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1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
| 1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214351703316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
| 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Congresses - Reliability
Integrated circuits - Reliability - Wafer scale integration - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204469603316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
| 1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1997 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Congresses - Reliability - Wafer-scale integration Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212474703316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212589903316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215080003316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2000 22nd International Conference on Microelectronics : proceedings
| 2000 22nd International Conference on Microelectronics : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.381 |
| Soggetto topico |
Microelectronics
Integrated circuits Printed circuits Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199626903316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
| 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2005 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN | 1-5090-9773-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204072103316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
| 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2005 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN | 1-5090-9773-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146457403321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 International Workshop on Nano CMOS : proceedings : Jan. 30, 31, Feb. 1, 2006, TORAY Sougou Kensyu Center, 21-9 Suehiro, Mishima, Shizuoka, 411-0032 Japan
| 2006 International Workshop on Nano CMOS : proceedings : Jan. 30, 31, Feb. 1, 2006, TORAY Sougou Kensyu Center, 21-9 Suehiro, Mishima, Shizuoka, 411-0032 Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2006 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Metal oxide semiconductors, Complementary - Design and construction
Nanoelectronics Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9617-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996207159703316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 International Workshop on Nano CMOS : proceedings : Jan. 30, 31, Feb. 1, 2006, TORAY Sougou Kensyu Center, 21-9 Suehiro, Mishima, Shizuoka, 411-0032 Japan
| 2006 International Workshop on Nano CMOS : proceedings : Jan. 30, 31, Feb. 1, 2006, TORAY Sougou Kensyu Center, 21-9 Suehiro, Mishima, Shizuoka, 411-0032 Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2006 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Metal oxide semiconductors, Complementary - Design and construction
Nanoelectronics Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9617-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145691203321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
