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Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll
Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll
Autore Roll Guntrade
Pubbl/distr/stampa Berlin : , : Logos Verlag Berlin, , [2014]
Descrizione fisica 1 online resource (242 pages)
Disciplina 621.3815284
Collana Research at NaMLab
Soggetto topico Metal oxide semiconductor field-effect transistors
Soggetto genere / forma Electronic books.
ISBN 3-8325-9666-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910466968503321
Roll Guntrade  
Berlin : , : Logos Verlag Berlin, , [2014]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll
Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll
Autore Roll Guntrade
Pubbl/distr/stampa Berlin : , : Logos Verlag Berlin, , [2014]
Descrizione fisica 1 online resource (242 pages)
Disciplina 621.3815284
Collana Research at NaMLab
Soggetto topico Metal oxide semiconductor field-effect transistors
ISBN 3-8325-9666-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910795584703321
Roll Guntrade  
Berlin : , : Logos Verlag Berlin, , [2014]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll
Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll
Autore Roll Guntrade
Pubbl/distr/stampa Berlin : , : Logos Verlag Berlin, , [2014]
Descrizione fisica 1 online resource (242 pages)
Disciplina 621.3815284
Collana Research at NaMLab
Soggetto topico Metal oxide semiconductor field-effect transistors
ISBN 3-8325-9666-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910822454603321
Roll Guntrade  
Berlin : , : Logos Verlag Berlin, , [2014]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Monoelements : properties and applications / / Inamuddin [and three others]
Monoelements : properties and applications / / Inamuddin [and three others]
Pubbl/distr/stampa Hoboken, New Jersey ; ; Beverly, Massachusetts : , : John Wiley & Sons, Incorporated : , : Scrivener Publishing LLC, , [2020]
Descrizione fisica 1 online resource (352 pages) : illustrations
Disciplina 621.3815284
Soggetto topico Materials science
Semiconductors
Monomers
Soggetto genere / forma Electronic books.
ISBN 1-119-65527-7
1-119-65528-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910555163603321
Hoboken, New Jersey ; ; Beverly, Massachusetts : , : John Wiley & Sons, Incorporated : , : Scrivener Publishing LLC, , [2020]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Monoelements : properties and applications / / Inamuddin [and three others]
Monoelements : properties and applications / / Inamuddin [and three others]
Pubbl/distr/stampa Hoboken, New Jersey ; ; Beverly, Massachusetts : , : John Wiley & Sons, Incorporated : , : Scrivener Publishing LLC, , [2020]
Descrizione fisica 1 online resource (352 pages) : illustrations
Disciplina 621.3815284
Soggetto topico Materials science
Semiconductors
Monomers
ISBN 1-119-65527-7
1-119-65528-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910829946803321
Hoboken, New Jersey ; ; Beverly, Massachusetts : , : John Wiley & Sons, Incorporated : , : Scrivener Publishing LLC, , [2020]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
MOSFET modeling for circuit analysis and design [[electronic resource] /] / Carlos Galup-Montoro, Márcio Cherem Schneider
MOSFET modeling for circuit analysis and design [[electronic resource] /] / Carlos Galup-Montoro, Márcio Cherem Schneider
Autore Galup-Montoro Carlos
Pubbl/distr/stampa Singapore ; ; Hackensack, NJ, : World Scientific, c2007
Descrizione fisica 1 online resource (445 p.)
Disciplina 621.3815284
Altri autori (Persone) SchneiderMárcio Cherem
Collana International series on advances in solid state electronics and technology
Soggetto topico Metal oxide semiconductor field-effect transistors - Mathematical models
Field-effect transistors - Mathematical models
Soggetto genere / forma Electronic books.
ISBN 1-281-12087-1
9786611120870
981-270-759-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Preface; Contents; List of Selected Symbols; Chapter 1 Introduction; Chapter 2 The MOS Capacitor; Chapter 3 The Long-Channel MOSFET: Theory and dc Equations; Chapter 4 The Real MOS Transistor: dc Models; Chapter 5 Stored Charges and Capacitive Coefficients; Chapter 6 Mismatch Modeling; Chapter 7 Noise in MOSFETs; Chapter 8 High-Frequency Models; Chapter 9 Gate and Bulk Currents; Chapter 10 Advanced MOSFET Structures; Chapter 11 MOSFET Parameter Extraction; Chapter 12 Advanced MOSFET Models for Circuit Simulators; Appendix A Electrostatics in One Dimension
Appendix B Electrostatics in SemiconductorsAppendix C Drift-diffusion Current Model; Appendix D Continuity Equations; Appendix E Basics of pn Junctions; Appendix F Hall-Shockley-Read (HSR) Statistics; Appendix G Interface Trap Capacitance; Index
Record Nr. UNINA-9910450680703321
Galup-Montoro Carlos  
Singapore ; ; Hackensack, NJ, : World Scientific, c2007
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
MOSFET modeling for circuit analysis and design [[electronic resource] /] / Carlos Galup-Montoro, Márcio Cherem Schneider
MOSFET modeling for circuit analysis and design [[electronic resource] /] / Carlos Galup-Montoro, Márcio Cherem Schneider
Autore Galup-Montoro Carlos
Pubbl/distr/stampa Singapore ; ; Hackensack, NJ, : World Scientific, c2007
Descrizione fisica 1 online resource (445 p.)
Disciplina 621.3815284
Altri autori (Persone) SchneiderMárcio Cherem
Collana International series on advances in solid state electronics and technology
Soggetto topico Metal oxide semiconductor field-effect transistors - Mathematical models
Field-effect transistors - Mathematical models
ISBN 1-281-12087-1
9786611120870
981-270-759-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Preface; Contents; List of Selected Symbols; Chapter 1 Introduction; Chapter 2 The MOS Capacitor; Chapter 3 The Long-Channel MOSFET: Theory and dc Equations; Chapter 4 The Real MOS Transistor: dc Models; Chapter 5 Stored Charges and Capacitive Coefficients; Chapter 6 Mismatch Modeling; Chapter 7 Noise in MOSFETs; Chapter 8 High-Frequency Models; Chapter 9 Gate and Bulk Currents; Chapter 10 Advanced MOSFET Structures; Chapter 11 MOSFET Parameter Extraction; Chapter 12 Advanced MOSFET Models for Circuit Simulators; Appendix A Electrostatics in One Dimension
Appendix B Electrostatics in SemiconductorsAppendix C Drift-diffusion Current Model; Appendix D Continuity Equations; Appendix E Basics of pn Junctions; Appendix F Hall-Shockley-Read (HSR) Statistics; Appendix G Interface Trap Capacitance; Index
Record Nr. UNINA-9910784046503321
Galup-Montoro Carlos  
Singapore ; ; Hackensack, NJ, : World Scientific, c2007
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
MOSFET modeling for circuit analysis and design / / Carlos Galup-Montoro, Márcio Cherem Schneider
MOSFET modeling for circuit analysis and design / / Carlos Galup-Montoro, Márcio Cherem Schneider
Autore Galup-Montoro Carlos
Edizione [1st ed.]
Pubbl/distr/stampa Singapore ; ; Hackensack, NJ, : World Scientific, c2007
Descrizione fisica 1 online resource (445 p.)
Disciplina 621.3815284
Altri autori (Persone) SchneiderMárcio Cherem
Collana International series on advances in solid state electronics and technology
Soggetto topico Metal oxide semiconductor field-effect transistors - Mathematical models
Field-effect transistors - Mathematical models
ISBN 1-281-12087-1
9786611120870
981-270-759-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Preface; Contents; List of Selected Symbols; Chapter 1 Introduction; Chapter 2 The MOS Capacitor; Chapter 3 The Long-Channel MOSFET: Theory and dc Equations; Chapter 4 The Real MOS Transistor: dc Models; Chapter 5 Stored Charges and Capacitive Coefficients; Chapter 6 Mismatch Modeling; Chapter 7 Noise in MOSFETs; Chapter 8 High-Frequency Models; Chapter 9 Gate and Bulk Currents; Chapter 10 Advanced MOSFET Structures; Chapter 11 MOSFET Parameter Extraction; Chapter 12 Advanced MOSFET Models for Circuit Simulators; Appendix A Electrostatics in One Dimension
Appendix B Electrostatics in SemiconductorsAppendix C Drift-diffusion Current Model; Appendix D Continuity Equations; Appendix E Basics of pn Junctions; Appendix F Hall-Shockley-Read (HSR) Statistics; Appendix G Interface Trap Capacitance; Index
Record Nr. UNINA-9910809418503321
Galup-Montoro Carlos  
Singapore ; ; Hackensack, NJ, : World Scientific, c2007
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Nanowire field effect transistors : principles and applications / / Dae Mann Kim, Yoon-Ha Jeong, editors
Nanowire field effect transistors : principles and applications / / Dae Mann Kim, Yoon-Ha Jeong, editors
Edizione [1st ed. 2014.]
Pubbl/distr/stampa New York : , : Springer, , 2014
Descrizione fisica 1 online resource (vi, 290 pages) : illustrations (some color)
Disciplina 620.5
621.3815284
Collana Gale eBooks
Soggetto topico Nanostructured materials
Field-effect transistors
ISBN 1-4614-8124-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Quantum Wire and Sub-Bands -- Carrier Concentration and Transport -- P-N Junction Diode: I-V Behavior and Applications -- Silicon Nanowire Field Effect Transistor -- Fabrication of Nanowires and their Applications -- Characterization of Nanowire Devices under Electrostatic Discharge Stress Conditions -- Green Energy Devices -- Nanowire Field Effect Transistors in Optoelectronics -- Nanowire BioFETs: An Overview -- Lab On a Wire: Application of Silicon Nanowires for Nanoscience and Biotechnology -- Nanowire FET Circuit Design – An Overview.
Record Nr. UNINA-9910299755603321
New York : , : Springer, , 2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Novel three-state quantum dot gate field effect transistor : fabrication, modeling and applications / / Supriya Karmakar
Novel three-state quantum dot gate field effect transistor : fabrication, modeling and applications / / Supriya Karmakar
Autore Karmakar Supriya
Edizione [1st ed. 2014.]
Pubbl/distr/stampa New Delhi : , : Springer, , 2014
Descrizione fisica 1 online resource (xiv, 134 pages) : illustrations (some color)
Disciplina 621.3815284
Collana Gale eBooks
Soggetto topico Field-effect transistors
ISBN 81-322-1635-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction: Multi State Devices and Logic -- Quantum Dot Gate Field Effect Transistor Device Structures -- Quantum Dot Gate Field Effect Transistors Fabrication and Characterization -- Quantum DOT Gate Field Effect Transistors Theory and Device Modeling -- Quantum Dot Gate NMOS Inverter -- Quantum Dot Gate Field Effect Transistor (QDGFET): Circuit Model and Ternary Logic Inverter -- Analog-to-Digital Converter (ADC) and Digital-to-Analog Converter (DAC) Using Quantum DOT Gate Field Effect Transistor (QDGFET) -- Performance in SUB-25nm Range -- Conclusions.
Record Nr. UNINA-9910299709003321
Karmakar Supriya  
New Delhi : , : Springer, , 2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui