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2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / / IEEE Electron Devices Society
2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / / IEEE Electron Devices Society
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (78 pages)
Disciplina 621.381548
Soggetto topico Integrated circuits - Testing
Semiconductors - Testing
Electronic apparatus and appliances - Testing
ISBN 1-5386-5071-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910280918003321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / / Institute of Electrical and Electronics Engineers
2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (72 pages)
Disciplina 621.381548
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Computer software - Testing
ISBN 1-5386-8382-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910308058503321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / / Institute of Electrical and Electronics Engineers
2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (72 pages)
Disciplina 621.381548
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Circuits - Testing
Computer software - Testing
ISBN 1-5386-8382-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996575298903316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
AIEE No 50-1949 : AIEE Proposed Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
AIEE No 50-1949 : AIEE Proposed Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, N.Y. : , : IEEE, , 1949
Descrizione fisica 1 online resource (10 pages) : illustrations
Disciplina 621.381548
Soggetto topico Automatic test equipment
Breakdown (Electricity)
ISBN 1-5044-0371-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti AIEE No 50-1949
Record Nr. UNISA-996280834603316
New York, N.Y. : , : IEEE, , 1949
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
AIEE No 50-1949 : AIEE Proposed Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
AIEE No 50-1949 : AIEE Proposed Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, N.Y. : , : IEEE, , 1949
Descrizione fisica 1 online resource (10 pages) : illustrations
Disciplina 621.381548
Soggetto topico Automatic test equipment
Breakdown (Electricity)
ISBN 1-5044-0371-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti AIEE No 50-1949
Record Nr. UNINA-9910136405203321
New York, N.Y. : , : IEEE, , 1949
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
AIEE No 50-1953 (Supersedes September 1949 issue) : AIEE Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
AIEE No 50-1953 (Supersedes September 1949 issue) : AIEE Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, N.Y. : , : IEEE, , 1953
Descrizione fisica 1 online resource (12 pages) : illustrations
Disciplina 621.381548
Soggetto topico Automatic test equipment
Breakdown (Electricity)
ISBN 1-5044-0372-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti AIEE No 50-1953
Record Nr. UNINA-9910136405003321
New York, N.Y. : , : IEEE, , 1953
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
AIEE No 50-1953 (Supersedes September 1949 issue) : AIEE Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
AIEE No 50-1953 (Supersedes September 1949 issue) : AIEE Standard for Automatic Circuit Reclosers for A-C Distribution Systems / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, N.Y. : , : IEEE, , 1953
Descrizione fisica 1 online resource (12 pages) : illustrations
Disciplina 621.381548
Soggetto topico Automatic test equipment
Breakdown (Electricity)
ISBN 1-5044-0372-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti AIEE No 50-1953
Record Nr. UNISA-996280834503316
New York, N.Y. : , : IEEE, , 1953
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
American national standard for methods of measurement of radio-noise emissions from low-voltage electrical and electronic equipment in the range of 9 kHz to 40 GHz--Amendment 1 : Test site validation : American national standard for methods of measurement / / Institute of Electrical and Electronics Engineers
American national standard for methods of measurement of radio-noise emissions from low-voltage electrical and electronic equipment in the range of 9 kHz to 40 GHz--Amendment 1 : Test site validation : American national standard for methods of measurement / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, New York : , : IEEE, , 2017
Descrizione fisica 1 online resource (62 pages)
Disciplina 621.381548
Soggetto topico Electronic apparatus and appliances - Testing
Electric apparatus and appliances - Testing
Radio noise
ISBN 1-5044-4529-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti C63.4a-2017 -
American National Standard for Methods of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz--Amendment 1
Record Nr. UNISA-996279690403316
New York, New York : , : IEEE, , 2017
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
American national standard for methods of measurement of radio-noise emissions from low-voltage electrical and electronic equipment in the range of 9 kHz to 40 GHz--Amendment 1 : Test site validation : American national standard for methods of measurement / / Institute of Electrical and Electronics Engineers
American national standard for methods of measurement of radio-noise emissions from low-voltage electrical and electronic equipment in the range of 9 kHz to 40 GHz--Amendment 1 : Test site validation : American national standard for methods of measurement / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa New York, New York : , : IEEE, , 2017
Descrizione fisica 1 online resource (62 pages)
Disciplina 621.381548
Soggetto topico Electronic apparatus and appliances - Testing
Electric apparatus and appliances - Testing
Radio noise
ISBN 1-5044-4529-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti C63.4a-2017 -
American National Standard for Methods of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz--Amendment 1
Record Nr. UNINA-9910231255203321
New York, New York : , : IEEE, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
An engineer’s guide to automated testing of high-speed interfaces / José Moreira, Hubert Werkmann
An engineer’s guide to automated testing of high-speed interfaces / José Moreira, Hubert Werkmann
Autore Moreira, José <1975- >
Pubbl/distr/stampa Boston ; London, : Artech House, 2010
Descrizione fisica XX, 566 p. : ill. ; 24 cm.
Disciplina 621.3815
621.381548
Altri autori (Persone) Werkmann, Hubert
Collana The Artech House microwave library
Soggetto topico Strumenti elettronici per misure
ISBN 1607839830
9781607839835
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISANNIO-NAP0584929
Moreira, José <1975- >  
Boston ; London, : Artech House, 2010
Materiale a stampa
Lo trovi qui: Univ. del Sannio
Opac: Controlla la disponibilità qui