.2.2 Estimating the variance, S(2); 4.2.3 Choice of sample size, n; 4.2.4 Estimating the population total, X(T); 4.2.5 Estimating a proportion, P; 4.3 Ratios and Ratio Estimators; 4.3.1 The estimation of a ratio; 4.3.2 Ratio estimator of a population total or mean; 4.4 Stratified (simple) Random Sampling
4.4.1 Comparing the simple random sample mean and the stratified sample mean4.4.2 Choice of sample sizes; 4.4.3 Comparison of proportional allocation and optimum allocation; 4.4.4 Optimum allocation for estimating proportions; 4.5 Developments of Survey Sampling; Chapter 5 Inaccessible and Sensitive Data; 5.1 Encountered Data; 5.2 Length-Biased or Size-Biased Sampling and Weighted Distributions; 5.2.1 Weighted distribution methods; 5.3 Composite Sampling; 5.3.1 Attribute Sampling; 5.3.2 Continuous variables; 5.3.3 Estimating mean and variance; 5.4 Ranked-Set Sampling
5.4.1 The ranked-set sample mean5.4.2 Optimal estimation; 5.4.3 Ranked-set sampling for normal and exponential distributions; 5.4.4 Imperfect ordering; Chapter 6 Sampling in the Wild; 6.1 Quadrat Sampling; 6.2 Recapture Sampling; 6.2.1 The Petersen and Chapman estimators; 6.2.2 Capture-recapture methods in open populations; 6.3 Transect Sampling; 6.3.1 The simplest case: strip transects; 6.3.2 Using a detectability function; 6.3.3 Estimating f (y); 6.3.4 Modifications of approach; 6.3.5 Point transects or variable circular plots; 6.4 Adaptive Sampling
6.4.1 Simple models for adaptive sampling
Record Nr. UNINA-9910831188103321
Barnett Vic  
Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Environmental statistics [[electronic resource] ] : methods and applications / / Vic Barnett
Environmental statistics [[electronic resource] ] : methods and applications / / Vic Barnett
Autore Barnett Vic
Pubbl/distr/stampa Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2004
Descrizione fisica 1 online resource (318 p.)
Disciplina 363.70072
519.5
Collana Wiley series in probability and statistics
Soggetto topico Mathematical statistics
Environmental sciences - Statistical methods
ISBN 1-280-28762-4
9786610287628
0-470-02474-7
0-470-02697-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Environmental Statistics; Contents; Preface; Chapter 1 Introduction; 1.1 Tomorrow is too Late!; 1.2 Environmental Statistics; 1.3 Some Examples; 1.3.1 'Getting it all together'; 1.3.2 'In time and space'; 1.3.3 'Keep it simple'; 1.3.4 'How much can we take?'; 1.3.5 'Over the top'; 1.4 Fundamentals; 1.5 Bibliography; PART I EXTREMAL STRESSES: EXTREMES, OUTLIERS, ROBUSTNESS; Chapter 2 Ordering and Extremes: Applications, models, inference; 2.1 Ordering the Sample; 2.1.1 Order statistics; 2.2 Order-based Inference; 2.3 Extremes and Extremal Processes; 2.3.1 Practical study and empirical models
generalized extreme-value distributions2.4 Peaks over Thresholds and the Generalized Pareto Distribution; Chapter 3 Outliers and Robustness; 3.1 What is an Outlier?; 3.2 Outlier Aims and Objectives; 3.3 Outlier-Generating Models; 3.3.1 Discordancy and models for outlier generation; 3.3.2 Tests of discordancy for specific distributions; 3.4 Multiple Outliers: Masking and Swamping; 3.5 Accommodation: Outlier-Robust Methods; 3.6 A Possible New Approach to Outliers; 3.7 Multivariate Outliers; 3.8 Detecting Multivariate Outliers; 3.8.1 Principles; 3.8.2 Informal methods; 3.9 Tests of Discordancy
3.10 Accommodation3.11 Outliers in linear models; 3.12 Robustness in General; PART II COLLECTING ENVIRONMENTAL DATA: SAMPLING AND MONITORING; Chapter 4 Finite-Population Sampling; 4.1 A Probabilistic Sampling Scheme; 4.2 Simple Random Sampling; 4.2.1 Estimating the mean, X; 4.2.2 Estimating the variance, S(2); 4.2.3 Choice of sample size, n; 4.2.4 Estimating the population total, X(T); 4.2.5 Estimating a proportion, P; 4.3 Ratios and Ratio Estimators; 4.3.1 The estimation of a ratio; 4.3.2 Ratio estimator of a population total or mean; 4.4 Stratified (simple) Random Sampling
4.4.1 Comparing the simple random sample mean and the stratified sample mean4.4.2 Choice of sample sizes; 4.4.3 Comparison of proportional allocation and optimum allocation; 4.4.4 Optimum allocation for estimating proportions; 4.5 Developments of Survey Sampling; Chapter 5 Inaccessible and Sensitive Data; 5.1 Encountered Data; 5.2 Length-Biased or Size-Biased Sampling and Weighted Distributions; 5.2.1 Weighted distribution methods; 5.3 Composite Sampling; 5.3.1 Attribute Sampling; 5.3.2 Continuous variables; 5.3.3 Estimating mean and variance; 5.4 Ranked-Set Sampling
5.4.1 The ranked-set sample mean5.4.2 Optimal estimation; 5.4.3 Ranked-set sampling for normal and exponential distributions; 5.4.4 Imperfect ordering; Chapter 6 Sampling in the Wild; 6.1 Quadrat Sampling; 6.2 Recapture Sampling; 6.2.1 The Petersen and Chapman estimators; 6.2.2 Capture-recapture methods in open populations; 6.3 Transect Sampling; 6.3.1 The simplest case: strip transects; 6.3.2 Using a detectability function; 6.3.3 Estimating f (y); 6.3.4 Modifications of approach; 6.3.5 Point transects or variable circular plots; 6.4 Adaptive Sampling
6.4.1 Simple models for adaptive sampling
Record Nr. UNINA-9910841477803321
Barnett Vic  
Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Enzymes [[electronic resource] ] : a practical introduction to structure, mechanism, and data analysis / / Robert A. Copeland
Enzymes [[electronic resource] ] : a practical introduction to structure, mechanism, and data analysis / / Robert A. Copeland
Autore Copeland Robert Allen
Edizione [2nd ed.]
Pubbl/distr/stampa New York, : J. Wiley, c2014
Descrizione fisica 1 online resource (417 p.)
Disciplina 572.7
Soggetto topico Enzymes
Enzymology
ISBN 1-280-36703-2
9786610367030
0-470-23916-6
0-471-46185-7
0-471-22063-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ENZYMES SECOND EDITION; CONTENTS; Preface; Acknowledgments; Preface to the First Edition; 1 A Brief History of Enzymology; 1.1 Enzymes in Antiquity; 1.2 Early Enzymology; 1.3 The Development of Mechanistic Enzymology; 1.4 Studies of Enzyme Structure; 1.5 Enzymology Today; 1.6 Summary; References and Further Reading; 2 Chemical Bonds and Reactions in Biochemistry; 2.1 Atomic and Molecular Orbitals; 2.2 Thermodynamics of Chemical Reactions; 2.3 Acid-Base Chemistry; 2.4 Noncovalent Interactions in Reversible Binding; 2.5 Rates of Chemical Reactions; 2.6 Summary; References and Further Reading
3 Structural Components of Enzymes3.1 The Amino Acids; 3.2 The Peptide Bond; 3.3 Amino Acid Sequence or Primary Structure; 3.4 Secondary Structure; 3.5 Tertiary Structure; 3.6 Subunits and Quaternary Structure; 3.7 Cofactors in Enzymes; 3.8 Summary; References and Further Reading; 4 Protein-Ligand Binding Equilibria; 4.1 The Equilibrium Dissociation Constant, K(d); 4.2 The Kinetic Approach to Equilibrium; 4.3 Binding Measurements at Equilibrium; 4.4 Graphic Analysis of Equilibrium Ligand Binding Data; 4.5 Equilibrium Binding with Ligand Depletion (Tight Binding Interactions)
4.6 Competition Among Ligands for a Common Binding Site4.7 Experimental Methods for Measuring Ligand Binding; 4.8 Summary; References and Further Reading; 5 Kinetics of Single-Substrate Enzyme Reactions; 5.1 The Time Course of Enzymatic Reactions; 5.2 Effects of Substrate Concentration on Velocity; 5.3 The Rapid Equilibrium Model of Enzyme Kinetics; 5.4 The Steady State Model of Enzyme Kinetics; 5.5 The Significance of k(cat) and K(m); 5.6 Experimental Measurement of k(cat) and K(m); 5.7 Other Linear Transformations of Enzyme Kinetic Data; 5.8 Measurements at Low Substrate Concentrations
5.9 Deviations from Hyperbolic Kinetics5.10 Transient State Kinetic Measurements; 5.11 Summary; References and Further Reading; 6 Chemical Mechanisms in Enzyme Catalysis; 6.1 Substrate-Active Site Complementarity; 6.2 Rate Enhancement Through Transition State Stabilization; 6.3 Chemical Mechanisms for Transition State Stabilization; 6.4 The Serine Proteases: An Illustrative Example; 6.5 Enzymatic Reaction Nomenclature; 6.6 Summary; References and Further Reading; 7 Experimental Measures of Enzyme Activity; 7.1 Initial Velocity Measurements; 7.2 Detection Methods
7.3 Separation Methods in Enzyme Assays7.4 Factors Affecting the Velocity of Enzymatic Reactions; 7.5 Reporting Enzyme Activity Data; 7.6 Enzyme Stability; 7.7 Summary; References and Further Reading; 8 Reversible Inhibitors; 8.1 Equilibrium Treatment of Reversible Inhibition; 8.2 Modes of Reversible Inhibition; 8.3 Graphic Determination of Inhibitor Type; 8.4 Dose-Response Curves of Enzyme Inhibition; 8.5 Mutually Exclusive Binding of Two Inhibitors; 8.6 Structure-Activity Relationships and Inhibitor Design; 8.7 Summary; References and Further Reading; 9 Tight Binding Inhibitors
9.1 Identifying Tight Binding Inhibition
Record Nr. UNINA-9910142503503321
Copeland Robert Allen  
New York, : J. Wiley, c2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Enzymes [[electronic resource] ] : a practical introduction to structure, mechanism, and data analysis / / Robert A. Copeland
Enzymes [[electronic resource] ] : a practical introduction to structure, mechanism, and data analysis / / Robert A. Copeland
Autore Copeland Robert Allen
Edizione [2nd ed.]
Pubbl/distr/stampa New York, : J. Wiley, c2014
Descrizione fisica 1 online resource (417 p.)
Disciplina 572.7
Soggetto topico Enzymes
Enzymology
ISBN 1-280-36703-2
9786610367030
0-470-23916-6
0-471-46185-7
0-471-22063-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ENZYMES SECOND EDITION; CONTENTS; Preface; Acknowledgments; Preface to the First Edition; 1 A Brief History of Enzymology; 1.1 Enzymes in Antiquity; 1.2 Early Enzymology; 1.3 The Development of Mechanistic Enzymology; 1.4 Studies of Enzyme Structure; 1.5 Enzymology Today; 1.6 Summary; References and Further Reading; 2 Chemical Bonds and Reactions in Biochemistry; 2.1 Atomic and Molecular Orbitals; 2.2 Thermodynamics of Chemical Reactions; 2.3 Acid-Base Chemistry; 2.4 Noncovalent Interactions in Reversible Binding; 2.5 Rates of Chemical Reactions; 2.6 Summary; References and Further Reading
3 Structural Components of Enzymes3.1 The Amino Acids; 3.2 The Peptide Bond; 3.3 Amino Acid Sequence or Primary Structure; 3.4 Secondary Structure; 3.5 Tertiary Structure; 3.6 Subunits and Quaternary Structure; 3.7 Cofactors in Enzymes; 3.8 Summary; References and Further Reading; 4 Protein-Ligand Binding Equilibria; 4.1 The Equilibrium Dissociation Constant, K(d); 4.2 The Kinetic Approach to Equilibrium; 4.3 Binding Measurements at Equilibrium; 4.4 Graphic Analysis of Equilibrium Ligand Binding Data; 4.5 Equilibrium Binding with Ligand Depletion (Tight Binding Interactions)
4.6 Competition Among Ligands for a Common Binding Site4.7 Experimental Methods for Measuring Ligand Binding; 4.8 Summary; References and Further Reading; 5 Kinetics of Single-Substrate Enzyme Reactions; 5.1 The Time Course of Enzymatic Reactions; 5.2 Effects of Substrate Concentration on Velocity; 5.3 The Rapid Equilibrium Model of Enzyme Kinetics; 5.4 The Steady State Model of Enzyme Kinetics; 5.5 The Significance of k(cat) and K(m); 5.6 Experimental Measurement of k(cat) and K(m); 5.7 Other Linear Transformations of Enzyme Kinetic Data; 5.8 Measurements at Low Substrate Concentrations
5.9 Deviations from Hyperbolic Kinetics5.10 Transient State Kinetic Measurements; 5.11 Summary; References and Further Reading; 6 Chemical Mechanisms in Enzyme Catalysis; 6.1 Substrate-Active Site Complementarity; 6.2 Rate Enhancement Through Transition State Stabilization; 6.3 Chemical Mechanisms for Transition State Stabilization; 6.4 The Serine Proteases: An Illustrative Example; 6.5 Enzymatic Reaction Nomenclature; 6.6 Summary; References and Further Reading; 7 Experimental Measures of Enzyme Activity; 7.1 Initial Velocity Measurements; 7.2 Detection Methods
7.3 Separation Methods in Enzyme Assays7.4 Factors Affecting the Velocity of Enzymatic Reactions; 7.5 Reporting Enzyme Activity Data; 7.6 Enzyme Stability; 7.7 Summary; References and Further Reading; 8 Reversible Inhibitors; 8.1 Equilibrium Treatment of Reversible Inhibition; 8.2 Modes of Reversible Inhibition; 8.3 Graphic Determination of Inhibitor Type; 8.4 Dose-Response Curves of Enzyme Inhibition; 8.5 Mutually Exclusive Binding of Two Inhibitors; 8.6 Structure-Activity Relationships and Inhibitor Design; 8.7 Summary; References and Further Reading; 9 Tight Binding Inhibitors
9.1 Identifying Tight Binding Inhibition
Record Nr. UNINA-9910677846903321
Copeland Robert Allen  
New York, : J. Wiley, c2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Error control coding : from theory to practice / Peter Sweeney
Error control coding : from theory to practice / Peter Sweeney
Autore Sweeney, Peter
Pubbl/distr/stampa Chichester, : J. Wiley, c2002
Descrizione fisica IX, 242 p. ; 25 cm.
Disciplina 628.3821
Soggetto topico Codici correttori (Teoria dell'informazione)
ISBN 047084356X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAS-PUV0848223
Sweeney, Peter  
Chichester, : J. Wiley, c2002
Materiale a stampa
Lo trovi qui: Univ. di Cassino
Opac: Controlla la disponibilità qui
ESD [[electronic resource] ] : failure mechanisms and models / / Steven H. Voldman
ESD [[electronic resource] ] : failure mechanisms and models / / Steven H. Voldman
Autore Voldman Steven H
Pubbl/distr/stampa Chichester, West Sussex, U.K. ; ; Hoboken, NJ, : J. Wiley, 2009
Descrizione fisica 1 online resource (410 p.)
Disciplina 621.381
Soggetto topico Semiconductors - Failures
Integrated circuits - Protection
Integrated circuits - Testing
Integrated circuits - Reliability
Electric discharges
Electrostatics
ISBN 1-282-23713-6
9786612237133
0-470-74725-0
0-470-74726-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ESD Failure Mechanisms and Models; Contents; About the Author; Preface; Acknowledgments; 1 Failure Analysis and ESD; 1.1 INTRODUCTION; 1.1.1 FA Techniques for Evaluation of ESD Events; 1.1.2 Fundamental Concepts of ESD FA Methods and Practices; 1.1.3 ESD Failure: Why Do Semiconductor Chips Fail?; 1.1.4 How to Use FA to Design ESD Robust Technologies; 1.1.5 How to Use FA to Design ESD Robust Circuits; 1.1.6 How to Use FA for Temperature Prediction; 1.1.7 How to Use Failure Models for Power Prediction; 1.1.8 FA Methods, Design Rules, and ESD Ground Rules
1.1.9 FA and Semiconductor Process-Induced ESD Design Asymmetry 1.1.10 FA Methodology and Electro-thermal Simulation; 1.1.11 FA and ESD Testing Methodology; 1.1.12 FA Methodology for Evaluation of ESD Parasitics; 1.1.13 FA Methods and ESD Device Operation Verification; 1.1.14 FA Methodology to Evaluate Inter-power Rail Electrical Connectivity; 1.1.15 How to Use FA to Eliminate Failure Mechanisms; 1.2 ESD FAILURE: HOW DO MICRO-ELECTRONIC DEVICES FAIL?; 1.2.1 ESD Failure: How Do Metallurgical Junctions Fail?; 1.2.2 ESD Failure: How Do Insulators Fail?; 1.2.3 ESD Failure: How Do Metals Fail?
1.3 SENSITIVITY OF SEMICONDUCTOR COMPONENTS 1.3.1 ESD Sensitivity as a Function of Materials; 1.3.2 ESD Sensitivity as a Function of Semiconductor Devices; 1.3.3 ESD Sensitivity as a Function of Product Type; 1.3.4 ESD and Technology Scaling; 1.3.5 ESD Technology Roadmap; 1.4 HOW DO SEMICONDUCTOR CHIPS FAIL--ARE THE FAILURES RANDOM OR SYSTEMATIC?; 1.5 CLOSING COMMENTS AND SUMMARY; PROBLEMS; REFERENCES; 2 Failure Analysis Tools, Models, and Physics of Failure; 2.1 FA TECHNIQUES FOR EVALUATION OF ESD EVENTS; 2.2 FA TOOLS; 2.2.1 Optical Microscope; 2.2.2 Scanning Electron Microscope
2.2.3 Transmission Electron Microscope 2.2.4 Emission Microscope; 2.2.5 Thermally Induced Voltage Alteration; 2.2.6 Superconducting Quantum Interference Device Microscope; 2.2.7 Atomic Force Microscope; 2.2.8 The 2-D AFM; 2.2.9 Picosecond Current Analysis Tool; 2.2.10 Transmission Line Pulse--Pico second Current Analysis Tool; 2.3 ESD SIMULATION: ESD PULSE MODELS; 2.3.1 Human Body Model; 2.3.2 Machine Model; 2.3.3 Cassette Model; 2.3.4 Socketed Device Model; 2.3.5 Charged Board Model; 2.3.6 Cable Discharge Event; 2.3.7 IEC System-Level Pulse Model; 2.3.8 Human Metal Model
2.3.9 Transmission Line Pulse Testing 2.3.10 Very Fast Transmission Line Pulse (VF-TLP) Model; 2.3.11 Ultra-fast Transmission Line Pulse (UF-TLP) Model; 2.4 ELECTRO-THERMAL PHYSICAL MODELS; 2.4.1 Tasca Model; 2.4.2 Wunsch-Bell Model; 2.4.3 Smith-Littau Model; 2.4.4 Ash Model; 2.4.5 Arkihpov, Astvatsaturyan, Godovosyn, and Rudenko Model; 2.4.6 Dwyer, Franklin, and Campbell Model; 2.4.7 Vlasov-Sinkevitch Model; 2.5 STATISTICAL MODELS FOR ESD PREDICTION; 2.6 CLOSING COMMENTS AND SUMMARY; PROBLEMS; REFERENCES; 3 CMOS Failure Mechanisms; 3.1 TABLES OF CMOS ESD FAILURE MECHANISMS
3.2 LOCOS ISOLATION-DEFINED CMOS
Record Nr. UNINA-9910139802703321
Voldman Steven H  
Chichester, West Sussex, U.K. ; ; Hoboken, NJ, : J. Wiley, 2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
ESD [[electronic resource] ] : failure mechanisms and models / / Steven H. Voldman
ESD [[electronic resource] ] : failure mechanisms and models / / Steven H. Voldman
Autore Voldman Steven H
Pubbl/distr/stampa Chichester, West Sussex, U.K. ; ; Hoboken, NJ, : J. Wiley, 2009
Descrizione fisica 1 online resource (410 p.)
Disciplina 621.381
Soggetto topico Semiconductors - Failures
Integrated circuits - Protection
Integrated circuits - Testing
Integrated circuits - Reliability
Electric discharges
Electrostatics
ISBN 1-282-23713-6
9786612237133
0-470-74725-0
0-470-74726-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ESD Failure Mechanisms and Models; Contents; About the Author; Preface; Acknowledgments; 1 Failure Analysis and ESD; 1.1 INTRODUCTION; 1.1.1 FA Techniques for Evaluation of ESD Events; 1.1.2 Fundamental Concepts of ESD FA Methods and Practices; 1.1.3 ESD Failure: Why Do Semiconductor Chips Fail?; 1.1.4 How to Use FA to Design ESD Robust Technologies; 1.1.5 How to Use FA to Design ESD Robust Circuits; 1.1.6 How to Use FA for Temperature Prediction; 1.1.7 How to Use Failure Models for Power Prediction; 1.1.8 FA Methods, Design Rules, and ESD Ground Rules
1.1.9 FA and Semiconductor Process-Induced ESD Design Asymmetry 1.1.10 FA Methodology and Electro-thermal Simulation; 1.1.11 FA and ESD Testing Methodology; 1.1.12 FA Methodology for Evaluation of ESD Parasitics; 1.1.13 FA Methods and ESD Device Operation Verification; 1.1.14 FA Methodology to Evaluate Inter-power Rail Electrical Connectivity; 1.1.15 How to Use FA to Eliminate Failure Mechanisms; 1.2 ESD FAILURE: HOW DO MICRO-ELECTRONIC DEVICES FAIL?; 1.2.1 ESD Failure: How Do Metallurgical Junctions Fail?; 1.2.2 ESD Failure: How Do Insulators Fail?; 1.2.3 ESD Failure: How Do Metals Fail?
1.3 SENSITIVITY OF SEMICONDUCTOR COMPONENTS 1.3.1 ESD Sensitivity as a Function of Materials; 1.3.2 ESD Sensitivity as a Function of Semiconductor Devices; 1.3.3 ESD Sensitivity as a Function of Product Type; 1.3.4 ESD and Technology Scaling; 1.3.5 ESD Technology Roadmap; 1.4 HOW DO SEMICONDUCTOR CHIPS FAIL--ARE THE FAILURES RANDOM OR SYSTEMATIC?; 1.5 CLOSING COMMENTS AND SUMMARY; PROBLEMS; REFERENCES; 2 Failure Analysis Tools, Models, and Physics of Failure; 2.1 FA TECHNIQUES FOR EVALUATION OF ESD EVENTS; 2.2 FA TOOLS; 2.2.1 Optical Microscope; 2.2.2 Scanning Electron Microscope
2.2.3 Transmission Electron Microscope 2.2.4 Emission Microscope; 2.2.5 Thermally Induced Voltage Alteration; 2.2.6 Superconducting Quantum Interference Device Microscope; 2.2.7 Atomic Force Microscope; 2.2.8 The 2-D AFM; 2.2.9 Picosecond Current Analysis Tool; 2.2.10 Transmission Line Pulse--Pico second Current Analysis Tool; 2.3 ESD SIMULATION: ESD PULSE MODELS; 2.3.1 Human Body Model; 2.3.2 Machine Model; 2.3.3 Cassette Model; 2.3.4 Socketed Device Model; 2.3.5 Charged Board Model; 2.3.6 Cable Discharge Event; 2.3.7 IEC System-Level Pulse Model; 2.3.8 Human Metal Model
2.3.9 Transmission Line Pulse Testing 2.3.10 Very Fast Transmission Line Pulse (VF-TLP) Model; 2.3.11 Ultra-fast Transmission Line Pulse (UF-TLP) Model; 2.4 ELECTRO-THERMAL PHYSICAL MODELS; 2.4.1 Tasca Model; 2.4.2 Wunsch-Bell Model; 2.4.3 Smith-Littau Model; 2.4.4 Ash Model; 2.4.5 Arkihpov, Astvatsaturyan, Godovosyn, and Rudenko Model; 2.4.6 Dwyer, Franklin, and Campbell Model; 2.4.7 Vlasov-Sinkevitch Model; 2.5 STATISTICAL MODELS FOR ESD PREDICTION; 2.6 CLOSING COMMENTS AND SUMMARY; PROBLEMS; REFERENCES; 3 CMOS Failure Mechanisms; 3.1 TABLES OF CMOS ESD FAILURE MECHANISMS
3.2 LOCOS ISOLATION-DEFINED CMOS
Record Nr. UNINA-9910817124503321
Voldman Steven H  
Chichester, West Sussex, U.K. ; ; Hoboken, NJ, : J. Wiley, 2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
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ESD [[electronic resource] ] : RF technology and circuits / / Steven H. Voldman
ESD [[electronic resource] ] : RF technology and circuits / / Steven H. Voldman
Autore Voldman Steven H
Pubbl/distr/stampa Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2006
Descrizione fisica 1 online resource (422 p.)
Disciplina 621.384
621.38412
Soggetto topico Radio frequency integrated circuits - Design and construction
Radio frequency integrated circuits - Protection
Electrostatics
Electric discharges - Prevention
Static eliminators
ISBN 1-280-72219-3
9786610722198
0-470-06140-5
0-470-06139-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ESD; Contents; Preface; Acknowledgements; Chapter 1 RF DESIGN and ESD; 1.1 Fundamental Concepts of ESD Design; 1.2 Fundamental Concepts of RF ESD Design; 1.3 Key RF ESD Contributions; 1.4 Key RF ESD Patents; 1.5 ESD Failure Mechanisms; 1.5.1 RF CMOS ESD Failure Mechanisms; 1.5.2 Silicon Germanium ESD Failure Mechanisms; 1.5.3 Silicon Germanium Carbon ESD Failure Mechanisms in Silicon Germanium Carbon Devices; 1.5.4 Gallium Arsenide Technology ESD Failure Mechanisms; 1.5.5 Indium Gallium Arsenide ESD Failure Mechanisms; 1.5.6 RF Bipolar Circuits ESD Failure Mechanisms; 1.6 RF Basics
1.7 Two-Port Network Parameters1.7.1 Z-Parameters; 1.7.2 Y-Parameters; 1.7.3. S-Parameters; 1.7.4 T-Parameters; 1.8 Stability: RF Design Stability and ESD; 1.9 Device Degradation and ESD Failure; 1.9.1 ESD-Induced D.C. Parameter Shift and Failure Criteria; 1.9.2 RF Parameters, ESD Degradation, and Failure Criteria; 1.10 RF ESD Testing; 1.10.1 ESD Testing Models; 1.10.2 RF Maximum Power-to-Failure and ESD Pulse Testing Methodology; 1.10.3 ESD-Induced RF Degradation and S-Parameter Evaluation Test Methodology; 1.11 Time Domain Reflectometry (TDR) and Impedance Methodology for ESD Testing
1.11.1 Time Domain Reflectometry (TDR) ESD Test System Evaluation1.11.2 ESD Degradation System Level Method - Eye Tests; 1.12 Product Level ESD Test and RF Functional Parameter Failure; 1.13 Combined RF and ESD TLP Test Systems; 1.14 Closing Comments and Summary; Problems; References; Chapter 2 RF ESD Design; 2.1 ESD Design Methods: Ideal ESD Networks and RF ESD Design Windows; 2.1.1 Ideal ESD Networks and the Current-Voltage d.c. Design Window; 2.1.2 Ideal ESD Networks in the Frequency Domain Design Window; 2.2 RF ESD Design Methods: Linearity
2.3 RF ESD Design: Passive Element Quality Factors and Figures of Merit2.4 RF ESD Design Methods: Method of Substitution; 2.4.1 Method of Substitution of Passive Element to ESD Network Element; 2.4.2 Substitution of ESD Network Element to Passive Element; 2.5 RF ESD Design Methods: Matching Networks and RF ESD Networks; 2.5.1 RF ESD Method - Conversion of Matching Networks to ESD Networks; 2.5.2 RF ESD Method: Conversion of ESD Networks into Matching Networks; 2.5.2.1 Conversion of ESD Networks into L-Match Networks; 2.5.2.2 Conversion of ESD Networks into Pie-Match Networks
2.5.2.3 Conversion of ESD Networks into T-Match Networks2.6 RF ESD Design Methods: Inductive Shunt; 2.7 RF ESD Design Methods: Cancellation Method; 2.7.1 Quality Factors and the Cancellation Method; 2.7.2 Inductive Cancellation of Capacitance Load and Figures of Merit; 2.7.3 Cancellation Method and ESD Circuitry; 2.8 RF ESD Design Methods: Impedance Isolation Technique Using LC Resonator; 2.9 RF ESD Design Methods: Lumped versus Distributed Loads; 2.9.1 RF ESD Distributed Load with Coplanar Wave Guides; 2.9.2 RF ESD Distribution Coplanar Waveguides Analysis Using ABCD Matrices
2.10 ESD RF Design Synthesis and Floor Planning: RF, Analog, and Digital Integration
Record Nr. UNINA-9910830973303321
Voldman Steven H  
Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
ESD [[electronic resource] ] : RF technology and circuits / / Steven H. Voldman
ESD [[electronic resource] ] : RF technology and circuits / / Steven H. Voldman
Autore Voldman Steven H
Pubbl/distr/stampa Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2006
Descrizione fisica 1 online resource (422 p.)
Disciplina 621.384
621.38412
Soggetto topico Radio frequency integrated circuits - Design and construction
Radio frequency integrated circuits - Protection
Electrostatics
Electric discharges - Prevention
Static eliminators
ISBN 1-280-72219-3
9786610722198
0-470-06140-5
0-470-06139-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ESD; Contents; Preface; Acknowledgements; Chapter 1 RF DESIGN and ESD; 1.1 Fundamental Concepts of ESD Design; 1.2 Fundamental Concepts of RF ESD Design; 1.3 Key RF ESD Contributions; 1.4 Key RF ESD Patents; 1.5 ESD Failure Mechanisms; 1.5.1 RF CMOS ESD Failure Mechanisms; 1.5.2 Silicon Germanium ESD Failure Mechanisms; 1.5.3 Silicon Germanium Carbon ESD Failure Mechanisms in Silicon Germanium Carbon Devices; 1.5.4 Gallium Arsenide Technology ESD Failure Mechanisms; 1.5.5 Indium Gallium Arsenide ESD Failure Mechanisms; 1.5.6 RF Bipolar Circuits ESD Failure Mechanisms; 1.6 RF Basics
1.7 Two-Port Network Parameters1.7.1 Z-Parameters; 1.7.2 Y-Parameters; 1.7.3. S-Parameters; 1.7.4 T-Parameters; 1.8 Stability: RF Design Stability and ESD; 1.9 Device Degradation and ESD Failure; 1.9.1 ESD-Induced D.C. Parameter Shift and Failure Criteria; 1.9.2 RF Parameters, ESD Degradation, and Failure Criteria; 1.10 RF ESD Testing; 1.10.1 ESD Testing Models; 1.10.2 RF Maximum Power-to-Failure and ESD Pulse Testing Methodology; 1.10.3 ESD-Induced RF Degradation and S-Parameter Evaluation Test Methodology; 1.11 Time Domain Reflectometry (TDR) and Impedance Methodology for ESD Testing
1.11.1 Time Domain Reflectometry (TDR) ESD Test System Evaluation1.11.2 ESD Degradation System Level Method - Eye Tests; 1.12 Product Level ESD Test and RF Functional Parameter Failure; 1.13 Combined RF and ESD TLP Test Systems; 1.14 Closing Comments and Summary; Problems; References; Chapter 2 RF ESD Design; 2.1 ESD Design Methods: Ideal ESD Networks and RF ESD Design Windows; 2.1.1 Ideal ESD Networks and the Current-Voltage d.c. Design Window; 2.1.2 Ideal ESD Networks in the Frequency Domain Design Window; 2.2 RF ESD Design Methods: Linearity
2.3 RF ESD Design: Passive Element Quality Factors and Figures of Merit2.4 RF ESD Design Methods: Method of Substitution; 2.4.1 Method of Substitution of Passive Element to ESD Network Element; 2.4.2 Substitution of ESD Network Element to Passive Element; 2.5 RF ESD Design Methods: Matching Networks and RF ESD Networks; 2.5.1 RF ESD Method - Conversion of Matching Networks to ESD Networks; 2.5.2 RF ESD Method: Conversion of ESD Networks into Matching Networks; 2.5.2.1 Conversion of ESD Networks into L-Match Networks; 2.5.2.2 Conversion of ESD Networks into Pie-Match Networks
2.5.2.3 Conversion of ESD Networks into T-Match Networks2.6 RF ESD Design Methods: Inductive Shunt; 2.7 RF ESD Design Methods: Cancellation Method; 2.7.1 Quality Factors and the Cancellation Method; 2.7.2 Inductive Cancellation of Capacitance Load and Figures of Merit; 2.7.3 Cancellation Method and ESD Circuitry; 2.8 RF ESD Design Methods: Impedance Isolation Technique Using LC Resonator; 2.9 RF ESD Design Methods: Lumped versus Distributed Loads; 2.9.1 RF ESD Distributed Load with Coplanar Wave Guides; 2.9.2 RF ESD Distribution Coplanar Waveguides Analysis Using ABCD Matrices
2.10 ESD RF Design Synthesis and Floor Planning: RF, Analog, and Digital Integration
Record Nr. UNINA-9910841240003321
Voldman Steven H  
Chichester, West Sussex, England ; ; Hoboken, NJ, : J. Wiley, c2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui