Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
| Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2003 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Telecommunication Radio frequency Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996210167703316 |
| [Place of publication not identified], : International Test Conference, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA]
| Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA] |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2003 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Telecommunication Radio frequency Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910873074603321 |
| [Place of publication not identified], : International Test Conference, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007
| Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Defects
Integrated circuits - Testing Integrated circuits - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8530-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211046903316 |
| [Place of publication not identified], : IEEE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007
| Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Defects
Integrated circuits - Testing Integrated circuits - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8530-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910143147903321 |
| [Place of publication not identified], : IEEE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan
| Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2004 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199924503316 |
| [Place of publication not identified], : IEEE Computer Society Press, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan
| Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2004 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872516503321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2007, Kraków, Poland / / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.]
| Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2007, Kraków, Poland / / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.] |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/48 |
| Altri autori (Persone) | GirardPatrick, Ph. D. |
| Soggetto topico |
Integrated circuits - Testing
Integrated circuits - Design |
| ISBN | 1-5090-8658-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems
Internet Monitoring and Protection |
| Record Nr. | UNISA-996268148103316 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2007, Kraków, Poland / / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.]
| Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2007, Kraków, Poland / / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.] |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/48 |
| Altri autori (Persone) | GirardPatrick, Ph. D. |
| Soggetto topico |
Integrated circuits - Testing
Integrated circuits - Design |
| ISBN | 1-5090-8658-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems
Internet Monitoring and Protection |
| Record Nr. | UNINA-9910143027803321 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece
| Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic circuits - Testing - Data processing
Error-correcting codes (Information theory) Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996210745003316 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece
| Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Electronic circuits - Testing - Data processing
Error-correcting codes (Information theory) Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872548103321 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
